IP Library Granted Patent US 8,241,940
Granted Patent B2
US 8,241,940 · App. 13/026,239 · Granted Aug 14, 2012

Double-sided reusable template for fabrication of semiconductor substrates for photovoltaic cell and microelectronics device manufacturing

Assignee: Solexel, Inc.
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Quick Facts
Patent No.
US 8,241,940
App. No.
13/026,239
Granted
Aug 14, 2012
Kind
B2
Abstract

This disclosure presents manufacturing methods and apparatus designs for making TFSSs from both sides of a re-usable semiconductor template, thus effectively increasing the substrate manufacturing throughput and reducing the substrate manufacturing cost. This approach also reduces the amortized starting template cost per manufactured substrate (TFSS) by about a factor of 2 for a given number of template reuse cycles.

Claims (31)

1. A method for making a pair of monocrystalline thin-film silicon substrates, said method comprising:

providing a monocrystalline silicon wafer;

patterning a first surface and a second surface of said monocrystalline silicon wafer with a resist layer having a hexagonal pattern;

etching said monocrystalline silicon wafer, thereby producing a set of structural surface topography features on said first surface and said second surface, said structural surface topography features comprising a plurality of isolated hexagonal posts;

removing said resist layer from said monocrystalline silicon wafer; and

cleaning said first surface and said second surface of said monocrystalline silicon wafer, said monocrystalline silicon wafer comprising a double-sided reusable template;

producing a first porous silicon layer on said first surface and a second porous silicon layer on said second surface of said double-sided reusable template via an anodic etching process, said porous silicon layers having a crystallinity consistent with said double-sided reusable template;

epitaxially depositing a first monocrystalline thin-film silicon substrate on said first porous silicon layer and a second monocrystalline thin-film silicon substrate on said second porous silicon layer, said monocrystalline thin-film silicon substrates having a crystallinity consistent with said porous silicon layers;

separating said first and said second monocrystalline thin-film silicon substrates from said first and said second porous silicon layers.

2. The method of claim 1 , wherein said first porous silicon layer comprises a first porous silicon bilayer having at least two different porosities, and said second porous silicon layer comprises a second porous silicon bilayer having at least two different porosities.

3. The method of claim 1 , wherein said first porous silicon layer comprises a first graded porosity layer, and said second porous silicon layer comprises a second graded porosity layer.

4. The method of claim 1 , wherein said monocrystalline thin-film silicon substrates comprise in-situ doped monocrystalline thin-film silicon substrates.

5. The method of claim 4 , wherein each of said in-situ doped monocrystalline thin-film silicon substrates comprises a front-surface field layer and a base layer for a photovoltaic solar cell.

6. The method of claim 4 , wherein each of said in-situ doped monocrystalline thin-film silicon substrates comprises a front-surface field layer, a base layer, and an emitter layer for a photovoltaic solar cell.

7. The method of claim 1 , further comprising the step of heating said double-sided reusable template in an atmosphere of hydrogen after producing said first and said second porous silicon layers in situ and prior to said epitaxial depositing step.

8. A method for making a pair of monocrystalline thin-film silicon substrates, said method comprising:

providing a monocrystalline silicon wafer;

producing a thermally grown silicon oxide layer on a first surface and a second surface of said monocrystalline silicon wafer;

patterning said first surface and said second surface of said monocrystalline silicon wafer with a resist layer comprising large squares and small squares, said large and small squares being aligned to a <110> direction of said monocrystalline silicon wafer;

transferring said pattern of large squares and small squares to said silicon oxide layer;

anisotropically etching said monocrystalline silicon wafer, thereby producing a set of structural surface topography features on said first surface and said second surface, said structural surface topography features comprising a plurality of square pyramidal cavities;

removing said resist layer from said monocrystalline silicon wafer; and

cleaning said first surface and said second surface of said monocrystalline silicon wafer, said monocrystalline silicon wafer comprising a double-sided reusable template;

producing a first porous silicon layer on said first surface and a second porous silicon layer on said second surface of said double-sided reusable template via an anodic etching process, said porous silicon layers having a crystallinity consistent with said double-sided reusable template;

epitaxially depositing a first monocrystalline thin-film silicon substrate on said first porous silicon layer and a second monocrystalline thin-film silicon substrate on said second porous silicon layer, said monocrystalline thin-film silicon substrates having a crystallinity consistent with said porous silicon layers;

separating said first and said second monocrystalline thin-film silicon substrates from said first and said second porous silicon layers.

9. The method of claim 8 , wherein said first porous silicon layer comprises a first porous silicon bilayer having at least two different porosities, and said second porous silicon layer comprises a second porous silicon bilayer having at least two different porosities.

10. The method of claim 8 , wherein said first porous silicon layer comprises a first graded porosity layer, and said second porous silicon layer comprises a second graded porosity layer.

11. The method of claim 8 , wherein said monocrystalline thin-film silicon substrates comprise in-situ doped monocrystalline thin-film silicon substrates.

12. The method of claim 11 , wherein each of said in-situ doped monocrystalline thin-film silicon substrates comprises a front-surface field layer, a base layer, and an emitter layer.

13. The method of claim 8 , further comprising the step of heating said double-sided reusable template in an atmosphere of hydrogen after producing said first and said second porous silicon layers.

Assignments (10)
NON-RECOURSE ASSIGNMENT OF INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Oct 1, 2024
From: FIRST-CITIZENS BANK & TRUST COMPANY
To: KUMUKAHI HOLDINGS, INC.
Reel/Frame 069083/0367 →
SECURITY INTEREST Recorded Dec 26, 2023
From: TRUTAG TECHNOLOGIES, INC.
To: FIRST-CITIZENS BANK & TRUST COMPANY
Reel/Frame 066140/0667 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2018
From: BEAMREACH-SOLEXEL ASSETS, LLC
To: TRUTAG TECHNOLOGIES, INC.
Reel/Frame 046279/0981 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2018
From: OB REALTY, LLC
To: BEAMREACH-SOLEXEL ASSETS LLC
Reel/Frame 046493/0343 →
ASSIGNMENT OF LOAN DOCUMENTS Recorded Sep 29, 2017
From: OPUS BANK
To: OB REALTY, LLC
Reel/Frame 044062/0383 →
CHANGE OF NAME Recorded Jul 28, 2017
From: SOLEXEL, INC.
To: BEAMREACH SOLAR, INC.
Reel/Frame 043367/0649 →
RECORDATION OF FORECLOSURE OF PATENT PROPERTIES Recorded Jul 27, 2017
From: OB REALTY, LLC
To: OB REALTY, LLC
Reel/Frame 043350/0822 →
CHANGE OF NAME Recorded Jul 26, 2017
From: SOLEXEL, INC.
To: BEAMREACH SOLAR, INC.
Reel/Frame 043342/0439 →
SECURITY INTEREST Recorded Jan 7, 2015
From: SOLEXEL, INC.
To: OPUS BANK
Reel/Frame 034731/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2012
From: MOSLEHI, MEHRDAD M.; KRAMER, KARL-JOSEF; WANG, DAVID XUAN-QI; KAPUR, PAWAN; NAG, SOMNATH; KAMIAN, GEORGE D; ASHJAEE, JAY; YONEHARA, TAKAO
To: SOLEXEL, INC.
Reel/Frame 028189/0772 →
Continuity (2)
Provisional Application 61304340 · Feb 12, 2010
Related Publication 20110256654A1 · Oct 20, 2011