IP Library Granted Patent US 8,274,092
Granted Patent B2
US 8,274,092 · App. 12/905,795 · Granted Sep 25, 2012

Light-emitting device having a roughened surface with different topographies

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Quick Facts
Patent No.
US 8,274,092
App. No.
12/905,795
Granted
Sep 25, 2012
Kind
B2
Abstract

This invention provides an optoelectronic semiconductor device having a rough surface and the manufacturing method thereof. The optoelectronic semiconductor device comprises a semiconductor stack having a rough surface and an electrode layer overlaying the semiconductor stack. The rough surface comprises a first region having a first topography and a second region having a second topography. The method comprises the steps of forming a semiconductor stack on a substrate, forming an electrode layer on the semiconductor stack, thermal treating the semiconductor stack, and wet etching the surface of the semiconductor stack to form a rough surface.

Claims (15)

1. An optoelectronic semiconductor device comprising:

a substrate;

a semiconductor stack disposed on the substrate and having a rough surface;

an electrode layer between the semiconductor stack and the substrate;

a conductive connecting layer between the semiconductor stack and the substrate; and

a first electrode structure overlaying the semiconductor stack; wherein the rough surface comprises a first region having a first rough topography and a second region having a second rough topography different from the first rough topography.

2. The optoelectronic semiconductor device according to claim 1 , wherein the material of the conductive connecting layer comprises a silver paste or a solder metal.

3. The optoelectronic semiconductor device according to claim 1 , wherein the material of the conductive connecting layer comprises a transparent conductive oxide.

4. The optoelectronic semiconductor device according to claim 1 , wherein the material of the conductive connecting layer comprises a thin metal.

5. The optoelectronic semiconductor device according to claim 1 , wherein a dimension of the second region is smaller than a dimension of the first region.

6. The optoelectronic semiconductor device according to claim 1 , wherein the first region surrounds the first electrode structure.

7. The optoelectronic semiconductor device according to claim 1 , wherein the first electrode structure comprises an electrode layer.

8. The optoelectronic semiconductor device according to claim 7 , further comprising an ohmic contact layer formed between the semiconductor stack and the electrode layer.

9. The optoelectronic semiconductor device according to claim 7 , wherein the first electrode structure further comprises a first conductive pad.

10. The optoelectronic semiconductor device according to claim 1 , further comprising a second conductive pad on a surface of the substrate opposite to the semiconductor stack.

Assignments (1)
CHANGE OF NAME Recorded Feb 18, 2026
From: EPISTAR CORPORATION
To: ENNOSTAR CORPORATION
Reel/Frame 075171/0402 →