IP Library Granted Patent US 8,455,951
Granted Patent B2
US 8,455,951 · App. 12/950,493 · Granted Jun 4, 2013

Semiconductor device

Inventor: Toshiyuki Kosaka (Kanagawa, JP)
Assignee: Sumitomo Electric Device Innovations, Inc.
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Quick Facts
Patent No.
US 8,455,951
App. No.
12/950,493
Granted
Jun 4, 2013
Kind
B2
Abstract

A semiconductor device includes a substrate having a rectangular shape, and a via hole that has an elliptic shape or a track shape having a linear portion in a long-axis direction of the track shape, a long axis of the elliptic shape or the track shape being arranged in a long-side direction of the substrate.

Claims (26)

1. A semiconductor device comprising:

a substrate having a rectangular shape; and

a via hole that has an elliptic shape, a long axis of the elliptic shape being arranged in a long-side direction of the substrate; wherein;

a semiconductor element formed on a surface of the substrate has multiple unit FETs each having a source finger, a drain finger and a gate finger, the multiple unit FETs being connected in parallel;

at least one of the source finger, the drain finger and the gate finger is connected to the via hole; and

the source finger, the drain finger and the gate finger are provided in a short-side direction of the substrate.

2. The semiconductor device according to claim 1 , wherein multiple via holes, each being configured like said via hole, are aligned in the long-side direction of the substrate.

3. The semiconductor device according to claim 1 , wherein multiple source fingers are provided to one source pad, and the via hole is formed below the one source pad.

4. The semiconductor device according to claim 1 , wherein a ratio of the long axis of the via hole to a short axis is equal to or greater than 1.1.

5. The semiconductor device according to claim 1 , wherein a ratio of the long axis of the via hole to a short axis is equal to or greater than 1.5.

6. The semiconductor device according to claim 1 , wherein the substrate comprises any of SiC, Si, sapphire, GaN, GaAs and InP.

7. The semiconductor device according to claim 1 , further comprising a mounting surface on which the substrate is mounted via a metal for bonding made of any of AuSn, Ag paste and solder.

8. The semiconductor device according to claim 7 , wherein the mounting surface is defined by any of Cu, CuMo, CuW, a stacked layer of Cu and Mo, and a stacked layer of Cu and CuMO.

9. A semiconductor device comprising:

a substrate having a rectangular shape; and

a via hole that has a track shape having a linear portion in a long-axis direction of the track shape, a long axis of the track shape being arranged in a long-side direction of the substrate, wherein;

a semiconductor element formed on a surface of the substrate has multiple unit FETs each having a source finger, a drain finger and a gate finger, the multiple unit FETs being connected in parallel;

at least one of the source finger, the drain finger and the gate finger is connected to the via hole; and

the source finger, the drain finger and the gate finger are provided in a short-side direction of the substrate.

10. The semiconductor device according to claim 9 , wherein multiple via holes, each being configured like said via hole, are aligned in the long-side direction of the substrate.

11. The semiconductor device according to claim 9 , wherein multiple source fingers are provided to one source pad, and the via hole is formed below the one source pad.

12. The semiconductor device according to claim 9 , wherein a ratio of the long axis of the via hole to a short axis is equal to or greater than 1.1.

13. The semiconductor device according to claim 9 , wherein a ratio of the long axis of the via hole to a short axis is equal to or greater than 1.5.

14. The semiconductor device according to claim 9 , wherein the substrate comprises any of SiC, Si, sapphire, GaN, GaAs and InP.

15. The semiconductor device according to claim 9 , further comprising a mounting surface on which the substrate is mounted via a metal for bonding made of any of AuSn, Ag paste and solder.

16. The semiconductor device according to claim 15 , wherein the mounting surface is defined by any of Cu, CuMo, CuW, a stacked layer of Cu and Mo, and a stacked layer of Cu and CuMO.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2010
From: KOSAKA, TOSHIYUKI
To: SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
Reel/Frame 025388/0676 →
Priority Claims (1)
JP 2008-140305 · May 29, 2008 · national
Continuity (2)
Continuation PCTJP2009059369 · May 21, 2009
Related Publication 20110084341A1 · Apr 14, 2011