System and method for use in determining the thickness of a layer of interest in a multi-layer structure
A method for use in determining the thickness of a layer of interest in a multi-layer structure. A first electrode is positioned in contact with a first surface of the multi-layer structure, and a second electrode is positioned in contact with a second surface of the multi-layer structure. The second surface is substantially opposite the first surface. The first electrode is pressed against the multi-layer structure at a predetermined sampling pressure, and the structure is optionally adjusted to a predetermined sampling temperature. The electrical impedance between the first electrode and the second electrode is measured.
1. A system for use in determining a thickness of a layer of interest in a multi-layer structure, said system comprising:
a sample engaging member comprising a first electrode having a first sample contact surface configured to be positioned in contact with a first surface of the multi-layer structure;
a second electrode having a second sample contact surface configured to be positioned in contact with a second surface of the multi-layer structure, wherein the second surface is opposite the first surface;
a pressure control device configured to press said first electrode against the multi-layer structure substantially at a predetermined sampling pressure, wherein the sampling pressure is a pressure at which an electrical impedance of the sample tracks a reference impedance associated with the sample; and
a measurement device electrically coupled to said first electrode and said second electrode, said measurement device configured to measure an electrical impedance between said first electrode and said second electrode.
2. A system according to claim 1 , wherein said measurement device is further configured to determine a thickness of the layer of interest based at least in part on the measured electrical impedance.
3. A system according to claim 2 , wherein said measurement device is further configured to determine a thickness of the layer of interest based further on a predetermined relationship between electrical impedance and the thickness of the layer of interest that corresponds to the multi-layer structure.
4. A system according to claim 1 , further comprising:
a force application device coupled to said sample engaging member and coupled in communication with said pressure control device; and
a load cell coupled in communication with said pressure control device and configured to measure a force applied to the multi-layer structure by said force application device, wherein said pressure control device is configured to press said first electrode against the multi-layer structure at the predetermined sampling pressure based at least in part on the measured force and a contact area between said first sample contact surface and the multi-layer structure.
5. A system according to claim 1 , wherein said sample engaging member further comprises one or more temperature adjustment elements configured to adjust a temperature of the multi-layer structure.
6. A system according to claim 5 , further comprising a temperature control device coupled to said temperature adjustment elements and configured to adjust the temperature of the multi-layer structure to a predetermined sampling temperature through said temperature adjustment elements.
7. A system according to claim 5 , wherein said sample engaging member is a first sample engaging member comprising a plurality of first temperature adjustment elements, said system further comprising a second sample engaging member, said second sample engaging member comprising:
said second electrode; and
a plurality of second temperature adjustment elements.
8. A system according to claim 1 , wherein said measurement device is configured to measure the electrical impedance between said first electrode and said second electrode over a predetermined frequency range.