Nanoscale array structures suitable for surface enhanced raman scattering and methods related thereto
View Patent ↗Methods for fabricating nanoscale array structures suitable for surface enhanced Raman scattering, structures thus obtained, and methods to characterize the nanoscale array structures suitable for surface enhanced Raman scattering. Nanoscale array structures may comprise nanotrees, nanorecesses and tapered nanopillars.
1. A method of measuring a local electric field intensity with nanometer resolution for an array structure in surface enhanced Raman scattering (SERS), the method comprising:
providing a structure comprising:
a planar substrate,
an array of nanopillars on the planar substrate, the array of nanopillars substantially perpendicular to the planar substrate and having a substantially cylindrical shape,
a metal drop having a substantially spherical shape on each nanopillar of the array of nanopillars, and
a second metal covering a surface of the planar substrate;
placing a plurality of semiconductor quantum dots or artificial fluorophore molecules in a plurality of hot spots in the structure; and
measuring a photoluminescence and/or a fluorescence spectroscopy and calculating the expected local electric field intensity based on quantum-confined Stark effect, thus measuring the local electric field intensity with nanometer resolution for the structure.
2. The method of claim 1 , wherein the planar substrate and the array of nanopillars are selected from the group consisting of: silicon dioxide, fused silica, sapphire, silicon, and compound semiconductors.
3. The method of claim 1 , wherein the second metal is selected from the group consisting of: silver, gold, aluminum, iridium platinum, palladium, and copper.
4. The method of claim 1 , wherein size, gap width and height of the array of the nanopillars and size, gap width and height of the metal drops on the array of the nanopillars are configured to enable surface enhancement of Raman scattering (SERS).
5. The method of claim 1 , further comprising a dielectric material covering and filling a region between the metal drops and between the nanopillars.
6. The method of claim 1 , wherein a gap width between the metal drops on the array of nanopillars is less than approximately 50 nm.
7. The method of claim 1 , wherein a gap width between the metal drops on the array of nanopillars is less than approximately 10 nm.
8. The method of claim 1 , the structure being a SERS substrate.
9. The method of claim 1 , wherein the measuring the local field intensity comprises applying optical excitation to a SERS hot spot of the plurality of hot spots and measuring a quantum dot bandgap change.