Crystalline forms of 3-[5-(2-fluorophenyl)-[1,2,4]oxadiazol-3-yl]-benzoic acid
View Patent ↗The present invention relates to crystalline forms of 3-[5-(2-fluorophenyl)-[1,2,4]oxadiazol-3-yl]-benzoic acid, pharmaceutical compositions and dosage forms comprising the crystalline forms, methods of making the crystalline forms and methods for their use for the treatment, prevention or management of diseases ameliorated by modulation of premature translation termination or nonsense-mediated mRNA decay.
1. A crystal Form B of the compound of formula (I) having solvent in the crystal lattice:
wherein the solvent is 1-propanol
which has an X-ray powder diffraction pattern comprising at least four peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 6.14, 6.39, 6.96, 7.92, 10.78, 12.44, 12.61, 12.88, 13.52, 13.78, 13.97, 14.30, 15.46, 15.68, 15.89, 16.33, 16.76, 17.03, 20.10, 21.03, 23.34, 23.86, 24.18, 24.42, 24.64, 26.62, 26.96, 27.29, 27.64, 27.96, 28.81, 31.05, 32.38, 32.58, 36.23, 37.81, 38.28, 38.44 and 39.16.
2. The crystal form of claim 1 , further characterized by at least one of the following:
(a) an X-ray powder diffraction pattern comprising at least four additional peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 6.14, 6.39, 6.96, 7.92, 10.78, 12.44, 12.61, 12.88, 13.52, 13.78, 13.97, 14.30, 15.46, 15.68, 15.89, 16.33, 16.76, 17.03, 20.10, 21.03, 23.34, 23.86, 24.18, 24.42, 24.64, 26.62, 26.96, 27.29, 27.64, 27.96, 28.81, 31.05, 32.38, 32.58, 36.23, 37.81, 38.28, 38.44 and 39.16;
(b) a thermogravimetric analysis thermogram which has a mass loss of less than 5% of the total mass of the sample upon heating from 25° C. to 165° C.; and
(c) a differential scanning calorimetry thermogram which has an endothermic event with a peak temperature at 243° C.
3. The crystal form of claim 2 , wherein the four additional peak positions are selected from the group consisting of 7.92, 10.78, 17.03 and 27.29.
4. A crystal form of the compound of formula (I)
characterized by an X-ray powder diffraction pattern comprising at least four peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 6.42, 7.00, 7.89, 10.85, 12.61, 12.92, 13.47, 13.97, 15.81, 16.45, 17.12, 20.05, 21.05, 23.92, 24.28, 27.00, 27.39, 27.84, 28.04, 28.94, 31.10, 32.58, 36.11, 37.71, 38.15 and 38.61, wherein the crystal form has 1-butyl acetate, acetic acid or nitromethane in the crystal lattice.
5. The crystal form of claim 4 , wherein the four peak positions are selected from the group consisting of 7.89, 10.85, 17.12 and 27.39.
6. A crystal form of the compound of formula (I)
characterized by an X-ray powder diffraction pattern comprising at least four peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 6.10, 6.38, 6.54, 7.10, 8.02, 10.91, 12.71, 13.50, 13.62, 13.86, 14.10, 15.56, 15.70, 15.91, 16.55, 16.96, 17.22, 17.50, 19.82, 20.08, 20.34, 21.15, 23.78, 23.93, 24.38, 24.56, 26.88, 27.16, 27.48, 27.88, 28.04, 28.78, 29.02, 32.71, 36.01, 38.10, 38.56 and 39.38, wherein the crystal form has a 1/1 mixture of tetrahydrofuran and heptane in the crystal lattice.
7. The crystal form of claim 6 , wherein the four peak positions are selected from the group consisting of 7.10, 10.91, 16.96 and 27.48.
8. A crystal form of the compound of formula (I)
characterized by an X-ray powder diffraction pattern comprising at least four peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 1.79, 2.30, 2.57, 2.78, 3.29, 3.59, 3.89, 4.07, 4.34, 4.49, 4.76, 5.06, 6.47, 6.91, 7.96, 10.89, 12.87, 13.58, 13.99, 15.97, 16.48, 17.10, 20.00, 20.36, 21.04, 23.40, 24.29, 24.89, 26.87, 27.49, 27.80, 28.07, 29.08 and 38.61.
9. The crystal form of claim 8 , wherein the four peak positions are selected from the group consisting of 7.96, 10.89, 17.10 and 27.49.
10. A crystal form of the compound of formula (I)
characterized by an X-ray powder diffraction pattern comprising at least four peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 6.22, 6.51, 7.13, 8.17, 10.91, 12.87, 13.80, 14.12, 14.28, 15.78, 16.23, 16.54, 17.15, 20.33, 21.22, 21.36, 23.94, 24.30, 27.30, 27.58, 28.00, 28.74, 28.96, 32.70, 36.74, 38.18, 38.38, 38.52 and 39.31, wherein the crystal form has dimethoxyether in the crystal lattice.
11. The crystal form of claim 10 , wherein the four peak positions are selected from the group consisting of 8.17, 10.91, 17.15 and 27.30.
12. A crystal form of the compound of formula (I)
characterized by an X-ray powder diffraction pattern comprising at least four peak positions (°2θ±0.2), when measured using Cu Kα radiation, selected from the group consisting of 6.04, 6.49, 7.91, 10.92, 12.61, 12.92, 13.10, 13.42, 13.82, 13.99, 15.40, 15.76, 16.51, 17.15, 19.92, 20.04, 21.01, 23.92, 24.28, 24.48, 26.77, 27.14, 27.40, 27.74, 28.09, 28.82, 28.99, 31.03, 32.58, 35.64, 35.85, 37.48, 37.66 and 38.62.
13. The crystal form of claim 12 , wherein the four peak positions are selected from the group consisting of 7.91, 10.92, 17.15 and 27.40.