IP Library Granted Patent US 8,643,381
Granted Patent B2
US 8,643,381 · App. 12/963,941 · Granted Feb 4, 2014

Test arrangement for AC voltage testing of electrical high voltage components

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Quick Facts
Patent No.
US 8,643,381
App. No.
12/963,941
Granted
Feb 4, 2014
Kind
B2
Abstract

A test arrangement is provided for AC voltage testing of high voltage components including at least one inverter, at least one test transformer, at least one high-voltage inductor and at least one further high voltage component arranged as test components in a common cuboid container. The at least one high-voltage inductor is movable at least partially out of the container through at least one opening on a boundary surface of the container, by means of a movement apparatus. The at least one further high voltage component is movable within the cuboid container from a transport position to a working position.

Claims (42)

1. A test arrangement for AC voltage testing of electrical high-voltage components, the test arrangement comprising:

test components including at least one inverter, at least one test transformer, at least one high-voltage inductor and at least one further high-voltage component;

a cuboid container in which the test components are commonly arranged;

a movement apparatus configured to move the at least one high-voltage inductor at least partially out of the container, through at least one opening on a boundary surface of the container,

wherein the at least one further high-voltage component is configured to be moved within the cuboid container from a transport position to a working position, and

wherein the at least one further high-voltage component is fitted and guided in an upper area of the cuboid container.

2. The test arrangement as claimed in claim 1 , wherein the at least one further high-voltage component is an electrical filter element.

3. The test arrangement as claimed in claim 1 , wherein the at least one further high-voltage component is a voltage transformer.

4. The test arrangement as claimed in claim 1 , comprising:

a guide apparatus configured to move the at least one further high-voltage component.

5. The test arrangement as claimed in claim 1 , wherein the container comprises a guide rail configured to move the at least one further high-voltage component thereon.

6. A test arrangement for AC voltage testing of electrical high-voltage components, the test arrangement comprising:

test components including at least one inverter, at least one test transformer, at least one high-voltage inductor and at least one further high-voltage component;

a cuboid container in which the test components are commonly arranged;

a movement apparatus configured to move the at least one high-voltage inductor at least partially out of the container, through at least one opening on a boundary surface of the container,

wherein the at least one further high-voltage component is configured to be moved within the cuboid container from a transport position to a working position, and

wherein the at least one further high-voltage component is configured to be pivoted about a rotation axis.

7. The test arrangement as claimed in claim 1 , comprising:

a locking mechanism configured to lock the at least one further high-voltage component in at least one of the transport position and the working position.

8. A test arrangement for AC voltage testing of electrical high-voltage components, the test arrangement comprising:

test components including at least one inverter, at least one test transformer, at least one high-voltage inductor and at least one further high-voltage component;

a cuboid container in which the test components are commonly arranged;

a movement apparatus configured to move the at least one high-voltage inductor at least partially out of the container, through at least one opening on a boundary surface of the container,

wherein the at least one further high-voltage component is configured to be moved within the cuboid container from a transport position to a working position, and

electrical connecting lines connected to the at least one further high-voltage component and fitted in an upper area of the cuboid container.

9. The test arrangement as claimed in claim 8 , wherein the connecting lines are cables which are sheathed by an insulation layer.

10. The test arrangement as claimed in claim 4 , wherein the guide apparatus for the at least one further high-voltage component has a drive mechanism.

11. The test arrangement as claimed in claim 1 , wherein the working position of the at least one further high-voltage component at least partially intersects an area of the inductor which has not been moved out of the container.

12. The test arrangement as claimed in claim 1 , wherein the movement apparatus is configured to move a voltage divider, together with the high-voltage inductor, out of the cuboid container.

13. The test arrangement as claimed in claim 12 , comprising:

a further movement apparatus configured to move the voltage divider relative to the high-voltage inductor.

14. The test arrangement as claimed in claim 1 , wherein the cuboid container is a transportable freight container with predetermined dimensions.

15. The test arrangement as claimed in claim 1 , wherein the at least one opening is closeable.

16. The test arrangement as claimed in claim 6 , comprising:

a guide apparatus configured to move the at least one further high-voltage component.

17. The test arrangement as claimed in claim 8 , comprising:

a guide apparatus configured to move the at least one further high-voltage component.

18. The test arrangement as claimed in claim 6 , wherein the container comprises a guide rail configured to move the at least one further high-voltage component thereon.

19. The test arrangement as claimed in claim 8 , wherein the container comprises a guide rail configured to move the at least one further high-voltage component thereon.

20. The test arrangement as claimed in claim 8 , wherein the at least one further high-voltage component is fitted and guided in an upper area of the cuboid container.

21. The test arrangement as claimed in claim 16 , wherein the guide apparatus for the at least one further high-voltage component has a drive mechanism.

22. The test arrangement as claimed in claim 17 , wherein the guide apparatus for the at least one further high-voltage component has a drive mechanism.

Assignments (6)
MERGER Recorded Nov 13, 2023
From: HITACHI ENERGY SWITZERLAND AG
To: HITACHI ENERGY LTD
Reel/Frame 065549/0576 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY "ABB TECHNOLOGY LTD."SHOULD READ "ABB TECHNOLOGY AG" PREVIOUSLY RECORDED AT REEL: 040621 FRAME: 0822. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded May 11, 2022
From: ABB TECHNOLOGY AG
To: ABB SCHWEIZ AG
Reel/Frame 059927/0691 →
CHANGE OF NAME Recorded Dec 31, 2021
From: ABB POWER GRIDS SWITZERLAND AG
To: HITACHI ENERGY SWITZERLAND AG
Reel/Frame 058666/0540 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2020
From: ABB SCHWEIZ AG
To: ABB POWER GRIDS SWITZERLAND AG
Reel/Frame 052916/0001 →
MERGER Recorded Nov 15, 2016
From: ABB TECHNOLOGY LTD.
To: ABB SCHWEIZ AG
Reel/Frame 040621/0822 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2011
From: WERLE, PETER; SZCZECHOWSKI, JANUSZ; STEIGER, MATTHIAS
To: ABB TECHNOLOGY AG
Reel/Frame 025727/0576 →