IP Library Granted Patent US 8,334,504
Granted Patent B2
US 8,334,504 · App. 12/950,358 · Granted Dec 18, 2012

Mass spectrometer system

Assignee: Microsaic Systems PLC
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Quick Facts
Patent No.
US 8,334,504
App. No.
12/950,358
Granted
Dec 18, 2012
Kind
B2
Abstract

This invention describes an analytical system where a kinetic impact ionization source is combined with an RF-only ion guide to form a mass spectrometer system for analysis of the elemental and chemical composition of exoatmospheric particles. The kinetic impact ionization source may be used to transform a flux of particle debris into a beam of ions for analysis by a mass analyzer.

Claims (22)

1. An exoatmospheric detection system for the analysis of the elemental and chemical composition of high velocity micro-particles, dust or debris under exoatmospheric conditions, the system comprising a kinetic impact ionisation source and a RF-only ion guide.

2. The system of claim 1 wherein the RF-only ion guide is a multipole RF-only ion guide.

3. The system of claim 1 wherein the RF-only ion guide is coupled to a mass analyzer.

4. The system of claim 3 wherein the mass analyzer is a quadrupole mass analyzer.

5. The system of claim 3 being operable in a full scan mode scan, the mass analyzer comprising a full mass range sufficient to detect several elemental or chemical species of interest based on their mass spectra.

6. The system of claim 3 being operable in a single ion mode to monitor a single mass to charge ratio to detect a certain elemental or chemical species of interest with a duty cycle of 100%.

7. The system of claim 3 being operable in a selected ion mode to monitor several mass to charge ratios to detect several elemental or chemical species of interest with a higher duty cycle than when operated in full scan mode.

8. The system of claim 1 comprising a plurality of RF-only ion guides provided in an array, the array being coupled to at least one kinetic impact ionisation source.

9. The system of claim 8 wherein the individual ones of the plurality of RF-only ion guide are operable in parallel with others of the plurality of RF-only ion guide.

10. The system of claim 8 wherein the array is coupled to a plurality of kinetic impact ionisation sources.

11. The system of claim 8 wherein the array of RF-only ion guides is coupled to a plurality of mass analyzers.

12. The system of claim 11 wherein individual mass analyzers are configured to be operable in single ion mode to monitor several different mass to charge ratios in order to detect multiple elemental or chemical species of interest with a 100% duty cycle.

13. The system of claim 3 comprising at least one RF pre-filter operably providing an increment in the transmission of ions into the mass analyzer.

14. The system of claim 1 wherein the kinetic impact ionisation source comprises a target plate, which on operable contact with high velocity micro-particles, dust or debris effects a generation of ions.

15. The system of claim 14 wherein the target plate is curved.

16. The system of claim 14 wherein the target plate is planar.

17. The system of claim 14 wherein the plate comprises first and second surfaces offset from one another.

18. The system of claim 14 wherein the target plate defines a cone in three dimensions.

19. The system of claim 14 wherein the target plate forms part of equipotential cage to contain and focus ions.

20. The system of claim 14 whereby the target plate is formed from one of gold, silver, rhodium or platinum selected to interact incident energetic microparticles to generate ions in a plasma.

21. The system of claim 1 comprising an ion detector, the ion detector providing for a detection of ions filtered by the RF-only ion guide.

22. An exoatmospheric detection system comprising a kinetic impact ionisation source, a RF-only ion guide, a mass analyzer and an ion detector, the system being configured for the analysis of the elemental and chemical composition of high velocity micro-particles, dust or debris under exoatmospheric conditions, the system comprising an inlet for effecting introduction of the elemental and chemical composition of high velocity micro-particles, dust or debris, the introduced particles being directed to a target plate where they operably transform into ions which are collimated through the RF-only ion guide, filtered by the mass analyzer and detected by the ion detector.

Assignments (2)
CHANGE OF NAME Recorded Jun 13, 2011
From: MICROSAIC SYSTEMS LIMITED
To: MICROSAIC SYSTEMS PLC
Reel/Frame 026431/0713 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2010
From: FINLAY, ALAN; YEATMAN, ERIC; BOXFORD, WILLIAM; ONISCHENKO, ALEX
To: MICROSAIC SYSTEMS LIMITED
Reel/Frame 025409/0587 →
Priority Claims (1)
GB 0920941.2 · Nov 30, 2009 · national
Continuity (1)
Related Publication 20110127423A1 · Jun 2, 2011