Method of fabricating a back-contact solar cell and device thereof
View Patent ↗Methods of fabricating back-contact solar cells and devices thereof are described. A method of fabricating a back-contact solar cell includes forming an N-type dopant source layer and a P-type dopant source layer above a material layer disposed above a substrate. The N-type dopant source layer is spaced apart from the P-type dopant source layer. The N-type dopant source layer and the P-type dopant source layer are heated. Subsequently, a trench is formed in the material layer, between the N-type and P-type dopant source layers.
1. A method of fabricating a back-contact solar cell, the method comprising:
forming an N-type dopant source layer and a P-type dopant source layer above a material layer disposed above a semiconductor substrate, the N-type dopant source layer spaced apart from, and not in contact with, the P-type dopant source layer;
heating the N-type dopant source layer and the P-type dopant source layer; and, subsequently,
forming a trench in the material layer, between the N-type and P-type dopant source layers, the trench exposing a portion of the semiconductor substrate.
2. The method of claim 1 , further comprising:
subsequent to forming the trench, removing the N-type dopant source layer and the P-type dopant source layer.
3. The method of claim 2 , further comprising:
subsequent to removing the N-type dopant source layer and the P-type dopant source layer, heating the semiconductor substrate.
4. The method of claim 1 , wherein forming the N-type dopant source layer and the P-type dopant source layer comprises using an ink jet deposition technique.
5. The method of claim 4 , wherein using the ink jet deposition technique comprises forming the N-type dopant source layer and the P-type dopant source layer at the same time.
6. The method of claim 4 , wherein using the ink jet deposition technique comprises forming the N-type dopant source layer and the P-type dopant source layer at different times.
7. The method of claim 1 , wherein forming the N-type dopant source layer and the P-type dopant source layer above the material layer disposed above the semiconductor substrate comprises forming a phosphorous-doped silicate glass layer and a boron-doped silicate glass layer, respectively, directly on a poly-crystalline silicon layer disposed above a single-crystalline silicon substrate.
8. The method of claim 1 , wherein heating the N-type dopant source layer and the P-type dopant source layer comprises transferring N-type dopants and P-type dopants, respectively, into portions of the material layer.
9. The method of claim 8 , wherein heating the N-type dopant source layer and the P-type dopant source layer comprises heating at a temperature of 950 degrees Celsius.
10. The method of claim 8 , wherein heating the N-type dopant source layer and the P-type dopant source layer comprises hardening both the N-type dopant source layer and the P-type dopant source layer.
11. The method of claim 1 , wherein forming the trench comprises texturing, with a textured surface, surfaces of the semiconductor substrate not covered by the material layer.
12. The method of claim 2 , wherein removing the N-type dopant source layer and the P-type dopant source layer comprises using a hydrofluoric acid wet etch technique.
13. The method of claim 3 , wherein heating the semiconductor substrate comprises heating in the presence of a gaseous N-type dopant source and doping, with the gaseous N-type dopant source, the semiconductor substrate at or near surfaces of the semiconductor substrate not covered by the material layer.
14. The method of claim 1 , wherein forming the trench comprises forming the trench partially into the semiconductor substrate.