Systems and methods for detecting alignment errors
View Patent ↗A method of detecting an alignment error includes the steps of controlling a first portion of one or more imaging units to image on a substrate a first plurality of substantially parallel lines extending along a first direction and a second plurality of substantially parallel lines extending along a second direction and controlling a second portion of one or more imaging units to image a third plurality of substantially parallel lines extending along the first direction and a fourth plurality of substantially parallel lines extending along the second direction. One or more distances between adjacent lines of the second plurality of lines are varied and one or more distances between adjacent lines of the fourth plurality of lines are varied. Further, the lines imaged by the first and second portions form an alignment pattern. The method further includes the steps of collecting data relating to the alignment pattern and analyzing the collected data to determine an alignment error between the first and second portions of the one or more imaging units.
1. A method of detecting an alignment error, comprising the steps of:
controlling a first inkjet printhead to image on a substrate a first plurality of substantially parallel lines extending along a first direction, wherein the first plurality of lines includes a first line and a second line, and the first line and the second line are spaced apart along a second direction substantially orthogonal to the first direction;
controlling a second inkjet printhead to image on the substrate a second plurality of substantially parallel lines extending along the first direction, wherein the second plurality of lines includes a third line and a fourth line, the third line and the fourth line are spaced apart along the second direction, and the lines imaged by the first and second inkjet printheads form an alignment pattern;
collecting data relating to the alignment pattern, including the step of measuring distances between the first line and the third line, the first line and the fourth line, the second line and the third line, and the second line and the fourth line; and
analyzing the collected data to determine an alignment error between the first and the second inkjet printheads.
2. The method of claim 1 , further including the steps of:
controlling the first inkjet printhead to image on the substrate a third plurality of substantially parallel lines extending along the second direction, wherein one or more distances between adjacent lines of the third plurality of lines are varied; and
controlling the second inkjet printhead to image on the substrate a fourth plurality of substantially parallel lines extending along the second direction, wherein one or more distances between adjacent lines of the fourth plurality of lines are varied, and wherein each of the third and fourth pluralities of lines includes six or more lines that are each separated by one or more different known distances to form first and second patterns, respectively.
3. The method of claim 1 , wherein each of the first and second plurality of lines includes at least three lines that are separated by known equal distances from each other, and wherein the first plurality of lines are adjacent the second plurality of lines.
4. The method of claim 2 , wherein the first direction is along a length of the substrate and the second direction is across a width of the substrate.
5. The method of claim 1 , wherein the step of collecting data includes the step of controlling a sensor to capture an image of the alignment pattern, and wherein the step of analyzing the collected data includes the steps of converting the image to a grayscale image, processing the image for whiteness correction, processing the image to obtain a binarized image, and extracting features from the image.
6. The method of claim 5 , wherein the step of analyzing the data further includes the step of detecting and correcting for image rotation.
7. The method of claim 1 , wherein the step of analyzing the data includes the steps of calculating distances between the lines of the first and second pluralities of lines and comparing the calculated distances to expected values to determine an alignment error along the first direction.
8. A method of detecting an alignment error, comprising the steps of:
controlling a first imaging unit to image on a substrate a first plurality of substantially parallel lines extending along a first direction, wherein the first plurality of lines includes a first line and a second line;
controlling a second imaging unit to image on the substrate a second plurality of substantially parallel lines extending along the first direction, wherein the second plurality of lines includes a third line and a fourth line, and the lines imaged by the first and second imaging units form an alignment pattern;
collecting data relating to the alignment pattern, including the step of measuring distances between the first line and the third line, the first line and the fourth line, the second line and the third line, and the second line and the fourth line; and
analyzing the collected data to determine an alignment error between the first and the second imaging units,
wherein the step of analyzing the data includes the steps of calculating distances between the lines of the first and second pluralities of lines and comparing the calculated distances to expected values to determine an alignment error along the first direction, and
wherein the step of calculating distances between the lines of the first and second pluralities of lines includes the steps of determining positions of each of the lines of the first and second pluralities of lines, calculating an image magnification utilizing the determined positions, and calculating distances between each line in the first plurality of lines and each line in the second plurality of lines utilizing the image magnification, further wherein the step of comparing the calculated distances to expected values to determine an alignment error along the first direction includes the step of averaging differences between the calculated distances and the expected values to determine the alignment error along the first direction.
9. The method of claim 2 , wherein the step of analyzing the data includes the steps of calculating distances between the lines of the third plurality of lines, calculating distances between the lines of the fourth plurality of lines, matching a first pattern from the third plurality of lines to a second pattern from the fourth plurality of lines utilizing the calculated distances, and comparing the matched first and second patterns to determine an alignment error along the second direction.
10. A method of detecting an alignment error, comprising the steps of:
controlling a first imaging unit to image on a substrate a first plurality of substantially parallel lines extending along a first direction, wherein the first plurality of lines includes a first line and a second line;
controlling a second imaging unit to image on the substrate a second plurality of substantially parallel lines extending along the first direction, wherein the second plurality of lines includes a third line and a fourth line, and the lines imaged by the first and second imaging units form an alignment pattern;
collecting data relating to the alignment pattern, including the step of measuring distances between the first line and the third line, the first line and the fourth line, the second line and the third line, and the second line and the fourth line;
analyzing the collected data to determine an alignment error between the first and the second imaging units;
controlling the first imaging unit to image on the substrate a third plurality of substantially parallel lines extending along a second direction, wherein one or more distances between adjacent lines of the third plurality of lines are varied; and
controlling the second imaging unit to image on the substrate a fourth plurality of substantially parallel lines extending along the second direction, wherein one or more distances between adjacent lines of the fourth plurality of lines are varied, and wherein each of the third and fourth pluralities of lines includes six or more lines that are each separated by one or more different known distances to form first and second patterns, respectively,
wherein the step of analyzing the data includes the steps of calculating distances between the lines of the third plurality of lines, calculating distances between the lines of the fourth plurality of lines, matching a first pattern from the third plurality of lines to a second pattern from the fourth plurality of lines utilizing the calculated distances, and comparing the matched first and second patterns to determine an alignment error along the second direction, and
wherein the step of calculating distances between lines of the third and fourth pluralities of lines includes the steps of calculating an image magnification and utilizing the image magnification to calculate the distances, wherein the step of matching a first pattern from the third plurality of lines to a second pattern from the fourth plurality of lines includes the steps of comparing spaces between pairs of lines of the first pattern with spaces between corresponding pairs of lines of the second pattern and matching a number of consecutive spaces, and wherein the step of comparing the matched first and second patterns to determine an alignment error along the second direction includes the step of calculating an average distance between corresponding lines of the first and second patterns.
11. The method of claim 10 , wherein the step of matching a number of consecutive spaces includes matching five or more consecutive spaces.
12. A system for detecting an alignment error, comprising:
first and second inkjet printheads;
a sensor; and
a controller to control the first inkjet printhead to image on a substrate a first plurality of substantially parallel lines extending along a first direction, and to control the second inkjet printhead to image on the substrate a second plurality of substantially parallel lines extending along the first direction,
wherein the first plurality of lines includes a first line and a second line spaced apart along a second direction substantially orthogonal to the first direction, the second plurality of lines includes a third line and a fourth line spaced apart along the second direction, and the lines imaged by the first and second inkjet printheads form an alignment pattern,
wherein the controller is configured to control the sensor to collect data relating to the alignment pattern, wherein the data include measurements of distances between the first line and the third line, the first line and the fourth line, the second line and the third line, and the second line and the fourth line,
and wherein the controller is configured to analyze the collected data to determine an alignment error between the first and the second inkjet printheads.
13. The system of claim 12 , wherein the controller further controls the first inkjet printhead to image on the substrate a third plurality of substantially parallel lines extending along the second direction, wherein the controller further controls the second inkjet printhead to image on the substrate a fourth plurality of substantially parallel lines extending along the second direction, wherein one or more distances between adjacent lines of the fourth plurality of lines are varied, wherein one or more distances between adjacent lines of the second plurality of lines are varied, and wherein each of the third and fourth pluralities of lines includes six or more lines that are each separated by one or more different known distances to form first and second patterns, respectively.
14. The system of claim 12 , wherein each of the first and second plurality of lines includes at least three lines that are separated by known equal distances from each other, and wherein the first plurality of lines are adjacent the second plurality of lines.
15. The system of claim 13 , wherein the first direction is along a length of the substrate and the second direction is across a width of the substrate.
16. The system of claim 12 , wherein the controller is configured to control the sensor to capture an image of the alignment pattern, and wherein the controller is further configured to convert the image to a grayscale image, process the image for whiteness correction, process the image to obtain a binarized image, and extract features from the image.
17. The system of claim 12 , wherein the controller is configured to calculate distances between the lines of the first plurality and second plurality of lines and compare the calculated distances to expected values to determine an alignment error along the first direction.
18. A system for detecting an alignment error, comprising:
one or more imaging units;
a sensor; and
a controller to control a first imaging unit to image on a substrate a first plurality of substantially parallel lines extending along a first direction, and to control a second imaging unit to image on the substrate a second plurality of substantially parallel lines extending along the first direction,
wherein the first plurality of lines includes a first line and a second line, the second plurality of lines includes a third line and a fourth line, and the lines imaged by the first and second imaging units form an alignment pattern,
wherein the controller is configured to control the sensor to collect data relating to the alignment pattern, wherein the data include measurements of distances between the first line and the third line, the first line and the fourth line, the second line and the third line, and the second line and the fourth line,
wherein the controller is configured to analyze the collected data to determine an alignment error between the first and the second imaging units,
wherein the controller is configured to calculate distances between the lines of the first plurality and second plurality of lines and compare the calculated distances to expected values to determine an alignment error along the first direction,
wherein the controller is configured to calculate distances between the lines of the first and second pluralities of lines by determining positions of each of the lines of the first and second pluralities of lines, calculating an image magnification utilizing the determined positions, and calculating distances between each line in the first plurality of lines and each line in the second plurality of lines utilizing the image magnification, further wherein the controller is configured to compare the calculated distances to expected values to determine an alignment error along the first direction by averaging differences between the calculated distances and the expected values to determine the alignment error along the first direction.
19. The system of claim 13 , wherein the controller is configured to analyze the data by measuring distances between the lines of the third plurality of lines, measuring distances between the lines of the fourth plurality of lines, matching a first pattern from the third plurality of lines to a second pattern from the fourth plurality of lines utilizing the measured distances, and comparing the matched first and second patterns to determine an alignment error along the second direction.
20. A system for detecting an alignment error, comprising:
one or more imaging units;
a sensor; and
a controller to control a first imaging unit to image on a substrate a first plurality of substantially parallel lines extending along a first direction, and to control a second imaging unit to image on the substrate a second plurality of substantially parallel lines extending along the first direction,
wherein the first plurality of lines includes a first line and a second line, the second plurality of lines includes a third line and a fourth line, and the lines imaged by the first and second imaging units form an alignment pattern,
wherein the controller is configured to control the sensor to collect data relating to the alignment pattern, wherein the data include measurements of distances between the first line and the third line, the first line and the fourth line, the second line and the third line, and the second line and the fourth line,
wherein the controller is configured to analyze the collected data to determine an alignment error between the first and the second imaging units,
wherein the controller further controls the first imaging unit to image on the substrate a third plurality of substantially parallel lines extending along a second direction, wherein the controller further controls the second imaging unit to image on the substrate a fourth plurality of substantially parallel lines extending along the second direction, wherein one or more distances between adjacent lines of the fourth plurality of lines are varied, wherein one or more distances between adjacent lines of the second plurality of lines are varied, wherein one or more distances between adjacent lines of the fourth plurality of lines are varied, and wherein each of the third and fourth pluralities of lines includes six or more lines that are each separated by one or more different known distances to form first and second patterns, respectively,
wherein the controller is configured to analyze the data by measuring distances between the lines of the third plurality of lines, measuring distances between the lines of the fourth plurality of lines, matching a first pattern from the third plurality of lines to a second pattern from the fourth plurality of lines utilizing the measured distances, and comparing the matched first and second patterns to determine an alignment error along the second direction, and
wherein the controller is configured to calculate distances between lines of the third and fourth pluralities of lines by calculating an image magnification and utilizing the image magnification to calculate the distances, wherein the controller is configured to match a first pattern from the third plurality of lines to a second pattern from the fourth plurality of lines by comparing spaces between pairs of lines of the first pattern with spaces between corresponding pairs of lines of the second pattern and matching a number of consecutive spaces, and wherein the controller is configured to compare the matched first and second patterns to determine an alignment error along the second direction by calculating an average distance between corresponding lines of the first and second patterns.