IP Library Granted Patent US 7,985,611
Granted Patent B1
US 7,985,611 · App. 12/961,573 · Granted Jul 26, 2011

Method for manufacturing integrated MEMS resonator device

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Quick Facts
Patent No.
US 7,985,611
App. No.
12/961,573
Granted
Jul 26, 2011
Kind
B1
Abstract

The present invention provides a method for manufacturing a micro-electro-mechanical system (MEMS) resonator device using the same device layer, dielectric layer, and conductive layer that is used to create other electrical devices in a complementary metal oxide semiconductor (CMOS) process.

Claims (33)

1. A method for manufacturing a micro-electro-mechanical system (MEMS) resonator device in a semiconductor comprising:

providing a substrate having a device layer;

providing a dielectric layer over the device layer and a conductive layer over the dielectric layer;

from the dielectric layer, forming a gate dielectric for a gate of a field effect transistor, and a dielectric plate for at least one transducer of a MEMS resonator device;

from the conductive layer, forming a gate electrode over the gate dielectric for the gate, and a transducer plate over the dielectric plate for the at least one transducer; and

forming a substantially freely suspended MEMS resonator body in the device layer, wherein the at least one transducer is located on the resonator body to create the MEMS resonator device.

2. The method of claim 1 wherein the field effect transistor is formed on the device layer and apart from the MEMS resonator body.

3. The method of claim 1 further comprising providing a first metal layer over at least the gate electrode and the transducer plate of the at least one transducer, and from the first metal layer forming a gate contact over the gate electrode for the gate and a contact plate over the transducer plate for the at least one transducer.

4. The method of claim 1 further comprising forming a metal contact over the contact plate of the at least one transducer.

5. The method of claim 1 wherein the dielectric layer is formed from one of a group consisting of silicon oxide (SiO2), hafnium oxide (HfO2), and silicon nitride (Si3N4).

6. The method of claim 1 wherein the conductive layer is formed from one of a group consisting of poly silicon, metal, and other conducting material.

7. The method of claim 1 wherein a thickness of the dielectric layer is approximately 0.002 μm to 0.015 μm.

8. The method of claim 1 wherein a thickness of the conductive layer is approximately 0.1 μm to 0.5 μm.

9. The method of claim 1 wherein the MEMS resonator body is formed from a portion of the device layer and connected to a remaining portion of the device layer by at least one anchor.

10. The method of claim 9 wherein the dielectric plate and the transducer plate extend over the at least one anchor and onto a stable region on the device layer and apart from the MEMS resonator body.

11. The method of claim 10 further comprising forming a metal contact over the dielectric plate in the stable region on the device layer.

12. The method of claim 1 wherein the at least one transducer is two transducers.

13. The method of claim 1 wherein the device layer resides over a substrate dielectric in the substrate and further comprising:

forming a trench through the device layer to the substrate dielectric and substantially around a region defining the MEMS resonator body; and

removing a portion of the substrate dielectric underneath the MEMS resonator body to form the substantially freely suspended MEMS resonator body.

14. The method of claim 13 further comprising:

filling the trench with removable material; and

removing the removable material from the trench before removing the portion of the substrate dielectric underneath the MEMS resonator body.

15. The method of claim 1 further comprising forming a source region and a drain region on either side of the gate to form the field effect transistor.

16. The method of claim 1 wherein providing the dielectric layer and the conductive layer is part of a complementary metal oxide semiconductor manufacturing process.

17. The method of claim 1 wherein the dielectric layer comprises both the gate dielectric and the dielectric plate.

18. The method of claim 1 wherein the conductive layer comprises both the gate electrode and the transducer plate.

19. A method for manufacturing a micro-electro-mechanical system (MEMS) resonator device in a semiconductor comprising:

providing a substrate having a device layer;

providing a dielectric layer over the device layer and a conductive layer over the dielectric layer;

from the dielectric layer, forming a gate dielectric for a gate of a field effect transistor, and a dielectric plate for at least one transducer of a MEMS resonator device, such that the dielectric layer includes both the gate dielectric and the dielectric plate;

from the conductive layer, forming a gate electrode over the gate dielectric for the gate, and a transducer plate over the dielectric plate for the at least one transducer, such that the conductive layer includes both the gate electrode and the transducer plate; and

forming a substantially freely suspended MEMS resonator body in the device layer, wherein the at least one transducer is located on the resonator body to create the MEMS resonator device.

Assignments (4)
MERGER Recorded Jun 16, 2016
From: RF MICRO DEVICES, INC.
To: QORVO US, INC.
Reel/Frame 039196/0941 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS (RECORDED 3/19/13 AT REEL/FRAME 030045/0831) Recorded Mar 30, 2015
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: RF MICRO DEVICES, INC.
Reel/Frame 035334/0363 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2013
From: IVANOV, TONY; COSTA, JULIO; HAMMOND, JONATHAN H.
To: RF MICRO DEVICES, INC.
Reel/Frame 030078/0810 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Mar 19, 2013
From: RF MICRO DEVICES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 030045/0831 →