Accurate operational surface handling
View Patent ↗One or more techniques and/or systems are described herein for handling an examination surface for radiology or other operations. That is, an examination surface support structure can be integrally coupled with a support component of a radiology apparatus so that an examination surface and an object optionally placed thereon are supported during an operation. An examination surface transport component can be docked with an examination surface docking component that is operably coupled with the examination surface support structure so that the examination surface can be exchanged between the transport component and the radiology apparatus. An examination surface transit component that is operably coupled with the examination surface support structure can engage the examination surface in order to move the examination surface into and out of an operation region of the apparatus, such as during a scanning or dosage operation.
1. An apparatus for handling a first examination surface configured to support a first object and a second examination surface configured to support a second object, comprising:
an examination surface support structure configured to provide support for the first examination surface and the second examination surface;
an examination surface transit component operably coupled with the examination surface support structure and configured to move the first examination surface relative to an operation region of the apparatus; and
an examination surface docking component operably coupled with the examination surface support structure and configured to dock with an examination surface transport component to exchange the second examination surface between the examination surface transport component and the apparatus while the examination surface transit component is moving the first examination surface relative to the operation region.
2. The apparatus of claim 1 , comprising a height adjustment component operably coupled with the examination surface support structure and configured to selectively tilt at least one of the first examination surface or the second examination surface.
3. The apparatus of claim 1 , comprising a height adjustment component comprising a first lifter and a second lifter, the first lifter disposed on a first side of the operation region and the second lifter disposed on a second side of the operation region.
4. The apparatus of claim 1 , the examination surface docking component disposed on a first side of the apparatus and a second examination surface docking component disposed on a second side of the apparatus.
5. The apparatus of claim 1 , the examination surface transit component comprising a drive component configured to move at least one of the first examination surface or the second examination surface relative to the operation region.
6. The apparatus of claim 5 , the drive component comprising a mechanically operated roller.
7. The apparatus of claim 5 , the drive component comprising a mechanically operated track.
8. The apparatus of claim 5 , the drive component comprising an electro-magnetic component.
9. The apparatus of claim 1 , the examination surface support structure comprising a first roller configured to rotate about a first axis of rotation and contact a first beveled edge of the first examination surface.
10. The apparatus of claim 9 , the examination surface support structure comprising and a second roller configured to rotate about a second axis of rotation and contact a second beveled edge of the first examination surface.
11. The apparatus of claim 10 , the first axis of rotation not parallel to the second axis of rotation.
12. A method for handling an examination surface configured to support an object undergoing an operation via an apparatus, comprising:
interfacing an examination surface transport component carrying the examination surface with an examination surface docking component;
exchanging the examination surface between the examination surface transport component and the examination surface docking component;
engaging the examination surface with an examination surface transit component configured to move the examination surface relative to an operation region of the apparatus; and
exchanging the examination surface between a second examination surface transport component and at least one of:
a second examination surface docking component, or
the examination surface docking component.
13. The method of claim 12 , comprising adjusting a height of the examination surface relative to the operation region.
14. The method of claim 12 , comprising adjusting an angle of the examination surface relative to the operation region.
15. The method of claim 12 , the exchanging the examination surface between the examination surface transport component and the examination surface docking component comprising docking the examination surface into a channel formed by the examination surface docking component.
16. The method of claim 12 , comprising exchanging a second examination surface between a third examination surface transport component and the examination surface docking component while the examination surface is within the operation region.
17. The method of claim 12 , the examination surface transport component and the second examination surface transport component being a same transport component.
18. A radiation system, comprising:
a rotating gantry portion;
a non-rotating portion operably associated with the rotating gantry portion to facilitate an examination of an object;
an examination surface support structure operably coupled with the non-rotating portion and configured to move at least a first examination surface configured to support a first object and a second examination surface configured to support a second object through the rotating gantry portion, the examination surface support structure configured to concurrently accommodate the first examination surface and the second examination surface; and
an examination surface docking component operably coupled with the examination surface support structure and configured to dock with an examination surface transport component to exchange the first examination surface between the examination surface support structure and the examination surface transport component.
19. A method for handling an examination surface configured to support an object undergoing an operation via an apparatus, comprising:
interfacing an examination surface transport component carrying the examination surface with an examination surface docking component;
exchanging the examination surface between the examination surface transport component and the examination surface docking component;
engaging the examination surface with an examination surface transit component configured to move the examination surface relative to an operation region of the apparatus; and
exchanging the examination surface between a second examination surface transport component and the examination surface docking component.
20. A method for handling an examination surface configured to support an object undergoing an operation via an apparatus, comprising:
interfacing an examination surface transport component carrying the examination surface with an examination surface docking component;
exchanging the examination surface between the examination surface transport component and the examination surface docking component;
engaging the examination surface with an examination surface transit component configured to move the examination surface relative to an operation region of the apparatus; and
exchanging the examination surface between a second examination surface transport component and a second examination surface docking component.