Microscope apparatus and microscope observation method

1. A microscope apparatus comprising:

an objective lens that collects light from a plurality of adjacent regions forming a sample on a slide;

a focus position detecting section that detects a focus position of the objective lens with respect to each one of the adjacent regions of the sample;

a focus state adjustment section that adjusts a focus state with respect to one of the adjacent sample regions based on a detection result from the focus position detecting section, wherein the focus state adjustment section adjusts the focus state by adjusting the distance between the objective lens and the slide; and

a magnified-image acquisition section that acquires a plurality of magnified images using the objective lens, each magnified image corresponding to a respective one of the adjacent regions forming the sample,

wherein, if the focus position detected by the focus position detecting section for a particular region differs by more than a predetermined threshold with respect to a focus state of an adjacent magnified region, then the focus state adjustment section limits the adjustment in the focus state for the particular region to the predetermined threshold or less.

2. A microscope apparatus according to claim 1 , wherein the predetermined threshold is a depth of focus of the objective lens.

3. A microscope apparatus according to claim 1 , further comprising an image combining section that generates a virtual slide of the sample by combining the plurality of magnified images forming the regions acquired by the magnified-image acquisition section.

4. A microscope apparatus according to claim 1 , wherein the focus state adjustment section limits the adjustment in the focus state to the predetermined threshold or less, with respect to a focus position obtained based upon a magnified image of an adjacent region that would present the largest amount of change in focus position.

5. A microscope apparatus according to claim 1 , wherein the magnified-image acquisition section is driven so as to sequentially acquire the magnified images of the adjacent regions forming the sample on the slide.

6. A microscope apparatus according to claim 5 , wherein the focus state adjustment section cancels the focus state adjustment limitation when the amount of change in focus position exceeds the predetermined threshold a plurality of times in a row, in acquiring three or more consecutive adjacent magnified image regions.

7. A microscope observation method comprising the steps of:

detecting a focus position of an objective lens that collects light from a sample on a slide, with respect to each of respective adjacent regions of the sample;

determining whether the detected focus position of one of the respective regions is changed by more than a predetermined threshold with respect to a detected focus position of one of the acquired adjacent region;

adjusting the focus state so as to match the detected focus position when the amount of change in focus position is the predetermined threshold or less, and limiting the adjustment in the focus state to the predetermined threshold or less when the amount of change in focus position exceeds the predetermined threshold, wherein the adjustment in the focus state is an adjustment in the distance between the objective lens and the slide; and

acquiring a magnified image of the region of the sample for which the focus state has been adjusted.

8. A microscope observation method according to claim 7 , wherein the predetermined threshold is a depth of focus of the objective lens.