Control and readout of electron or hole spin
View Patent ↗This invention concerns an electronic device for the control and readout of the electron or hole spin of a single dopant in silicon. The device comprises a silicon substrate in which there are one or more ohmic contact regions. An insulating region on top of the substrate. First and second barrier gates spaced apart to isolate a small region of charges to form an island of a Single Electron Transistor (SET). A third gate over-lying both the first and second barrier gates, but insulated from them, the third gate being able to generate a gate-induced charge layer (GICL) in the beneath it. A fourth gate in close proximity to a single dopant atom, the dopant atom being encapsulated in the substrate outside the region of the GICL but close enough to allow spin-dependent charge tunnelling between the dopant atom and the SET island under the control of gate potentials, mainly the fourth gate. In use either the third or fourth gate also serve as an Electron Spin Resonance (ESR) line to control the spin of the single electron or hole of the dopant atom. In a further aspect it concerns a method for using the device.
1. An electronic device for control and readout of electron or hole spin of a single dopant atom in silicon, comprising:
a silicon substrate in which there are one or more ohmic contact regions;
an insulating region on top of the substrate;
first and second spaced-apart barrier gates on top of the insulating region;
an island of a Single Electron Transistor (SET) in the substrate beneath the first and second spaced-apart barrier gates defined by the barrier gates;
a third gate overlying both the first and second barrier gates, but insulated from them and the SET is controlled by the first, second and third gates;
a gate-induced charge layer (GICL) in the substrate beneath the third gate;
wherein the single dopant atom is encapsulated in the substrate outside the region of the GICL, and a fourth gate is in close proximity to the single dopant atom;
and wherein the device further comprises a fourth gate induced intermittent spin-dependent charge tunnel between the dopant atom and the SET island;
and a third or fourth gate induced Electron Spin Resonance (ESR) line in the vicinity of either the third or fourth gate, respectively and manipulating the spin of the electron or hole spin of the single dopant atom.
2. An electronic device for the control and readout of the electron or hole spin of a single dopant atom in silicon, according to claim 1 , wherein the fourth gate provides the ESR line in addition to controlling tunneling of the charge by its electrostatic potential.
3. An electronic device for the control and readout of the electron or hole spin of a single dopant atom in silicon, according to claim 1 , wherein the third gate provides the ESR line in addition to generating the GICL in the substrate.
4. An electronic device for the control and readout of the electron or hole spin of a single dopant atom in silicon, according to claim 3 , wherein the fourth gate controls tunneling of the charge by its electrostatic potential.
5. An electronic device for the control and readout of the electron or hole spin of a single dopant atom in silicon, according to claim 1 , in combination with other similar devices where charges are shuttled using coherent transport by adiabatic fast passage between them.