IP Library Granted Patent US 8,207,778
Granted Patent B2
US 8,207,778 · App. 12/961,063 · Granted Jun 26, 2012

Physical quantity sensor

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Quick Facts
Patent No.
US 8,207,778
App. No.
12/961,063
Granted
Jun 26, 2012
Kind
B2
Abstract

Provided is a physical quantity sensor capable of improving physical quantity detection precision thereof. The physical quantity sensor includes a bridge resistance type physical quantity detection element for generating a voltage based on a bias current and a physical quantity, a current supply circuit for supplying the bias current to the physical quantity detection element, and a leakage current control circuit for causing leakage currents flowing when switches of the current supply circuit are in an off state to flow into a ground terminal.

Claims (49)

1. A physical quantity sensor, comprising:

a current supply circuit including a first switch, a second switch, a third switch, and a fourth switch;

a physical quantity detection element which is of a bridge type and includes a first terminal, a second terminal, a third terminal, and a fourth terminal; and

a leakage current control circuit for causing leakage currents flowing through two of the first switch, the second switch, the third switch, and the fourth switch which are in an off sate in the current supply circuit to flow into one of a power supply terminal and a ground terminal, wherein:

the current supply circuit supplies a bias current to the physical quantity detection element; and

the physical quantity detection element generates a voltage based on the bias currents supplied from the current supply circuit and a physical quantity.

2. A physical quantity sensor according to claim 1 , wherein:

the first switch, the second switch, the third switch, and the fourth switch comprise a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, respectively;

the leakage current control circuit comprises a third PMOS transistor, a fourth PMOS transistor, a fifth NMOS transistor, and a sixth NMOS transistor,

the fifth NMOS transistor has a drain connected to a connection point between a drain of the first PMOS transistor and a source of the third PMOS transistor and a source connected to a ground terminal;

the third PMOS transistor has a drain connected to the third terminal;

the sixth NMOS transistor has a drain connected to a connection point between a drain of the second PMOS transistor and a source of the fourth PMOS transistor, and a source connected to a ground terminal; and

a drain of the fourth PMOS transistor is connected to the fourth terminal.

3. A physical quantity sensor according to claim 2 , wherein:

the first switch, the second switch, the third switch, and the fourth switch comprise a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, respectively;

the leakage current control circuit comprises a third NMOS transistor, a fourth NMOS transistor, a fifth PMOS transistor, and a sixth PMOS transistor;

the fifth PMOS transistor has a drain connected to a connection point between a drain of the first NMOS transistor and a source of the third NMOS transistor and a source connected to a power supply terminal;

the third NMOS transistor has a drain connected to the first terminal;

the sixth PMOS transistor has a drain connected to a connection point between a drain of the second NMOS transistor and a source of the fourth NMOS transistor, and a source connected to a power supply terminal; and

the fourth NMOS transistor has a drain connected to the second terminal.

4. A physical quantity sensor according to claim 1 , wherein:

the first switch, the second switch, the third switch, and the fourth switch comprise a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, respectively;

the leakage current control circuit comprises a third NMOS transistor, a fourth NMOS transistor, a fifth PMOS transistor, and a sixth PMOS transistor;

the fifth PMOS transistor has a drain connected to a connection point between a drain of the first NMOS transistor and a source of the third NMOS transistor and a source connected to a power supply terminal;

the third NMOS transistor has a drain connected to the first terminal;

the sixth PMOS transistor has a drain connected to a connection point between a drain of the second NMOS transistor and a source of the fourth NMOS transistor, and a source connected to a power supply terminal; and

the fourth NMOS transistor has a drain connected to the second terminal.

5. A physical quantity sensor according to claim 1 , wherein:

the first switch, the second switch, the third switch, and the fourth switch comprise a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, respectively;

the leakage current control circuit comprises a third PMOS transistor, a fourth PMOS transistor, a fifth PMOS transistor, and a sixth PMOS transistor;

the fifth PMOS transistor has a source connected to a connection point between a drain of the first PMOS transistor and a source of the third PMOS transistor and a drain connected to a ground terminal;

the third PMOS transistor has a drain connected to the third terminal;

the sixth PMOS transistor has a source connected to a connection point between a drain of the second PMOS transistor and a source of the fourth PMOS transistor, and a drain connected to a ground terminal; and

the fourth PMOS transistor has a drain connected to the fourth terminal.

6. A physical quantity sensor according to claim 5 , wherein:

the first switch, the second switch, the third switch, and the fourth switch comprise a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, respectively;

the leakage current control circuit comprises a third NMOS transistor, a fourth NMOS transistor, a fifth NMOS transistor, and a sixth NMOS transistor;

the fifth NMOS transistor has a source connected to a connection point between a drain of the first NMOS transistor and a source of the third NMOS transistor and a drain connected to a power supply terminal,

the third NMOS transistor has a drain connected to the first terminal;

the sixth NMOS transistor has a source connected to a connection point between a drain of the second NMOS transistor and a source of the fourth NMOS transistor, and a drain connected to a power supply terminal; and

the fourth NMOS transistor has a drain connected to the second terminal.

7. A physical quantity sensor according to claim 1 , wherein:

the first switch, the second switch, the third switch, and the fourth switch comprise a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, respectively;

the leakage current control circuit comprises a third NMOS transistor, a fourth NMOS transistor, a fifth NMOS transistor, and a sixth NMOS transistor;

the fifth NMOS transistor has a source connected to a connection point between a drain of the first NMOS transistor and a source of the third NMOS transistor and a drain connected to a power supply terminal,

the third NMOS transistor has a drain connected to the first terminal;

the sixth NMOS transistor has a source connected to a connection point between a drain of the second NMOS transistor and a source of the fourth NMOS transistor, and a drain connected to a power supply terminal; and

the fourth NMOS transistor has a drain connected to the second terminal.

8. A physical quantity sensor according to claim 1 , wherein the physical quantity comprises a magnetic field.

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 7, 2010
From: FUJIMURA, MANABU; ARIYAMA, MINORU; MURAOKA, DAISUKE; HIKICHI, TOMOKI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 025461/0075 →