IP Library Granted Patent US 8,492,253
Granted Patent B2
US 8,492,253 · App. 12/959,199 · Granted Jul 23, 2013

Method of forming contacts for a back-contact solar cell

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Quick Facts
Patent No.
US 8,492,253
App. No.
12/959,199
Granted
Jul 23, 2013
Kind
B2
Abstract

Methods of forming contacts for back-contact solar cells are described. In one embodiment, a method includes forming a thin dielectric layer on a substrate, forming a polysilicon layer on the thin dielectric layer, forming and patterning a solid-state p-type dopant source on the polysilicon layer, forming an n-type dopant source layer over exposed regions of the polysilicon layer and over a plurality of regions of the solid-state p-type dopant source, and heating the substrate to provide a plurality of n-type doped polysilicon regions among a plurality of p-type doped polysilicon regions.

Claims (35)

1. A method of forming contacts for a back-contact solar cell, the method comprising:

forming a thin dielectric layer on a substrate;

forming a polysilicon layer on the thin dielectric layer;

forming and patterning a solid-state p-type dopant source on the polysilicon layer, the patterning exposing regions of the polysilicon layer between a plurality of regions of the solid-state p-type dopant source;

forming an n-type dopant source layer over the exposed regions of the polysilicon layer and the plurality of regions of the solid-state p-type dopant source, the forming comprising at least partially driving dopants from the n-type dopant source layer into the exposed regions of the polysilicon layer to form a plurality of n-type dopant-containing polysilicon regions between the plurality of regions of the solid-state p-type dopant source; and, subsequently,

heating the substrate to provide a plurality of n-type doped polysilicon regions among a plurality of p-type doped polysilicon regions and, prior to the heating, removing the plurality of regions of the solid-state p-type dopant source.

2. The method of claim 1 , further comprising:

subsequent to forming an n-type dopant source layer and prior to heating the substrate, forming trenches between the plurality of n-type dopant-containing polysilicon regions and the plurality of regions of the solid-state p-type dopant source, the trenches formed in the polysilicon layer, in the thin dielectric layer, and partially in the substrate.

3. The method of claim 2 , further comprising:

subsequent to forming the trenches and prior to heating the substrate, texturizing portions of the substrate exposed by the trenches.

4. The method of claim 3 , wherein forming the trenches and the texturizing is performed without a cure operation between the forming the trenches and the texturizing.

5. The method of claim 1 , wherein forming the n-type dopant source layer further comprises at least partially driving dopants from the plurality of regions of the solid-state p-type dopant source into the polysilicon layer.

6. The method of claim 5 , wherein heating the substrate comprises activating the dopants in the plurality of n-type dopant-containing polysilicon regions, furthering the driving of dopants originating from the plurality of regions of the solid-state p-type dopant source into the polysilicon layer, and activating the dopants of the plurality of regions of the solid-state p-type dopant source in the polysilicon layer.

7. The method of claim 1 , wherein forming and patterning the solid-state p-type dopant source comprises forming and patterning a layer of boron silicate glass (BSG).

8. The method of claim 1 , wherein forming the n-type dopant source layer comprises forming a layer of P 2 O 5 .

9. The method of claim 1 , further comprising:

forming, by laser ablation, a plurality of contact openings to the plurality of n-type doped polysilicon regions and the plurality of p-type doped polysilicon regions.

10. A solar cell fabricated according to the method of claim 1 .

11. A method of forming contacts for a back-contact solar cell, the method comprising:

forming a thin dielectric layer on a substrate;

forming a polysilicon layer on the thin dielectric layer;

forming and patterning a solid-state p-type dopant source on the polysilicon layer, the patterning exposing regions of the polysilicon layer between a plurality of regions of the solid-state p-type dopant source;

loading the substrate in a reaction chamber and, without removing the substrate from the reaction chamber, both forming an n-type dopant source layer over the exposed regions of the polysilicon layer and the plurality of regions of the solid-state p-type dopant source and at least partially driving dopants from the n-type dopant source layer into the exposed regions of the polysilicon layer to form a plurality of n-type dopant-containing polysilicon regions between the plurality of regions of the solid-state p-type dopant source;

removing the substrate from the reaction chamber; and, subsequently,

heating the substrate to provide a plurality of n-type doped polysilicon regions among a plurality of p-type doped polysilicon regions.

12. The method of claim 11 , further comprising:

subsequent to forming an n-type dopant source layer and prior to heating the substrate, forming trenches between the plurality of n-type dopant-containing polysilicon regions and the plurality of regions of the solid-state p-type dopant source, the trenches formed in the polysilicon layer, in the thin dielectric layer, and partially in the substrate.

13. The method of claim 12 , further comprising:

subsequent to forming the trenches and prior to heating the substrate, texturizing portions of the substrate exposed by the trenches.

14. The method of claim 13 , wherein forming the trenches and the texturizing is performed without a cure operation between the forming the trenches and the texturizing.

15. The method of claim 11 , wherein forming the n-type dopant source layer further comprises at least partially driving dopants from the plurality of regions of the solid-state p-type dopant source into the polysilicon layer.

16. The method of claim 15 , wherein heating the substrate comprises activating the dopants in the plurality of n-type dopant-containing polysilicon regions, furthering the driving of dopants originating from the plurality of regions of the solid-state p-type dopant source into the polysilicon layer, and activating the dopants of the plurality of regions of the solid-state p-type dopant source in the polysilicon layer.

17. The method of claim 11 , further comprising:

while the substrate is loaded in the reaction chamber, at least partially driving dopants from the solid-state p-type dopant source into the polysilicon layer.

18. A solar cell fabricated according to the method of claim 11 .

Assignments (5)
SECURITY INTEREST Recorded Jun 27, 2024
From: MAXEON SOLAR PTE. LTD.
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 067924/0062 →
SECOND LIEN SECURITY INTEREST AGREEMENT Recorded Jun 26, 2024
From: MAXEON SOLAR PTE. LTD
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 071343/0553 →
SECURITY INTEREST Recorded Jun 5, 2024
From: MAXEON SOLAR PTE. LTD.
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 067637/0598 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2023
From: SUNPOWER CORPORATION
To: MAXEON SOLAR PTE. LTD.
Reel/Frame 062699/0875 →
CONFIRMATORY LICENSE Recorded Jun 3, 2014
From: SUNPOWER CORPORATION
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 033114/0108 →