X-ray CT apparatus and control method for X-ray CT apparatus
An X-ray CT apparatus has an X-ray source, an X-ray detector, a temperature sensor, a data acquisition unit and a controller. The X-ray source generates an X-ray. The X-ray detector detects the X-ray. The temperature sensor detects a temperature of the X-ray detector. The data acquisition unit acquires data from the X-ray detector. The controller controls a temperature of the X-ray detector through adjustment of a workload of the data acquisition unit during a non-scanning time.
1. An X-ray CT apparatus, comprising:
an X-ray source configured to generate an X-ray;
an X-ray detector configured to detect the X-ray;
a temperature sensor configured to detect a temperature of the X-ray detector;
a data acquisition unit configured to acquire data from the X-ray detector; and
a controller configured to control a temperature of the X-ray detector through adjustment of a workload of the data acquisition unit during a non-scanning time.
2. The X-ray CT apparatus according to claim 1 , further comprising:
a cooling fan, wherein
the controller controls the temperature of the X-ray detector through adjustment of an amount of air of the cooling fan during a scanning time.
3. The X-ray CT apparatus according to claim 1 , wherein
the controller sets a target value of a temperature of the X-ray detector, and controls the temperature of the X-ray detector such that the temperature of the X-ray detector is equal to the target value, during the non-scanning time.
4. The X-ray CT apparatus according to claim 1 , wherein
the controller controls a temperature of the X-ray detector through adjustment of power consumption of the data acquisition unit by varying an acquisition operation of the data acquisition unit between from 0 to a maximum, during the non-scanning time.
5. The X-ray CT apparatus according to claim 1 , wherein
the X-ray detector comprises a photodiode, and the temperature sensor is provided in the photodiode.
6. The X-ray CT apparatus according to claim 1 , wherein
the X-ray detector and the data acquisition unit are configured to be a unitary structure.
7. The X-ray CT apparatus according to claim 1 , further comprising:
a heater configured to heat the X-ray detector, wherein
the controller controls the temperature of the X-ray detector through adjustment of a workload of the data acquisition unit and a capacity of the heater during the non-scanning time.
8. The X-ray CT apparatus according to claim 7 , wherein
the controller obtains a combination corresponding to a temperature detected by the temperature sensor based on a table which correlates the temperature of the X-ray detector with the combination of the workload of the data acquisition unit and the capacity of the heater, and adjusts the workload of the data acquisition unit and the capacity of the heater according to the obtained combination.
9. The X-ray CT apparatus according to claim 7 , wherein
the X-ray detector comprises a plurality of photodiodes which are arranged into a one-dimensional array or a two-dimensional array, and
a plurality of the heaters are provided in a plane direction of the plurality of photodiodes.
10. The X-ray CT apparatus according to claim 9 , wherein
a plurality of the temperature sensors are provided in the plane direction of the plurality of photodiodes, and
the controller adjusts the workload of the data acquisition unit for every chip making up the data acquisition unit and adjusts the capacity of the plurality of heaters for every heater of the plurality of heaters, according to a temperature distribution of the X-ray detector based on a plurality of temperatures detected by the plurality of temperature sensors.
11. The X-ray CT apparatus according to claim 7 , wherein
the heater is provided within the X-ray detector, and
the X-ray detector and the data acquisition unit are configured to be a unitary structure.
12. A control method for an X-ray CT apparatus which has: an X-ray source configured to generate an X-ray; an X-ray detector configured to detect the X-ray; a temperature sensor configured to detect a temperature of the X-ray detector; and a data acquisition unit configured to acquire data from the X-ray detector, comprising:
a controlling step that controls a temperature of the X-ray detector through adjustment of a workload of the data acquisition unit during a non-scanning time.
13. The control method according to claim 12 , wherein
the control step obtains a combination corresponding to a temperature detected by the temperature sensor based on a table which correlates the temperature of the X-ray detector with the combination of the workload of the data acquisition unit and the capacity of the heater, and adjusts the workload of the data acquisition unit and the capacity of the heater according to the obtained combination.