IP Library Granted Patent US 8,940,583
Granted Patent B2
US 8,940,583 · App. 12/856,730 · Granted Jan 27, 2015

Manufacturing method of a lead frame

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,940,583
App. No.
12/856,730
Granted
Jan 27, 2015
Kind
B2
Abstract

In a semiconductor device, a lead frame made of a copper alloy prevents exfoliation occurring near the surface of the lead frame. A copper oxide layer is formed on the base material made of a copper alloy by immersing the base material into a solution of a strong oxidizer. The copper oxide layer serves as an outermost layer and consists of a copper oxide other than a copper oxide in the form of needle crystals.

Claims (10)

1. A manufacturing method of a lead frame, comprising:

configuring a base material made of a copper alloy into a first pattern;

applying plating to a part of the base material; and

forming a copper oxide layer as an outermost layer on a surface of the base material by immersing the base material into a solution of a strong oxidizer, the copper oxide layer including a copper oxide other than a copper oxide in the form of needle crystals and thickness of the copper oxide layer is from 10 Angstroms to 1000 Angstroms, and taking the base material out of the solution of the strong oxidizer before the copper oxide changes to a needle crystal state.

2. The manufacturing method as claimed in claim 1 ,

wherein the solution of the strong oxidizer is a mixed solution of sodium chlorite, sodium hydroxide and potassium peroxydisulfate.

3. The manufacturing method as claimed in claim 2 ,

wherein the immersing the base material into the solution of the strong oxidizer continues for 3 to 10 minutes.

4. The manufacturing method as claimed in claim 3 ,

wherein the immersing the base material into the solution of the strong oxidizer is performed at a temperature of around 100° C.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →