Conductive particle, anisotropic conductive film, joined structure, and joining method
The present invention aims to provide conductive particles which can reduce the stress while maintaining high hardness (hardly causing cracks even in a state of being crushed in connection process) by improving rolling properties and can ensure adequate conductive reliability not only with respect to ITO substrates, but also with respect to IZO substrates, an anisotropic conductive film provided with the conductive particles, a joined structure provided with the anisotropic conductive film, and a joining method using the anisotropic conductive film. The conductive particles of the present invention include polymer fine particles, and a conductive layer formed on surfaces of the polymer fine particles, wherein an outermost surface shell of the conductive layer is a nickel-palladium alloy layer.
1. Conductive particles comprising:
polymer fine particles, and
a conductive layer formed on surfaces of the polymer fine particles,
wherein an outermost surface shell of the conductive layer is a nickel-palladium alloy layer, and
wherein a compressive elasticity modulus of the conductive particles at a compression deformation rate of 40% to 70% is 100 kgf/mm 2 to 1,000 kgf/mm 2 , and a compression deformation recovery rate is 10% to 70%.
2. The conductive particles according to claim 1 , wherein the nickel-palladium alloy layer has a thickness of 5 nm to 20 nm.
3. The conductive particles according to claim 1 , wherein the nickel-palladium alloy layer is formed by carrying a palladium catalyst on the surfaces of the polymer fine particles and using a catalyst promoter.
4. The conductive particles according to claim 1 , wherein the conductive layer includes a nickel plating layer which is formed on the surfaces of the polymer fine particles.
5. The conductive particles according to claim 1 , wherein the conductive layer has a thickness of 50 nm to 150 nm.
6. The conductive particles according to claim 1 , further comprising: protrusions each having a core made of at least any one of nickel, palladium, cobalt, and chromium.
7. The conductive particles according to claim 1 , wherein the conductive particles are used for connecting an IZO substrate.
8. Anisotropic conductive film comprising:
conductive particles, and
a binder,
wherein the conductive particles comprise polymer fine particles, and a conductive layer formed on surfaces of the polymer fine particles,
wherein an outermost surface shell of the conductive layer is a nickel-palladium alloy layer,
wherein a compressive elasticity modulus of the conductive particles at a compression deformation rate of 40% to 70% is 100 kgf/mm 2 to 1,000 kgf/mm 2 , and a compression deformation recovery rate is 10% to 70%, and
wherein the binder contains at least one of an epoxy resin and an acrylate resin.
9. The anisotropic conductive film according to claim 8 , further comprising: at least one of a phenoxy resin, an unsaturated polyester resin, a saturated polyester resin and a urethane resin in an amount of 10% by mass to 80% by mass relative to the total amount of the anisotropic conductive film.
10. The anisotropic conductive film according to claim 9 , further comprising: a latent curing agent which is activated under heating.
11. The anisotropic conductive film according to claim 9 , further comprising: a latent curing agent which generates free radicals under heating.
12. The anisotropic conductive film according to claim 8 , wherein when a curing rate of the anisotropic conductive film is 80% or higher, an elastic modulus thereof at a temperature of 40° C. or lower is 0.5 GPa or more, and a glass transition temperature thereof is 50° C. or higher.
13. A joined structure comprising:
a first circuit member,
a second circuit member disposed facing to the first circuit member, and
an anisotropic conductive film disposed between the first circuit member and the second circuit member,
wherein the anisotropic conductive film comprises:
conductive particles, and
a binder,
wherein the conductive particles comprise polymer fine particles, and a conductive layer formed on surfaces of the polymer fine particles,
wherein an outermost surface shell of the conductive layer is a nickel-palladium alloy layer,
wherein a compressive elasticity modulus of the conductive particles at a compression deformation rate of 40% to 70% is 100 kgf/mm 2 to 1,000 kgf/mm 2 , and a compression deformation recovery rate is 10% to 70%,
wherein the binder contains at least one of an epoxy resin and an acrylate resin, and
wherein an electrode in the first circuit member is connected to an electrode in the second circuit member via the conductive particles.
14. The joined structure according to claim 13 , wherein at least one of the first circuit member and the second circuit member is an IZO substrate.
15. A joining method using an anisotropic conductive film, comprising:
disposing an anisotropic conductive film between a first circuit member and a second circuit member,
pressing the first circuit member against the second circuit member, and
connecting an electrode in the first circuit member to an electrode in the second circuit member via the conductive particles,
wherein the anisotropic conductive film comprises:
conductive particles, and
a binder,
wherein the conductive particles comprise polymer fine particles, and a conductive layer formed on surfaces of the polymer fine particles,
wherein an outermost surface shell of the conductive layer is a nickel-palladium alloy layer,
wherein a compressive elasticity modulus of the conductive particles at a compression deformation rate of 40% to 70% is 100 kgf/mm 2 to 1,000 kgf/mm 2 , and a compression deformation recovery rate is 10% to 70%, and
wherein the binder contains at least one of an epoxy resin and an acrylate resin.
16. The joining method according to claim 15 , wherein at least one of the first circuit member and the second circuit member is an IZO substrate.