IP Library Granted Patent US 8,590,136
Granted Patent B2
US 8,590,136 · App. 12/870,288 · Granted Nov 26, 2013

Method of fabricating a dual single-crystal backplate microphone

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Quick Facts
Patent No.
US 8,590,136
App. No.
12/870,288
Granted
Nov 26, 2013
Kind
B2
Abstract

A dual backplate MEMS microphone system including a flexible diaphragm sandwiched between two single-crystal silicon backplates may be formed by fabricating each backplate in a separate wafer, and then transferring one backplate from its wafer to the other wafer, to form two separate capacitors with the diaphragm.

Claims (30)

1. A method of fabricating a dual-backplate microphone, the method comprising:

providing a first wafer comprising a first conductive single-crystal backplate and a conductive diaphragm;

providing a second conductive single-crystal backplate; and

bonding the second conductive single-crystal backplate to the first wafer having the conductive single-crystal backplate, such that the diaphragm is sandwiched between, but electrically isolated from, the first conductive single-crystal backplate and the second conductive single-crystal backplate,

wherein the conductive diaphragm forms a first variable capacitor with the first conductive single-crystal backplate and a second variable capacitor with the second conductive single-crystal backplate.

2. The method of fabricating a dual-backplate microphone according to claim 1 , wherein bonding the second conductive single-crystal backplate to the first single-crystal wafer comprises a layer-transfer process.

3. The method of fabricating a dual-backplate microphone according to claim 1 , wherein at least one of the second single-crystal backplate and the first single-crystal backplate comprises a device layer of a silicon-on-insulator wafer.

4. The method of fabricating a dual-backplate microphone according to claim 1 , wherein the second conductive single-crystal backplate further comprises a second backplate layer having a first face, wherein the first face comprises one or more standoffs.

5. A method of fabricating a dual-backplate microphone, the method comprising:

providing a first wafer comprising a first conductive single-crystal backplate and a conductive diaphragm;

providing a second conductive single-crystal backplate; and

bonding the second conductive single-crystal backplate to the first wafer having the first conductive single-crystal backplate, such that the diaphragm is sandwiched between, but electrically isolated from, the first conductive single-crystal backplate and the second conductive single-crystal backplate; and

releasing the diaphragm after the first conductive single-crystal backplate and second conductive single-crystal backplate are bonded.

6. The method of fabricating a dual-backplate microphone according to claim 5 , wherein at least one of the second single-crystal backplate and the first single-crystal backplate comprises a device layer of a silicon-on-insulator wafer.

7. The method of fabricating a dual-backplate microphone according to claim 5 , wherein the first wafer further comprises a sacrificial material on a side of the diaphragm opposite the first single-crystal backplate.

8. A method of fabricating a dual-backplate microphone, the method comprising:

providing a first wafer comprising a first conductive single-crystal backplate and a conductive diaphragm;

providing a second conductive single-crystal backplate, the second conductive single-crystal backplate comprising a second wafer comprising a backplate layer, an adhesive layer and a donor layer; and

bonding the second conductive single-crystal backplate to the first wafer having the first conductive single-crystal backplate, such that the diaphragm is sandwiched between, but electrically isolated from, the first conductive single-crystal backplate and the second conductive single-crystal backplate; and

removing the donor layer and adhesive layer of the second wafer.

9. The method of fabricating a dual-backplate microphone according to claim 8 , wherein the diaphragm forms a first variable capacitor with the first conductive single-crystal backplate and a second variable capacitor with the second conductive single-crystal backplate.

10. The method of fabricating a dual-backplate microphone according to claim 8 , wherein at least one of the second single-crystal backplate and the first single-crystal backplate comprises a device layer of a silicon-on-insulator wafer.

11. A method of fabricating a dual-backplate microphone, the method comprising:

providing a first wafer comprising a first conductive single-crystal backplate and a conductive diaphragm;

providing a second conductive single-crystal backplate, the second conductive single-crystal backplate comprising a second backplate layer having a first face, wherein the first face comprises one or more standoffs; and

bonding the second conductive single-crystal backplate to the first wafer having the first conductive single-crystal backplate, such that the diaphragm is sandwiched between, but electrically isolated from, the first conductive single-crystal backplate and the second conductive single-crystal backplate.

12. The method of fabricating a dual-backplate microphone according to claim 11 , wherein the diaphragm forms a first variable capacitor with the first conductive single-crystal backplate and a second variable capacitor with the second conductive single-crystal backplate.

13. The method of fabricating a dual-backplate microphone according to claim 11 , wherein bonding comprises a layer-transfer process.

14. The method of fabricating a dual-backplate microphone according to claim 11 , wherein the second single-crystal backplate comprises a second wafer comprising a backplate layer, an adhesive layer and a donor layer, and wherein the method further comprises removing the donor layer and adhesive layer of the second wafer.

15. The method of fabricating a dual-backplate microphone according to claim 11 , wherein at least one of the second single-crystal backplate and the first single-crystal backplate comprises a device layer of a silicon-on-insulator wafer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2013
From: ANALOG DEVICES, INC.
To: INVENSENSE, INC.
Reel/Frame 031635/0388 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2010
From: YANG, KUANG L.; CHEN, LI; CHEN, THOMAS D.
To: ANALOG DEVICES, INC.
Reel/Frame 025492/0090 →