Methods for testing lasers using optical burn-in
View Patent ↗Semiconductor lasers are aged to identify weak or flawed devices, resulting in improved reliability of the remaining devices. The lasers can be aged using a high-power optical burn-in that includes providing a high drive current to the lasers for a period of time, and maintaining the ambient temperature of the lasers at a low temperature. After the high-power optical burn-in, the output of the lasers can be measured to determine if the lasers are operating within specifications. Those that are not can be discarded, while those that are can be further aged using a high-temperature thermal burn-in that includes providing a drive current to the lasers while maintaining the ambient temperature of the lasers at a high-temperature.
1. A method for testing a laser, the method comprising:
determining an initial optical output power for a laser;
performing a high-power optical burn-in on the laser for a first period of time;
determining a subsequent optical output power for the laser; and
comparing the subsequent optical output power to the initial optical output power to determine whether the laser is operating within a predetermined set of specifications.
2. The method of claim 1 , wherein performing a high-power optical burn-in on the laser includes providing a drive current to the laser while maintaining the ambient temperature of the laser at 50 degrees Celsius or lower, the drive current provided to the laser being at least three times greater than the normal operating bias current of the laser.
3. The method of claim 1 , further comprising:
performing a high-temperature thermal burn-in on the laser determined to be operating within the specifications;
determining a final optical output power for the laser; and
comparing the final optical output power to the initial optical output power to determine if the laser continues to operate within the specifications.
4. The method of claim 3 , wherein the high-temperature thermal burn-in is performed for a second period of time between several hours and several days.
5. The method of claim 3 , further comprising, performing a sweep optical burn-in on the laser.
6. The method of claim 1 , wherein laser comprises a Fabry-Perot laser configured for optical signal transmission at a data rate of approximately: 10 gigabits per second, 17 gigabits per second, or 25 gigabits per second.
7. A method for testing lasers, the method comprising:
performing an initial test on a plurality of lasers to determine an initial optical output power for each of the plurality of lasers;
performing a high-power optical burn-in on the plurality of lasers for a first period of time;
after performing the high-power optical burn in on the plurality of lasers for the first period of time, performing a subsequent test to determine a subsequent optical output power for each of the plurality of lasers; and
for each of the plurality of lasers, comparing the subsequent optical output power to the initial optical output power to determine which of the plurality of lasers are operating within specifications.
8. The method of claim 7 , wherein performing a high-power optical burn-in on the plurality of lasers includes providing a drive current to each of the plurality of lasers while maintaining the ambient temperature of the plurality of lasers at 50 degrees Celsius or lower, the drive current provided to each laser being at least three times greater than the normal operating bias current of the laser.
9. The method of claim 8 , wherein the ambient temperature of the lasers is maintained at approximately 35 degrees Celsius.
10. The method of claim 7 , further comprising:
performing a high-temperature thermal burn-in on each of one or more lasers determined to be operating within specifications;
performing a final test on each of the one or more lasers to determine a final optical output power for each of the one or more lasers; and
comparing the final optical output power to the initial optical output power to determine which of the one or more lasers continue to operate within specifications after the high-temperature thermal burn-in.
11. The method of claim 10 , wherein the high-temperature thermal burn-in is performed for a second period of time between several hours and several days.
12. The method of claim 10 , further comprising, performing a sweep optical burn-in on the one or more lasers.
13. The method of claim 10 , further comprising, discarding one or more unreliable lasers not operating within specifications.
14. The method of claim 7 , wherein each of the plurality of lasers comprises a Fabry-Perot laser configured for optical signal transmission at a data rate of approximately: 10 gigabits per second, 17 gigabits per second, or 25 gigabits per second.
15. The method of claim 7 , wherein each of the plurality of lasers comprises an indium aluminum gallium arsenide semiconductor laser.
16. The method of claim 7 , wherein the duration of the first period of time is selected depending on one or more factors including: a design of the lasers, what semiconductor materials make up the lasers, the drive current, and the ambient temperature.