Nitride semiconductor light-emitting device and method for fabrication thereof
View Patent ↗A nitride semiconductor laser device uses a substrate with low defect density, contains reduced strains inside a nitride semiconductor film, and thus offers a satisfactorily long useful life. On a GaN substrate ( 10 ) with a defect density as low as 10 6 cm −2 or less, a stripe-shaped depressed portion ( 16 ) is formed by etching. On this substrate ( 10 ), a nitride semiconductor film ( 11 ) is grown, and a laser stripe ( 12 ) is formed off the area right above the depressed portion ( 16 ). With this structure, the laser stripe ( 12 ) is free from strains, and the semiconductor laser device offers a long useful life. Moreover, the nitride semiconductor film ( 11 ) develops reduced cracks, resulting in a greatly increased yield rate.
1. A method for fabricating a nitride semiconductor laser device, comprising:
a first step of forming a substrate whose top surface is a nitride semiconductor layer and that has a carved region and a non-carved region;
a second step of forming, directly onto the top surface of the substrate, a nitride semiconductor film having a stripe-shaped laser light waveguide structure,
wherein
the top surface of the substrate has a low defect region with a defect density of 10 6 cm −2 or less,
in the first step, the carved region is formed in the top surface of the substrate in the low defect region of the substrate, and the non-carved region is formed in the top surface of the substrate,
in the second step, the nitride semiconductor film is formed above both the carved region and the non-carved region,
in the second step, the laser light waveguide structure in the nitride semiconductor film is formed right above the non-carved region, and
in the second step, the laser light waveguide structure in the nitride semiconductor film is formed in a region located 5 μm or more away from the nearest edge of the carved region in the top surface of the substrate.
2. A method for fabricating a nitride semiconductor light-emitting device, comprising:
a first step of forming a substrate whose top surface is a nitride semiconductor layer and that has a carved region and a non-carved region;
a second step of forming, directly onto the top surface of the substrate, a nitride semiconductor film having a light-emitting region,
wherein
the top surface of the substrate has a low defect region with a defect density of 10 6 cm −2 or less,
in the first step, at least one carved region is formed in the top surface of the substrate in the low defect region of the substrate, and the non-carved region is formed in the top surface of the substrate,
in the second step, the nitride semiconductor film is formed in contact with both the carved region and the non-carved region,
in the second step, the light-emitting region in the nitride semiconductor film is formed right above the non-carved region, and
in the second step, the light-emitting region in the nitride semiconductor film is formed in a region located 5 μm or more away from the nearest edge of the carved region in the top surface of the substrate.
3. A method for fabricating a nitride semiconductor laser device, comprising:
a first step of forming a substrate whose top surface is a nitride semiconductor layer and that has a carved region and a high-flatness region;
a second step of forming, directly onto the top surface of the substrate, a nitride semiconductor film having a stripe-shaped laser light waveguide structure and a depressed portion,
wherein
the top surface of the substrate has a low defect region with a defect density of 10 6 cm −2 or less,
in the first step, the carved region is formed by etching in the top surface of the substrate in the low defect region of the substrate,
in the second step, the nitride semiconductor film is formed on the substrate,
in the second step, the depressed portion is formed only in a part of the nitride semiconductor film right above the carved region,
in the second step, the laser light waveguide structure in the nitride semiconductor film is formed right above the high-flatness region, and
in the second step, the laser light waveguide structure in the nitride semiconductor film is formed in a region located 5 μm or more away from the nearest edge of the carved region in the top surface of the substrate.
4. A method for fabricating a nitride semiconductor light-emitting device, comprising:
a first step of forming a substrate whose top surface is a nitride semiconductor layer and that has a carved region and a high-flatness region;
a second step of forming, directly onto the top surface of the substrate, a nitride semiconductor film having a light-emitting region and a depressed portion,
wherein
the top surface of the substrate has a low defect region with a defect density of 10 6 cm −2 or less,
in the first step, the carved region is formed by etching in the top surface of the substrate in the low defect region of the substrate,
in the second step, the nitride semiconductor film is formed on the substrate,
in the second step, the depressed portion is formed only in a part of the nitride semiconductor film right above the carved region,
in the second step, the light-emitting region in the nitride semiconductor film is formed right above the high-flatness region, and
in the second step, the light-emitting region in the nitride semiconductor film is formed in a region located 5 μm or more away from the nearest edge of the carved region in the top surface of the substrate.