IP Library Granted Patent US 8,355,285
Granted Patent B2
US 8,355,285 · App. 12/915,573 · Granted Jan 15, 2013

Method and system for adaptively finding reference voltages for reading data from a MLC flash memory

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,355,285
App. No.
12/915,573
Granted
Jan 15, 2013
Kind
B2
Abstract

A method and system for adaptively finding reference voltages for reading data from a multi-level cell (MLC) flash memory is disclosed. According to one embodiment, a first total number of cells of the flash memory above a first threshold voltage in a shifted threshold voltage distribution is provided. Search to find a second threshold voltage such that a second total number of the cells above the second threshold voltage is approximate to the first total number. An initial reference voltage or voltages of the initial threshold voltage distribution are shifted with an amount approximate to a voltage difference between the second threshold voltage and the first threshold voltage, thereby resulting in a new reference voltage or voltages for reading the data from the MLC flash memory.

Claims (15)

1. A method for adaptively finding reference voltages for reading data from a MLC flash memory, the method comprising:

providing a first total number of cells of the flash memory above a first threshold voltage in a shifted threshold voltage distribution;

searching to find a second threshold voltage in an initial threshold voltage distribution such that a second total number of the cells above the second threshold voltage is approximate to the first total number, the second threshold voltage being different from the first threshold voltage; and

shifting an initial reference voltage or voltages of the initial threshold voltage distribution with an amount approximate to a voltage difference between the second threshold voltage and the first threshold voltage, thereby resulting in a new reference voltage or voltages for reading the data from the MLC flash memory.

2. The method of claim 1 , further comprising a step of subjecting the flash memory to a predetermined number of program or erase cycles or for a predetermined data retention elapsed time.

3. The method of claim 1 , wherein the second threshold voltage is a program verify voltage during a program phase.

4. The method of claim 1 , wherein the searching step comprises:

(1) setting a first word line;

(2) retrieving <N,V> data, wherein N represents a total number of cells above a threshold voltage V corresponding to the first word line;

(3) comparing the total number of cells N with the first total number to obtain a cell difference; and

(4) setting a next word line and repeating the steps (2) and (3) corresponding to the associated word line, until the cell difference is less than a predetermined value, thereby finding the second threshold voltage.

5. The method of claim 1 , wherein the initial reference voltage is shifted toward the shifted reference voltage that has a value less than the initial reference voltage.

6. The method of claim 1 , wherein the initial reference voltages are shifted respectively with the same voltage difference.

7. The method of claim 1 , before providing the first total number, further comprising:

requesting the flash memory by a read command.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 22, 2019
From: AUSPITEK (SHENZHEN) INC.
To: YEESTOR MICROELECTRONICS CO., LTD
Reel/Frame 048961/0085 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 7, 2016
From: SKYMEDI CORPORATION
To: AUSPITEK (SHENZHEN) INC.
Reel/Frame 038211/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2010
From: HUANG, CHIEN-FU; CHOU, MING-HUNG; HUANG, HAN-LUNG; CHO, SHIH-KENG
To: SKYMEDI CORPORATION
Reel/Frame 025222/0280 →