IP Library Patent Application 12941597
Patent Application
App. No. 12/941,597

METHODS AND COMPOSITIONS FOR DETERMINATION OF FRACTURE GEOMETRY IN SUBTERRANEAN FORMATIONS

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
12/941,597
Abstract

Articles and methods utilizing radiation susceptible materials are provided herein. In one aspect, a proppant, a treatment fluid, or both, may comprise a radiation susceptible material. In another aspect, a method is provided comprising disposing in a formation fracture, a proppant and/or a treatment fluid that comprises a radiation susceptible material, irradiating the radiation susceptible material with neutrons, measuring gamma-radiation emitted from the radiation susceptible material in a single pass, and determining formation fracture height from the measured gamma-radiation. The single-pass may be a continuous process or a periodic process.

Claims (37)

1 . A method for treating a subterranean formation, comprising:

a) disposing in a formation fracture, a proppant, a fracturing fluid, or both comprising a radiation susceptible material, wherein the radiation susceptible material is non-radioactive;

b) positioning a logging tool adjacent at least one portion of the formation fracture after disposing the radiation susceptible material in the formation fracture, wherein the logging tool comprises a first detector apparatus, a neutron emitter, and a second detector apparatus;

c) measuring the gamma-radiation emitted from the at least one portion of the formation fracture using the first detector apparatus for a first period of time;

d) positioning the neutron emitter adjacent the at least one portion;

e) irradiating the at least one portion of the formation fracture for a second period of time;

f) positioning the second detector apparatus adjacent the at least one portion of the formation fracture;

g) measuring the gamma-radiation emitted from any irradiated radiation susceptible material of the proppant, the fracturing fluid, or both, disposed at the at least first portion of the formation fracture for a third period of time; and

h) subtracting the gamma-radiation emitted from the at least one portion of the formation fracture from the gamma-radiation emitted from the irradiated radiation susceptible material of the at least one portion of the formation fracture, wherein steps b) through h) are performed in a single logging pass.

2 . The method of claim 1 , further comprising:

i) determining a formation fracture height from a difference between the gamma-radiation emitted from the at least one portion of the formation fracture from the gamma-radiation emitted from the irradiated radiation susceptible material adjacent the at least first portion of the formation fracture.

3 . The method of claim 2 , further comprising:

j) repeating steps b) through h), after the half-life of the radiation susceptible material has expired, to re-determine the formation fracture height.

4 . The method of claim 4 , wherein the single logging pass comprises performing steps b) to h) for a second portion of the fracture formation.

5 . The method of claim 1 , wherein the single logging pass comprises a continuous movement or a periodic movement.

6 . The method of claim 5 , wherein the first period of time, the second period of time, and third period time are each from about 2 to about 10 minutes in duration.

7 . The method of claim 1 , wherein the radiation susceptible material comprises a material form selected from the group consisting of an elemental metal, a metal alloy, a salt, a composite, a suspension, and combinations thereof.

8 . The method of claim 1 , wherein the radiation susceptible material, after being irradiated, has a half-life of less than or equal to about 100 days.

9 . The method of claim 1 , wherein the radiation sensitive material comprises a particle size of about 1-20 μm.

10 . The method of claim 1 , wherein the radiation sensitive material comprises a material selected from the group consisting of lanthanum, dysprosium, europium, lutetium, holmium, samarium, gadolinium, cerium, vanadium, bromine, manganese, gold, rhenium, tungsten, barium, strontium, germanium, gold, zirconium, tantalum, tungsten, chromium, manganese, boron, indium, iridium, cadmium, gallium, rhenium, and combinations thereof.

11 . The method of claim 1 , wherein the proppant comprises a substrate and a coating disposed thereon, and the radiation susceptible material comprises the substrate, the coating, or both.

12 . The method of claim 11 , wherein the coating comprises a continuous or non-continuous deposition of the radiation susceptible material having a thickness up to about 20 μm.

13 . The method of claim 1 , wherein the proppant comprises a mixture of a first proppant comprising the radiation susceptible material and a second proppant free of any radiation susceptible material.

14 . The method of claim 1 , wherein the proppant comprises a vanadium carbon nitride powder.

15 . The method of claim 1 , wherein the proppant is disposed in a treatment fluid comprising an acid mixture.

16 . A proppant, comprising:

a substrate and a coating disposed on the substrate, wherein at least one of the substrate, the coating, or both, comprise one or more radiation susceptible materials selected from the group consisting of vanadium, indium, a halogen-containing material, a lanthanide series material, and combinations thereof, and wherein the one or more radiation susceptible materials comprise a particle size or thickness of less than about 20 μm, and is non-radioactive until bombarded by neutrons.

17 . The proppant of claim 16 , wherein the coating comprises a continuous or a non-continuous material selected from the group of an organic material, an inorganic material, and combinations thereof.

18 . The proppant of claim 16 , wherein the one or more radiation susceptible materials comprise the coating and are deposited to a thickness from 0.1 μm to 20 μm.

19 . The proppant of claim 17 , wherein the organic material comprises a polymeric material including one or more radiation susceptible materials disposed in the polymeric materials or is integrated into the polymer backbone of the polymeric material.

20 . The proppant of claim 17 , wherein the inorganic material comprises a material form selected from the group consisting of an elemental metal, a metal alloy, a salt, a composite, a suspension, and combinations thereof.

21 . The proppant of claim 16 , wherein the substrate comprises an organic particle having a filler and one or more radiation susceptible materials are dispersed therein.

22 . The proppant of claim 16 , wherein the radiation susceptible material comprises at least vanadium and wherein, after being irradiated, the radiation susceptible material has a half-life of about 10 seconds to about 50 minutes.

23 . The proppant of claim 16 , wherein the radiation susceptible material is a vanadium powder.

24 . The proppant of claim 23 wherein the vanadium powder comprises a vanadium carbon nitride materials and has a particle size of about 1-20 μm, and wherein the amount of vanadium powder is 0.01 to 5 wt. % as vanadium metal, based on the total weight of the proppant.

25 . The proppant of claim 16 , wherein the substrate comprises a first radiation susceptible material and the coating comprises a second radiation susceptible material different than the first radiation susceptible material.

26 . A treatment fluid comprising the proppant of claim 17 .

Assignments (10)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (030146/0970) Recorded Jul 9, 2019
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT AND COLLATERAL AGENT
To: HEXION INC. (FORMERLY KNOWN AS MOMENTIVE SPECIALTY CHEMICALS INC.)
Reel/Frame 049706/0264 →
RELEASE OF SECURITY INTEREST Recorded Feb 23, 2017
From: WILMINGTON TRUST, NATIONAL ASSOCIATION (SUCCESSOR BY MERGER TO WILMINGTON TRUST FSB), AS COLLATERAL AGENT
To: HEXION INC. (FORMERLY KNOWN AS MOMENTIVE SPECIALTY CHEMICALS INC.)
Reel/Frame 041792/0748 →
PATENT SECURITY AGREEMENT Recorded Apr 3, 2013
From: MOMENTIVE SPECIALTY CHEMICALS INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 030146/0946 →
PATENT SECURITY AGREEMENT Recorded Apr 3, 2013
From: MOMENTIVE SPECIALTY CHEMICALS INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 030146/0970 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Mar 28, 2013
From: JPMORGAN CHASE BANK, N.A.
To: MOMENTIVE SPECIALTY CHEMICALS INC. (F/K/A HEXION SPECIALTY CHEMICALS, INC.)
Reel/Frame 030111/0021 →
PATENT SECURITY AGREEMENT Recorded Jul 5, 2011
From: MOMENTIVE SPECIALTY CHEMICALS INC. (FORMERLY KNOWN AS HEXION SPECIALTY CHEMICALS, INC.)
To: WILMINGTON TRUST FSB, AS COLLATERAL AGENT
Reel/Frame 026545/0791 →
PATENT SECURITY AGREEMENT Recorded Jul 5, 2011
From: MOMENTIVE SPECIALTY CHEMICALS INC. (FORMERLY KNOWN AS HEXION SPECIALTY CHEMICALS, INC.)
To: WILMINGTON TRUST COMPANY, AS COLLATERAL AGENT
Reel/Frame 026545/0958 →
SECURITY AGREEMENT Recorded Apr 22, 2011
From: MOMENTIVE SPECIALTY CHEMICALS INC. (FORMERLY KNOWN AS HEXION SPECIALTY CHEMICALS, INC.)
To: JPMORGAN CHASE BANK, N.A., AS APPLICABLE FIRST LIEN REPRESENTATIVE
Reel/Frame 026169/0603 →
CHANGE OF NAME Recorded Mar 18, 2011
From: HEXION SPECIALTY CHEMICALS, INC.
To: MOMENTIVE SPECIALTY CHEMICALS INC.
Reel/Frame 025982/0473 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 2, 2010
From: GREEN, JOHN W.; MCCRARY, AVIS LLOYD; MCDANIEL, ROBERT R.
To: HEXION SPECIALTY CHEMICALS, INC.
Reel/Frame 025438/0990 →