IP Library Granted Patent US 8,354,873
Granted Patent B2
US 8,354,873 · App. 13/022,338 · Granted Jan 15, 2013

Transmission gate and semiconductor device

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Quick Facts
Patent No.
US 8,354,873
App. No.
13/022,338
Granted
Jan 15, 2013
Kind
B2
Abstract

Provided is a transmission gate capable of adapting to various input voltages to attain high S/N characteristics. The transmission gate includes: a PMOS transistor ( 11 ) which includes a drain to which an input voltage (Vin) is input, is turned ON when a voltage (Vin−Vs 1 ) is input to a gate thereof, and includes a source from which the input voltage (Vin) is output as an output voltage (Vout); and an NMOS transistor ( 12 ) which has a gate length, a gate width, a gate oxide thickness, and an absolute value of a threshold voltage which are the same as those of the PMOS transistor ( 11 ), includes a drain to which the input voltage (Vin) is input, is turned ON when a voltage (Vin+Vs 1 ) is input to a gate thereof, and includes a source from which the input voltage (Vin) is output as the output voltage (Vout).

Claims (19)

1. A transmission gate, comprising:

a PMOS transistor including a gate and a drain that receives an input voltage, and a source that outputs the input voltage;

an NMOS transistor including a gate and a drain that receives the input voltage, and a source that outputs the input voltage;

wherein a gate length, a gate width, a gate oxide thickness, and an absolute value of a threshold voltage are the same for both the PMOS transistor and the NMOS transistor;

a first level shifter for generating a first voltage from the input voltage; and

a second level shifter for generating a second voltage from the input voltage,

wherein the PMOS transistor is turned ON when the first voltage, obtained by subtracting a first predetermined voltage from the input voltage, is input to the gate of the PMOS transistor and the NMOS transistor is turned ON when a second voltage, obtained by adding a second predetermined voltage to the input voltage, is input to the gate of the NMOS transistor,

wherein the first predetermined voltage is the sum of a first level shifter PMOS transistor threshold voltage and an overdrive voltage, and the second predetermined voltage is the sum of a second level shifter NMOS transistor threshold voltage and the overdrive voltage.

2. A transmission gate according to claim 1 , further comprising:

a gate voltage selection circuit for inputting one of the first voltage and the second voltage to the gate of the PMOS transistor, and inputting another of the first voltage and the second voltage to the gate of the NMOS transistor.

3. A semiconductor device, comprising the transmission gate according to claim 1 .

4. A semiconductor device, comprising the transmission gate according to claim 2 .

5. A transmission gate, comprising:

a PMOS transistor including a gate and a drain that receives an input voltage, and a source that outputs the input voltage;

an NMOS transistor including a gate and a drain that receives the input voltage, and a source that outputs the input voltage;

wherein a gate length, a gate width, a gate oxide thickness, and an absolute value of a threshold voltage are the same for both the PMOS transistor and the NMOS transistor, and

wherein the PMOS transistor is turned ON when a first voltage obtained by subtracting a predetermined voltage from the input voltage is input to a gate of the PMOS transistor and the NMOS transistor is turned ON when a second voltage obtained by adding the predetermined voltage to the input voltage is input to a gate of the NMOS transistor; and

a gate voltage selection circuit having a control terminal,

wherein the first and second voltage is output by the gate voltage selection circuit when a high control voltage is input to the control terminal, and the first and second voltage is not output when a low control voltage, less than the high control voltage, is input to the control terminal.

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2011
From: ONO, TAKASHI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 025757/0811 →