Inductive charge balancing

1. A method for charge balancing in a charge storage arrangement having a plurality of charge storage cells connected in series, the method comprising:

providing a first inductive storage element configured to be selectively coupled with the storage arrangement;

providing at least one second inductive storage element configured to be selectively coupled with a first one of the storage cells and inductively coupled to the first inductive storage element;

during a first time period, taking energy from one of the storage arrangement or the first one of the storage cells by coupling an associated inductive storage element with the storage arrangement or the first one of the storage cells, respectively;

during a second time period subsequent to the first time period, feeding back at least a part of the taken energy into the other one of the storage arrangement or the first one of the storage cells by coupling the associated inductive storage element with the other one of the storage arrangement or the first one of the storage cells, respectively;

evaluating at least one of a first voltage and/or a second voltage at least at one time in the first time period to provide a first evaluation result and at least at one time in the second time period to provide a second evaluation result, wherein the first voltage is dependent on the voltage across the first inductive storage element and the second voltage is dependent on the voltage across one of the storage cells; and

detecting a fault in circuitry coupled to the charge storage cells based on the first and the second evaluation result.

2. The method of claim 1 , wherein the first voltage is a voltage across the first inductive storage element.

3. The method of claim 1 , wherein the first voltage corresponds to a difference between a voltage across the storage arrangement and a voltage across the first inductive storage element.

4. The method of claim 1 , wherein the second voltage is a voltage across the first one of the storage cells.

5. The method of claim 1 , wherein evaluating the first voltage comprises comparing the first voltage with at least one reference value to obtain a first comparison signal, wherein a fault is detected when the first comparison signal does not change between the first and the second time.

6. The method of claim 1 , further comprising:

comparing the first voltage with a first reference value to obtain a first comparison signal; and

comparing the second voltage with a second reference value to obtain a second comparison signal,

wherein a fault is detected when at least one of the first and second comparison signals does not change between the first and second times.

7. The method of claim 1 , wherein evaluating the second voltage comprises comparing the second voltage with at least one further reference value to obtain a further comparison signal, wherein a fault is detected, when the further comparison signal does not change between the first and the second time.

8. The method of claim 7 , further comprising:

comparing the second voltage with a third reference value to obtain a third comparison signal; and

comparing the second voltage with a fourth reference value to obtain a fourth comparison signal,

wherein a fault is detected when at least one of the third and fourth comparison signals does not change between the first and second times.

9. The method of claim 1 , wherein evaluating the first and second voltages comprises:

comparing the first voltage with at least one of a first reference voltage and a second reference voltage to obtain at least one of a first comparison signal and a second comparison signal; and

comparing the second voltage with at least one of a third reference voltage and a fourth reference voltage to obtain at least one of a third comparison signal and a fourth comparison signal,

wherein a fault is detected when one of the first and second comparison signals and one of the third and fourth comparison signals do not change between the first and second times.

10. The method of claim 9 , which comprises a sequence of balancing cycles, with each balancing cycle including a first time period and a subsequent second time period, the method further comprising:

evaluating at least one of the first, second, third and fourth comparison signal; and

starting a new balancing cycle dependent on the evaluation result.

11. The method of claim 10 , wherein a new balancing cycle is started after a predetermined edge of the at least one of the comparison signals.

12. The method of claim 11 , wherein a new balancing cycle is started after a predetermined edge of the first and third comparison signals.

13. The method of claim 11 , wherein a new balancing cycle is started after a predetermined edge of the second and fourth comparison signals.

14. A charge balancing circuit, comprising:

a first inductive storage element configured to be selectively coupled with a storage arrangement comprising a plurality of storage cells connected in series;

at least one second inductive storage element configured to be selectively coupled with a first one of the storage cells of the storage arrangement and inductively coupled to the first inductive storage element;

a drive circuit configured

to cause one of the first inductive storage element or the second inductive storage element to be coupled with an associated storage arrangement or first one of the storage cells for a first time period, and

to cause the other one of the first inductive storage element or the second inductive storage element to be coupled with the associated storage arrangement or first one of the storage cells for a second time period subsequent to the first time period; and

an error detection circuit configured

to evaluate at least one of a first voltage and a second voltage at least at one time in the first time period to obtain a first evaluation result and at least at one time in the second time period to obtain a second evaluation result, wherein the first voltage is dependent on a voltage across the first inductive storage element and the second voltage is dependent on a voltage across one of the storage cells, and

to generate an error signal dependent on the first and the second evaluation results, wherein the error signal indicates a fault in circuitry coupled to the storage arrangement.

15. The charge balancing circuit of claim 14 , further comprising:

a first switching element coupled in series with the first inductive storage, controlled by the drive circuit and configured to couple the first inductive storage element to the storage arrangement; and

at least one second switching element coupled in series with the at least one second inductive storage element, controlled by the drive circuit and configured to couple the at least one second inductive storage element to the first storage cell.

16. The charge balancing circuit of claim 14 , wherein the first voltage is the voltage across the first inductive storage element.

17. The charge balancing circuit of claim 14 , wherein the first voltage corresponds to a difference between a voltage across the storage arrangement and the voltage across the first inductive storage element.

18. The charge balancing circuit of claim 14 , wherein the second voltage is the voltage across the one of the storage cells.

19. The charge balancing circuit of claim 14 , wherein the error detection circuit is configured

to compare the first voltage with at least one reference value to obtain a first comparison signal, and

to generate an error indicating signal level of the error signal, when the first comparison signal does not change between the first and the second time.

20. The charge balancing circuit of claim 14 , wherein the error detection circuit is configured

to compare the first voltage with a first reference value to obtain a first comparison signal,

to compare the second voltage with a second reference value to obtain a second comparison signal, and

to generate an error indicating signal level of the error signal when at least one of the first and second comparison signals does not change between the first and second times.

21. The charge balancing circuit of claim 14 , wherein the error detection circuit is configured

to compare the second voltage with at least one further reference value to obtain a further comparison signal, and

to generate an error indicating signal level of the error signal, when the further comparison signal does not change between the first and the second time.

22. The charge balancing circuit of claim 21 , wherein the error detection circuit is configured

to compare the second voltage with a third reference value to obtain a third comparison signal,

to compare the second voltage with a fourth reference value to obtain a fourth comparison signal, and

to generate an error indicating signal level of the error signal, when at least one of the third and fourth comparison signals does not change between the first and second times.

23. The charge balancing circuit of claim 14 , wherein the error detection circuit is configured

to compare the first voltage with at least one of a first and second reference voltage to obtain at least one of a first and second comparison signals,

to compare the second voltage with at least one of a third and fourth reference voltage to obtain at least one of a third and fourth comparison signal, and

to generate an error indicating signal level of the error signal when one of the first and second comparison signals and one of the third and fourth comparison signals do not change between the first and second times.

24. The charge balancing circuit of claim 15 , wherein the fault in the circuitry coupled to the storage arrangement comprises at least one of:

interruptions of a signal line between the drive circuit and the first switching element;

interruptions of a signal line between the drive circuit and the at least one second switching element;

defects in the first switching element;

defects in the at least one second switching element; and

lack of inductive coupling between the first inductive storage element and the at least one second inductive storage element.

25. The method of claim 1 , wherein detecting the fault in circuitry coupled to the charge storage cells comprises detecting at least one of:

interruptions of signal lines between a drive circuit and switches coupled to the at least one second inductive storage element;

defects in the switches coupled to the at least one second inductive storage element; and

lack of inductive coupling between the first inductive storage element and the at least one second inductive storage element.