IP Library Granted Patent US 8,193,019
Granted Patent B2
US 8,193,019 · App. 12/917,449 · Granted Jun 5, 2012

Vertical cavity surface emitting laser having multiple top-side contacts

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Quick Facts
Patent No.
US 8,193,019
App. No.
12/917,449
Granted
Jun 5, 2012
Kind
B2
Abstract

A VCSEL with undoped mirrors. An essentially undoped bottom DBR mirror is formed on a substrate. A periodically doped first conduction layer region is formed on the bottom DBR mirror. The first conduction layer region is heavily doped at a location where the optical electric field is at about a minimum. An active layer, including quantum wells, is on the first conduction layer region. A periodically doped second conduction layer region is connected to the active layer. The second conduction layer region is heavily doped where the optical electric field is at a minimum. An aperture is formed in the epitaxial structure above the quantum wells. A top mirror coupled to the periodically doped second conduction layer region. The top mirror is essentially undoped and formed in a mesa structure. An oxide is formed around the mesa structure to protect the top mirror during wet oxidation processes.

Claims (56)

1. A method of fabricating a VCSEL comprising:

forming an essentially undoped bottom mirror on a substrate wherein forming a bottom mirror comprises forming alternating layers of materials with different indices of refraction;

forming a first conduction layer region on the bottom mirror, wherein forming the first conduction layer region comprises doping portions of the first conduction layer region more heavily at a location where optoelectronic energy is at about a minimum when the VCSEL is in use;

forming an active layer that contains quantum wells on the first conduction layer region;

forming a second conduction layer region on the active layer, wherein forming a second conduction layer region comprises doping portions of the second conduction layer region more heavily at a location where the optoelectronic energy is at about a minimum when the VCSEL is in use;

forming an epitaxial structure having an aperture, the epitaxial structure being formed above the quantum wells and below the second conduction layer region;

forming a ramp layer positioned between the aperture and the second conduction layer region so as to have a ramp of aluminum in the ramp layer;

forming a top mirror on the second conduction layer region such that the top mirror is essentially undoped and such that the top mirror forms a mesa structure; and

forming an oxide layer around the mesa structure to protect the top mirror from a wet oxidation step.

2. The method of claim 1 , wherein forming a top mirror comprises forming alternating layers of AlAs and GaAs.

3. The method of claim 1 , wherein forming an oxide layer around the mesa structure comprises depositing the oxide layer using plasma enhanced chemical vapor deposition.

4. The method of claim 1 , further comprising:

implanting ions to isolate a VCSEL from other VCSELs on a wafer;

forming a second intracavity contact on the second conduction layer region.

5. The method of claim 1 comprising:

performing a first etch to form a mesa structure in the top mirror, wherein the mesa structure includes at least a portion of the top mirror;

depositing a photoresist layer to form an HF shield mask around at least a portion of the mesa structure;

performing an HF etch to expose a portion of the second conduction layer; and

forming the oxide layer around the mesa structure to protect the top mirror from a wet oxidation step.

6. The VCSEL of claim 1 , wherein the bottom mirror is a DBR mirror.

7. The VCSEL of claim 1 , wherein the doped first conduction layer region and/or doped second conduction region includes a heavily doped layer at the location the optoelectic field is a minimum.

8. The VCSEL of claim 1 , comprising defining the aperture with an oxidized layer.

9. The VCSEL of claim 8 , comprising forming the oxidized layer to define the aperture and include AlGaAs.

10. The VCSEL of claim 9 , wherein the ramp layer, second conduction layer region, and oxidized layer are within a null of the standing wave of the VCSEL.

11. The VCSEL of claim 1 , wherein the ramp layer is within a null of a standing wave of the VCSEL.

12. The VCSEL of claim 1 , wherein the ramp layer and second conduction layer region are within a null of a standing wave of the VCSEL.

13. The VCSEL of claim 1 , wherein the top mirror is essentially undoped.

14. The VCSEL of claim 1 , wherein the top mirror includes a plurality of layers of AlGaAs having an aluminum content in a range of 70% to 100%.

15. The VCSEL of claim 1 , wherein the top mirror forms a mesa structure.

16. A method of fabricating a VCSEL comprising:

forming an essentially undoped bottom mirror on a substrate wherein forming a bottom mirror comprises forming alternating layers of materials with different indices of refraction;

forming a first conduction layer region on the bottom mirror, wherein forming a first conduction layer region comprises doping portions of the first conduction layer region more heavily at a location where the optoelectronic energy is at about a minimum when the VCSEL is in use;

forming an active layer that contains quantum wells on the first conduction layer region;

forming a second conduction layer region on the active layer, wherein forming a second conduction layer region comprises doping portions of the second conduction layer region more heavily at a location where the optoelectronic energy is at about a minimum when the VCSEL is in use;

forming an epitaxial structure having an aperture, the epitaxial structure being formed above the quantum wells and below the second conduction layer region;

forming a ramp layer positioned between the aperture and the second conduction layer region so as to have a ramp of aluminum in the ramp layer;

forming a top mirror on the second conduction layer region such that the top mirror is essentially undoped and such that the top mirror forms a mesa structure; and

forming an oxide layer around the mesa structure to protect the top mirror from a wet oxidation step, wherein the oxide layer comprises a layer of silicon dioxide that surrounds the top mirror.

17. The VCSEL of claim 16 , comprising forming the VCSEL to include:

the bottom mirror is a DBR mirror;

the doped first conduction layer region and/or doped second conduction region includes a heavily doped layer at the location the optoelectic field is a minimum;

the aperture being defined with an oxidized layer having AlGaAs;

the ramp layer is within a null of a standing wave of the VCSEL; and

the top mirror is essentially undoped and includes a plurality of layers of AlGaAs having an aluminum content in a range of 70% to 100% and has a mesa structure.

18. The VCSEL of claim 17 , wherein the ramp layer and second conduction layer region are within a null of a standing wave of the VCSEL.

19. The VCSEL of claim 17 , wherein the ramp layer, second conduction layer region, and oxidized layer are within a null of the standing wave of the VCSEL.

20. A method of fabricating a VCSEL comprising:

forming an essentially undoped bottom DBR mirror on a substrate wherein forming a bottom mirror comprises forming alternating layers of materials with different indices of refraction;

forming a periodically doped first conduction layer region of a first conductivity type on the bottom mirror, wherein forming the first conduction layer region comprises doping portions of the first conduction layer region more heavily at a location where optoelectronic energy is at about a minimum when the VCSEL is in use;

forming an active layer that contains quantum wells on the periodically doped first conduction layer region;

forming a periodically doped second conduction layer region of a second conductivity type on the active layer, wherein forming a second conduction layer region comprises doping portions of the second conduction layer region more heavily at a location where the optoelectronic energy is at about a minimum when the VCSEL is in use;

forming an epitaxial structure having an aperture defined by an oxidized AlGaAs layer, the epitaxial structure being formed above the quantum wells and below the second conduction layer region;

forming a ramp layer positioned between the aperture and the second conduction layer region so as to have a ramp of aluminum in the ramp layer;

forming a top mirror on the second conduction layer region such that the top mirror is essentially undoped and such that the top mirror forms a mesa structure and includes a plurality of layers of AlGaAs having an aluminum content in a range of 70% to 100%; and

forming an oxide layer of around the mesa structure to protect the top mirror from a wet oxidation step,

wherein the ramp layer, second conduction layer, and oxidized AlGaAs layer are within a single null of a standing wave of the VCSEL.

Assignments (5)
PATENT RELEASE AND REASSIGNMENT Recorded Jul 5, 2022
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
Reel/Frame 060574/0001 →
SECURITY INTEREST Recorded Jul 1, 2022
From: II-VI INCORPORATED; II-VI DELAWARE, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; PHOTOP TECHNOLOGIES, INC.; COHERENT, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 060562/0254 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Sep 25, 2019
From: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050484/0204 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2019
From: JOHNSON, RALPH H.; PENNER, SCOTT R.; BIARD, JAMES ROBERT; FITZGERALD, COLBY
To: FINISAR CORPORATION
Reel/Frame 049259/0572 →