IP Library Patent Application 12862909
Patent Application
App. No. 12/862,909

DRIVE CIRCUIT

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Quick Facts
Patent No.
US None
App. No.
12/862,909
Abstract

The invention is directed to testing breakdown voltage characteristics of a plurality of output transistors in a batch in a drive circuit instead of measurement using probe needles. A drive circuit includes output transistors made of high breakdown voltage P-channel type MOS transistors, switching control circuits, output terminals, diodes and a control terminal on a semiconductor die. The diodes are made of high breakdown voltage P-channel type MOS transistors in which the source and gate are connected. The anodes of the diodes are connected to the drains of the corresponding output terminals, respectively. The cathodes of the diodes are commonly connected to the control terminal through a wiring.

Claims (11)

1 . A drive circuit comprising:

a plurality of output transistors, each of the output transistors comprising a P-channel type MOS transistor comprising a source configured to receive a positive voltage;

a plurality of switching control circuits controlling switching of corresponding output transistors;

a plurality of output terminals, each of the output terminals being connected to a drain of a corresponding output transistor;

a plurality of rectifiers, each of the rectifiers comprising an anode connected to a drain of a corresponding output transistor; and

a control terminal connected to cathodes of the rectifiers.

2 . The drive circuit of claim 1 , wherein each of the rectifiers comprises a P-channel type MOS transistor comprising a source and a gate that are connected.

3 . The drive circuit of claim 1 , wherein a pair of an output transistor and a switching control circuit is disposed under a corresponding output terminal.

4 . The drive circuit of claim 1 , further comprising a voltage application circuit applying a negative voltage to the control terminal in a state where the output transistors are turned off by the switching control circuits.

5 . The drive circuit of claim 1 , further comprising a voltage application circuit initializing voltages of the drains of the output transistors by applying a predetermined voltage to the control terminal.

6 . The drive circuit of claim 1 , further comprising a plurality of vacuum fluorescent displays connected to corresponding output terminals.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 22, 2014
From: SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032022/0269 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2010
From: OBA, YOSHIYUKI
To: SANYO ELECTRIC CO., LTD.; SANYO SEMICONDUCTOR CO., LTD.
Reel/Frame 024884/0230 →