Apparatus and method for impedance measurement
View Patent ↗A system is provided which includes a signal generator for generating a periodic excitation signal and an analog to digital converter, wherein the system is configured to apply the periodic excitation signal to a network including a known first impedance and a second impedance and to take a first set of M digital samples of a first signal relating to the first impedance and a second set of M digital samples of a second signal relating to the second impedance with a sampling frequency that is an integer multiple of the frequency of the periodic signal. The system is further configured to determine the impedance value of the second impedance by calculating a relative phase difference between the first signal and the second signal using the first set of digital samples and the second set of digital samples.
1. An apparatus comprising:
a signal generator that generates an excitation signal;
an impedance network that is coupled to the signal generator so as to receive the excitation signal, wherein the impedance network includes a first impedance and a second impedance, and wherein the first impedance is a reference impedance; and
an impedance meter that is coupled to the impedance network, wherein a sampling network generates a first set of digital samples that corresponds to a first signal from the first impedance and generates a second set of digital samples that corresponds to a second signal from the second impedance, and wherein the impedance meter determined a magnitude of the second impedance by calculating a relative phase difference between the first and second signals using the first and second sets of digital samples.
2. The apparatus of claim 1 , wherein the impedance meter includes a first channel and a second channel.
3. The apparatus of claim 2 , wherein each of the first and second channels further comprise:
an amplifier that is coupled to the impedance network; and
an analog-to-digital converter (ADC) that is coupled to the amplifier.
4. The apparatus of claim 3 , wherein each of the first and second channels further comprises a filter that is coupled to the ADC.
5. The apparatus of claim 4 , wherein the impedance meter further comprises a calculation circuit that is coupled to each of the filters.
6. An apparatus comprising:
a signal generator that is configured to provide an excitation signal to a reference impedance and a sensed impedance of an impedance network;
a first channel having:
a first amplifier that is configured to be coupled to the impedance network so as to receive a first signal from the reference impedance; and
a first ADC that is coupled to the first amplifier so as to generate a first digital signal; a second channel having:
a second amplifier that is configured to be coupled to the impedance network so as to receive a second signal from the sensed impedance; and
a second ADC that is coupled to the second amplifier so as to generate a second digital signal; and
calculation circuit that is coupled to the first and second ADCs so as to determine a magnitude of the sensed impedance by calculating a relative phase difference between the first and second signals from the first and second digital signals.
7. The apparatus of claim 6 , wherein the first and second ADCs are sigma-delta converters.
8. The apparatus of claim 7 , wherein the first and second channels each respectively comprise:
a first filter that is coupled between the first ADC and the calculation circuit; and
a second filter that is coupled between the second ADC and the calculation circuit.
9. The apparatus of claim 8 , wherein the first ADC, the second ADC, the calculation circuit, and the signal generator each receive a clock signal.