Device and system for measuring material thickness
View Patent ↗A piezoelectric sensing device is described for measuring material thickness of target such as pipes, tubes, and other conduits that carry fluids. The piezoelectric sensing device comprises a substrate such as a flexible circuit material, a piezoceramic element, and a solder layer disposed therebetween. These features are arranged in manner that provides a low-profile measurement device suitable for high-temperature applications such as those applications in which the temperature exceeds 120° C. Embodiments of the piezoelectric sensing device can be configured for use as stand-alone units separately located on the target or for use as a string of sensing elements coupled together by way of the flexible circuit material.
1. A piezoelectric sensing device comprising:
a substrate;
a solder layer disposed on the substrate;
a piezoelectric element coupled to the substrate via the solder layer, the piezoelectric element comprising a ceramic; and
a wrap tab comprising conductive material disposed on three surfaces of the piezoelectric element and covering the extent of at least one of the three surfaces of the piezoelectric element,
wherein the substrate, the solder layer, and the piezoelectric element are arranged as a layered structure that has a profile height that does not exceed 3 mm, and
wherein the substrate comprises a material that is compatible with operating temperatures in excess of 120° C.
2. A piezoelectric sensing device according to claim 1 wherein the substrate and the ceramic are compatible with reflow temperatures used to process the solder layer.
3. A piezoelectric sensing device according to claim 1 wherein the ceramic comprises a Navy Type II material.
4. A piezoelectric sensing device according to claim 1 wherein the substrate comprises a polyamide-based film.
5. A piezoelectric sensing device, comprising:
a substrate;
a solder layer disposed on the substrate; and
a piezoelectric element coupled to the substrate via the solder layer, the piezoelectric element comprising a ceramic;
wherein the substrate, the solder layer, and the piezoelectric element are arranged as a layered structure that has a profile height that does not exceed 3 mm,
wherein the substrate comprises a material that is compatible with operating temperatures in excess of 120° C. and
wherein the substrate comprises an area with an electrode that has a t-shaped geometry, and wherein the piezoelectric element is secured to the area with the solder layer.
6. A piezoelectric sensing device according to claim 5 further comprising a wrap tab disposed around at least a portion of the piezoelectric element.
7. A piezoelectric sensing device according to claim 5 further comprising a gold plating disposed on the piezoelectric element.
8. A piezoelectric sensing device according to claim 5 further comprising one or more cable connections disposed on a frontside of the substrate, wherein the piezoelectric element is disposed on a backside of the substrate, and wherein the one or more cable connections are configured to conduct inputs and outputs to and from the piezoelectric element and one or more cables secured to the one or more cable connections.
9. A piezoelectric sensing device according to claim 5 further comprising a conductor incorporated into the substrate, wherein the conductor is coupled to the piezoelectric element and to a free end of the substrate.
10. A piezoelectric sensing device according to claim 9 further comprising a connector coupled to the conductor at the free end, wherein the connector communicates inputs and outputs to and from the piezoelectric element.
11. A measurement system for measuring material thickness of a target, said measurement system comprising:
a substrate comprising a flexible circuit material having an area with an electrode with a t-shaped geometry;
a solder layer disposed on the electrode;
a piezoelectric element disposed on the solder layer, the piezoelectric element comprising a ceramic body having a first electrode, a second electrode, and a wrap tab that is coupled to each of the first electrode and the second electrode; and
a connection for conducting inputs and outputs to and from the piezoelectric element, wherein the flexible circuit material, the solder layer, and the piezoelectric element are arranged as a layered structure that has a profile height that does not exceed 3 mm.
12. A measurement system according to claim 11 further comprising a couplant disposed on one or more of the flexible circuit material and the ceramic body, wherein the couplant adheres to a surface of the target.
13. A measurement system according to claim 11 further comprising a protective layer disposed on the flexible circuit material.
14. A measurement system according to claim 11 wherein the flexible circuit material comprises a first layer, a second layer, and a conductor disposed between the first layer and the second layer, and wherein the connection comprises a connector coupled to the conductor and disposed on a free end of the flexible circuit material.
15. A measurement system according to claim 11 wherein the connection comprises a cable secured to one or more cable connections incorporated into the flexible circuit material.
16. A measurement system according to claim 11 further comprising instrumentation coupled to the connection, wherein the instrumentation is configured to transmit inputs to the ceramic body, and wherein the inputs excite the ceramic body.