Test arrangement for AC testing of electrical high voltage components
View Patent ↗A test arrangement is provided for AC testing of electrical high voltage components including at least one inverter, at least one test transformer and at least one high voltage inductor arranged as test components in a common cuboid container. The at least one high voltage inductor runs along an imaginary axis and may be at least partly removed from the container through at least one opening in a limit face of the container by means of a movement device. The at least one high voltage inductor includes has integrated surge protection.
1. A test arrangement for AC voltage testing of high-voltage electrical components, the test arrangement comprising:
test components including at least one inverter, at least one test transformer, and at least one high-voltage inductor, the at least one high-voltage inductor extending along an imaginary axis;
a cuboid container in which the test components are commonly arranged;
a movement apparatus configured to move the at least one high-voltage inductor at least partially out of the container through at least one opening in a limit face of the container,
wherein the at least one high-voltage inductor has integrated surge protection.
2. The test arrangement as claimed in claim 1 , comprising:
at least one capacitor as the integrated surge protection,
wherein the at least one capacitor is connected mechanically to the high-voltage inductor and is connected, at least in sections, electrically in parallel with a current path through the high-voltage inductor.
3. The test arrangement as claimed in claim 2 , wherein the high-voltage inductor has at least two coil segments which are connected electrically in series and which each have two end windings.
4. The test arrangement as claimed in claim 3 , wherein the at least two coil segments are hollow-cylindrical in shape and are arranged adjacent to one another along the imaginary axis,
wherein said imaginary axis passes through an interior of the hollow-cylindrical shapes of the adjacent coil segments, respectively.
5. The test arrangement as claimed in claim 3 , wherein the at least one capacitor is assigned to each coil segment and is connected electrically in parallel to the two end windings of the corresponding coil segment, respectively.
6. The test arrangement as claimed in claim 1 , wherein the high-voltage inductor has at least two coil segments which are connected electrically in series and which each have two end windings.
7. The test arrangement as claimed in claim 6 , wherein the at least two coil segments are hollow-cylindrical in shape and are arranged adjacent to one another along the imaginary axis,
wherein said imaginary axis passes through an interior of the hollow-cylindrical shapes of the adjacent coil segments, respectively.
8. The test arrangement as claimed in claim 7 , wherein at least one capacitor is arranged in an inner cavity of the coil segments of the high-voltage inductor and is connected electrically thereto, respectively.
9. The test arrangement as claimed in claim 7 , wherein the at least two coil segments are arranged along the imaginary axis on a common cylindrical hollow body.
10. The test arrangement as claimed in claim 9 , comprising at least one capacitor, which is connected mechanically to the high-voltage inductor,
wherein the at least one capacitor is assigned to each coil segment and is connected electrically in parallel to the two end windings of the corresponding coil segment, respectively.
11. The test arrangement as claimed in claim 6 , comprising at least one capacitor, which is connected mechanically to the high-voltage inductor,
wherein the at least one capacitor is assigned to each coil segment and is connected electrically in parallel to the two end windings of the corresponding coil segment, respectively.
12. The test arrangement as claimed in claim 11 , wherein at least one capacitor, which is connected electrically in parallel with the two end windings of a coil segment, is connected mechanically to said coil segment.
13. The test arrangement as claimed in claim 11 , wherein an electrical series circuit comprising at least two coil segments and an electrical series circuit comprising at least two capacitors, which are connected mechanically to the high-voltage inductor, are connected electrically in parallel with one another.
14. The test arrangement as claimed in claim 6 , wherein an electrical series circuit comprising at least two coil segments and an electrical series circuit comprising at least two capacitors, which are connected mechanically to the high-voltage inductor, are connected electrically in parallel with one another.
15. The test arrangement as claimed in claim 14 , wherein at least one capacitor, which is connected mechanically to the high-voltage inductor, is arranged between two coil segments which are adjacent to one another along the imaginary axis.
16. The test arrangement as claimed in claim 15 , wherein at least one capacitor, which is connected electrically in parallel with the two end windings of a coil segment, is connected mechanically to said coil segment.
17. The test arrangement as claimed in claim 1 , comprising a toroidal electrode for controlling the electrical potential of the high-voltage inductor,
wherein the toroidal electrode is arranged at an end of the high-voltage inductor which is remote from ground.
18. The test arrangement as claimed in claim 17 , comprising a pillar-like voltage divider arranged in parallel to and at substantially the same height as the high-voltage inductor at the same height,
wherein the voltage divider and the high-voltage inductor are connected electrically to the toroidal electrode.
19. The test arrangement as claimed in claim 18 , wherein the pillar-like voltage divider is arranged at a distance next to the high-voltage inductor and is connected mechanically thereto.