Semiconductor packages with reduced solder voiding

1. A semiconductor package for attaching to a thermal land of a printed circuit board, the semiconductor package comprising:

a leadframe having an I/O pad and a thermal pad;

a fabricated semiconductor die having a bond pad, said fabricated semiconductor die attached to a top surface of the thermal pad;

a wire bond connecting the bond pad to the I/O pad;

wherein a bottom surface of the thermal pad comprises a channel pattern matching a channel pattern of the thermal land, wherein the thermal land is attached to the bottom surface of the thermal pad so as to create channels with upper walls defined by the thermal pad and lower walls defined by the thermal land.

2. The package of claim 1 wherein the channels are partially filled with a mold compound.

3. The package of claim 1 wherein the channels are completely filled with a mold compound.

4. The package of claim 1 wherein the channels contain no mold compound.

5. The package of claim 1 wherein the channels form a pattern resembling “X”.

6. The package of claim 1 wherein the channels form a grid pattern.

7. The package of claim 1 wherein the channels extend to the border of the thermal pad.

8. The package of claim 1 wherein the channels do not extend to the border of the thermal pad.

9. The package of claim 1 wherein the channels are half etched into the thermal pad.

10. The package of claim 1 wherein the package is a quad flat no-lead package, a micro leadframe package quad, a micro leadframe package micro, a micro leadframe package dual, a dual row micro leadframe package, a dual flat no-lead package, a thin dual flat no-lead package, a ultra thin dual flat no-lead package, a extreme thin dual flat no-lead package, a quad flat no-lead package with top exposed pad, or a thin quad flat no-lead package.

11. A method of fabricating a leadframe having a thermal pad and an I/O pad, the leadframe having a top surface and a bottom surface for coupling to a thermal land of a printed circuit board, the method comprising:

applying a first photoresist material to the top surface of the leadframe;

applying a second photoresist material to the bottom surface of the leadframe, the second photoresist material having a pattern defining channels in a bottom surface of the thermal pad, wherein the pattern defining channels matches a channel pattern of the thermal land attached to the bottom surface of the thermal pad so as to create channels with upper walls defined by the thermal pad and lower walls defined by the thermal land;

etching the leadframe on the basis of a pattern defined by the first photoresist material; and

etching the leadframe from the bottom surface on the basis of the pattern of the second photoresist material to form the channels in the bottom surface of the thermal pad.

12. The method of claim 11 further comprising:

plating on the top surface and the bottom surface of the leadframe.

13. The method of claim 11 wherein the etching of the leadframe from the bottom surface etches half the thickness of the leadframe.

14. The method of claim 11 wherein the channels form a pattern resembling “X” or a grid pattern.

15. A method of packaging a semiconductor die having a bond pad, the method comprising:

providing a leadframe having a thermal pad and an I/O pad;

forming a channel pattern in a bottom surface of the thermal pad matching a channel pattern of a thermal land of a printed circuit board attached to the bottom surface of the thermal pad so as to create channels with upper walls defined by the thermal pad and lower walls defined by the thermal land;

attaching the semiconductor die to a top surface of the thermal pad;

wire bonding the bond pad to the I/O pad; and

singulating a package having the semiconductor die, the wire bond and the leadframe.

16. The method of claim 15 wherein the channels form a pattern resembling “X” or a grid pattern.

17. The method of claim 15 wherein the channels extend to the border of the thermal pad.

18. The method of claim 15 wherein the channels do not extend to the border of the thermal pad.

19. The method of claim 15 wherein the channels are half etched into the thermal pad.