System and method for a self-referencing interferometer
View Patent ↗Systems and methods are described herein for a self-referencing interferometer. The interferometer can comprise an improved spatial phase shifter that reduces the number of components, size and complexity of the spatial phase shifter and maintains a common path for a combined reference beam and signal beam. The self-referencing interferometer further comprises a single mode fiber shunt for filtering the reference beam and further reducing the size of the interferometer. The angle of the reference beam can be tilted before being recombined with the single beam which further simplifies the spatial phase shifting component of the interferometer.
1. An apparatus that performs spatial phase shifting in an interferometer comprising:
a first beam splitter for dividing a reference beam of light into a first reference beam and a second reference beam;
the first beam splitter for dividing a signal beam of light into a first signal beam and a second signal beam;
the first beam splitter for combining the first reference beam and the first signal beam producing a first combined beam and for combining the second reference beam and the second signal beam producing a second combined beam;
a half wave plate for altering the polarization of the first combined beam and the second combined beam;
a quarter wave plate for altering the polarization of the second combined beam;
a second beam splitter for dividing the first combined beam into a third combined beam and a fourth combined beam and for dividing the second combined beam into a fifth combined beam and a sixth combined beam;
a first pupil pusher for altering a conjugate image location and a transverse alignment of the third combined beam;
a second pupil pusher for altering a conjugate image location and a transverse alignment of the fourth combined beam; and
a third pupil pusher for altering a conjugate image location and a transverse alignment of the sixth combined beam.
2. The apparatus of claim 1 , wherein
the third combined beam produces a first interference pattern;
the fourth combined beam produces a second interference pattern;
the fifth combined beam produces a third interference pattern; and
the sixth combined beam produces a fourth interference pattern.
3. The apparatus of claim 2 , wherein each of the first, second, third and fourth interference patterns is different from the others.
4. The apparatus of claim 1 , wherein the third combined beam, the fourth combined beam, the fifth combined beam and the sixth combined beam each has a different relative phase shift between the reference beam component and the signal beam component.
5. The apparatus of claim 1 , wherein the first beam splitter comprises non-polarizing material.
6. The apparatus of claim 1 , wherein the second beam splitter comprises a polarizing material.
7. The apparatus of claim 1 , wherein the first reference beam and the first signal beam have a common path when combined to form the first combined beam and the second reference beam and the second signal beam have a common path when combined to form the second combined beam.