In microscopes, particularly laser scanning microscopes, for detecting light coming from a sample, it is known to protect detectors from excessively high light outputs by means of shutters in the detection beam path. Further, in order to measure the light output impinging on the detector when the detection beam path is closed, a portion of the light is coupled out of the detection beam path and directed to a monitor diode. Constructions of this kind are complicated and costly. In the microscope according to the invention, a monitor diode is arranged on the shutter in such a way that the monitor diode is situated in the detection beam path when the shutter is closed. This makes it possible in a simple manner to measure the light output in a microscope when the detection beam path is closed even without additionally coupling light out of the detection beam path.
1. A microscope comprising:
a detection beam path including:
an optical axis; and
at least one detector for detecting sample light coming from the sample, and
at least one shutter arranged in the detection beam path configured to open and close the detection beam path;
wherein the shutter has at least one monitor diode configured to measure sample light and/or extraneous light when the detection beam path is closed.
2. The microscope according to claim 1 ;
wherein the shutter is designed as a slide.
3. The microscope according to claim 1 ;
wherein the shutter is designed as a rotatable closing flap which closes the detection beam path by rotating around an axis which is collinear with the optical axis of the detection beam path.
4. The microscope according to claim 1 ;
wherein the shutter closes the detection beam path by rotating around an axis which is perpendicular to the optical axis of the detection beam path.
5. The microscope according to claim 1 , further comprising:
at least one catch position configured to hold the shutter when the beam path is open and/or when the beam path is closed.
6. The microscope according to claim 1 ;
wherein the shutter simultaneously closes a plurality of detection beam paths.
7. The microscope according to claim 1 ;
wherein the monitor diode is arranged on a printed circuit board and the printed circuit board forms the shutter.
8. A method for detecting sample light with a microscope according to claim 1 ;
wherein the shutter is moved by a motor.
9. The method for detecting sample light according to claim 8 ;
wherein the motor is de-energized during detection of the sample light.
10. A method for detecting sample light with a microscope which has a detection beam path with an optical axis and at least one detector configured to detect sample light coming from the sample, and at least one shutter arranged in the detection beam path configured to open and close the detection beam path, wherein the shutter has at least one monitor diode configured to measure sample light and/or extraneous light when the detection beam path is closed, the method comprising:
controlling the shutter by a control unit;
evaluating signals of the detector with the control unit when the detection beam path is open; and
evaluating signals of the monitor diode with the control unit when the detection beam path is closed.
11. The method according to claim 10 ;
wherein the control unit controls a motor for moving the shutter.
12. The method according to claim 11 ;
wherein the motor rotates the shutter around an axis extending perpendicular to the optical axis of the detection beam path.
13. The method according to claim 12 ;
wherein the motor rotates the shutter around an axis extending collinear with the optical axis of the detection beam path.
14. The method according to claim 11 ;
wherein the control unit de-energizes the motor during the detection of the sample light.