IP Library Granted Patent US 8,449,179
Granted Patent B2
US 8,449,179 · App. 12/974,956 · Granted May 28, 2013

Temperature detection system

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Quick Facts
Patent No.
US 8,449,179
App. No.
12/974,956
Granted
May 28, 2013
Kind
B2
Abstract

Provided is a temperature detection system which is low in cost. The temperature detection system includes a plurality of temperature detection ICs ( 10 ) for detecting an abnormal temperature and a resistor ( 20 ). Each of the plurality of temperature detection ICs ( 10 ) includes a reference voltage terminal connected to an output terminal of one of the plurality of temperature detection ICs ( 10 ) located at a preceding stage. The resistor ( 20 ) is provided between an output terminal of one of the plurality of temperature detection ICs ( 10 ) located at the final stage and a ground terminal.

Claims (14)

1. A temperature detection system, comprising a plurality of temperature detection ICs,

wherein each of the plurality of temperature detection ICs includes:

a temperature voltage generation circuit for generating a temperature voltage corresponding to a temperature;

a reference voltage generation circuit for generating a reference voltage;

a comparator for inputting the temperature voltage and the reference voltage to compare the temperature voltage with the reference voltage, and outputting a comparison result to an output terminal of the each of the plurality of temperature detection ICs; and

a reference voltage terminal connected to an input terminal of the comparator to which the reference voltage is input, and

wherein the output terminal of the each of the plurality of temperature detection ICs is connected to the reference voltage terminal of one of the plurality of temperature detection ICs located at a subsequent stage and has a high impedance during no detection.

2. A temperature detection system, comprising a plurality of temperature detection ICs,

wherein each of the plurality of temperature detection ICs includes:

a temperature voltage generation circuit for generating a temperature voltage corresponding to a temperature;

a reference voltage generation circuit for generating a reference voltage;

a comparator for inputting the temperature voltage and the reference voltage to compare the temperature voltage with the reference voltage, and outputting a comparison result to an output terminal of the each of the plurality of temperature detection ICs; and

an enable terminal for forcedly making a state of the each of the plurality of temperature detection ICs a detection state when an enable signal is input, and

wherein the output terminal of the each of the plurality of temperature detection ICs is connected to the enable terminal of one of the plurality of temperature detection ICs located at a subsequent stage.

Assignments (4)
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2010
From: IGARASHI, ATSUSHI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 025543/0600 →