IP Library Granted Patent US 8,134,217
Granted Patent B2
US 8,134,217 · App. 12/967,976 · Granted Mar 13, 2012

Bypass diode for a solar cell

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Quick Facts
Patent No.
US 8,134,217
App. No.
12/967,976
Granted
Mar 13, 2012
Kind
B2
Abstract

Bypass diodes for solar cells are described. In one embodiment, a bypass diode for a solar cell includes a substrate of the solar cell. A first conductive region is disposed above the substrate, the first conductive region of a first conductivity type. A second conductive region is disposed on the first conductive region, the second conductive region of a second conductivity type opposite the first conductivity type.

Claims (31)

1. A bypass diode for a solar cell, the bypass diode comprising:

a substrate of the solar cell;

a first conductive region disposed above the substrate, the first conductive region of a first conductivity type;

and a second conductive region disposed on the first conductive region, the second conductive region of a second conductivity type opposite the first conductivity type; and further comprising:

an isolation trench disposed in the substrate and surrounding the portion of the substrate below the first conductive region, wherein the isolation trench is filled with a dielectric layer that is disposed on the first and second conductive regions.

2. The bypass diode of claim 1 , further comprising: a thin dielectric layer disposed on the substrate, wherein the first conductive region is disposed on the thin dielectric layer.

3. The bypass diode of claim 1 , wherein the second conductive region is narrower than the first conductive region, exposing a top surface of the first conductive region.

4. The bypass diode of claim 3 , wherein the substrate is doped with N-type dopant impurity atoms, the first conductivity type is P-type, the second conductivity type is N-type, and exposing the top surface of the first conductive region comprises exposing a P-type region.

5. The bypass diode of claim 3 , wherein the substrate is doped with P-type dopant impurity atoms, the first conductivity type is N-type, the second conductivity type is P-type, and exposing the top surface of the first conductive region comprises exposing an N-type region.

6. The bypass diode of claim 1 , wherein the second conductive region is disposed within, and surrounded by, an uppermost portion of the first conductive region, but is not disposed in a lowermost portion of the first conductive region.

7. The bypass diode of claim 6 , wherein the substrate is doped with N-type dopant impurity atoms, the first conductivity type is P-type, the second conductivity type is N-type, and the second conductive region is disposed within and surrounded by a P-type region.

8. The bypass diode of claim 6 , wherein the substrate is doped with P-type dopant impurity atoms, the first conductivity type is N-type, the second conductivity type is P-type, and the second conductive region is disposed within and surrounded by a N-type region.

9. The bypass diode of claim 1 , wherein the bottom surface of the isolation trench comprises a random or regularized texturing pattern.

10. A bypass diode for a solar cell, the bypass diode comprising:

a substrate of the solar cell;

a first conductive region disposed above the substrate, the first conductive region of a first conductivity type;

and a second conductive region disposed on the first conductive region, the second conductive region of a second conductivity type opposite the first conductivity type and further comprising:

a thin dielectric layer disposed on the substrate, wherein the first conductive region is disposed on the thin dielectric layer;

wherein the second conductive region is narrower than the first conductive region, exposing a top surface of the first conductive region.

11. The bypass diode of claim 10 , wherein the substrate is doped with N-type dopant impurity atoms, the first conductivity type is P-type, the second conductivity type is N-type, and exposing the top surface of the first conductive region comprises exposing a P-type region.

12. The bypass diode of claim 10 , wherein the substrate is doped with P-type dopant impurity atoms, the first conductivity type is N-type, the second conductivity type is P-type, and exposing the top surface of the first conductive region comprises exposing an N-type region.

13. The bypass diode of claim 10 , further comprising: an isolation trench disposed in the substrate and surrounding the portion of the substrate below the first conductive region, wherein the isolation trench is filled with a dielectric layer that is disposed on the first and second conductive regions.

14. The bypass diode of claim 13 , wherein the bottom surface of the isolation trench comprises a random or regularized texturing pattern.

15. A bypass diode for a solar cell, the bypass diode comprising:

a substrate of the solar cell;

a first conductive region disposed above the substrate, the first conductive region of a first conductivity type;

and a second conductive region disposed on the first conductive region, the second conductive region of a second conductivity type opposite the first conductivity type; and further comprising:

wherein the second conductive region is disposed within, and surrounded by, an uppermost portion of the first conductive region, but is not disposed in a lowermost portion of the first conductive region.

16. The bypass diode of claim 15 , further comprising: a thin dielectric layer disposed on the substrate, wherein the first conductive region is disposed on the thin dielectric layer.

17. The bypass diode of claim 15 , wherein the substrate is doped with N-type dopant impurity atoms, the first conductivity type is P-type, the second conductivity type is N-type, and the second conductive region is disposed within and surrounded by a P-type region.

18. The bypass diode of claim 15 , wherein the substrate is doped with P-type dopant impurity atoms, the first conductivity type is N-type, the second conductivity type is P-type, and the second conductive region is disposed within and surrounded by a N-type region.

Assignments (5)
SECURITY INTEREST Recorded Jun 27, 2024
From: MAXEON SOLAR PTE. LTD.
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 067924/0062 →
SECOND LIEN SECURITY INTEREST AGREEMENT Recorded Jun 26, 2024
From: MAXEON SOLAR PTE. LTD
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 071343/0553 →
SECURITY INTEREST Recorded Jun 5, 2024
From: MAXEON SOLAR PTE. LTD.
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 067637/0598 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2023
From: SUNPOWER CORPORATION
To: MAXEON SOLAR PTE. LTD.
Reel/Frame 062699/0875 →
CONFIRMATORY LICENSE Recorded Jun 6, 2014
From: SUNPOWER CORPORATION
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 033149/0392 →