Achieving focus in a digital pathology system
View Patent ↗Methods and apparatus are provided for computing focus information prior to scanning digital microscope slide data with a line scan camera. The methods include a point-focus procedure that works by moving the slide to the desired measurement location, moving the objective lens through a predefined set of height values, acquiring imagery data at each height, and determining the height of maximum contrast. The methods also include a ribbon-focus procedure whereby imagery data are acquired continuously, while the slide and objective lens are in motion. Both methods may be applied with either a static or a dynamic implementation.
1. A computer implemented method for achieving focus in a digital pathology system having an objective lens coupled to a line scan camera and a stage for supporting a microscope slide, where one or more processors of the digital pathology system are programmed to perform steps comprising:
identifying a plurality of focus points on a microscope slide;
positioning an objective lens coupled with a line scan camera over a first focus point;
scanning an image of the first focus point in at least three separate series, wherein each series comprises at least ten different objective lens heights having a distance between each objective lens height and wherein said distance between each objective lens height decreases for each successive series; and
determining the objective lens height having the greatest contrast in the scanned image.
2. The method of claim 1 , wherein determining the objective lens height having the greatest contrast in the scanned image comprises selecting the objective lens height having the greatest contrast in the scanned image from the last series.
3. The method of claim 1 , wherein the distance between objective lens heights in the at least three separate series is measured in microns.
4. The method of claim 1 , wherein the distance between objective lens heights in a first series of the at least three separate series is between 3 and 7 microns.
5. The method of claim 1 , wherein the distance between objective lens heights in a second of the at least three separate series is between 0.5 and 2.9 microns.
6. The method of claim 1 , wherein the distance between objective lens heights in a third of the at least three separate series is between 0.1 and 0.4 microns.
7. A system for creating a digital image of a specimen on a microscope slide, comprising:
a stage configured to support a microscope slide having a specimen;
an objective lens;
a motion control system configured to move the stage and adjust the height of the objective lens relative to the stage while the stage is in motion;
a line scan camera coupled with the objective lens, wherein the line scan camera is configured to scan an image of an area of the specimen while the stage is moving;
a processor configured to determine a plurality of focus points in a scan area of the microscope slide and scan images of each focus point in at least three separate series, wherein each series comprises at least ten different objective lens heights having a distance between each objective lens height and wherein said distance between each objective lens height decreases for each successive series and wherein the processor is configured to determine the objective lens height having the greatest contrast in the scanned image.
8. The system of claim 7 , wherein the objective lens height having the greatest contrast in the scanned image is from the last series.
9. The system of claim 7 , wherein the distance between objective lens heights in the at least three separate series is measured in microns.
10. The system of claim 7 , wherein the distance between objective lens heights in a first series of the at least three separate series is between 3 and 7 microns.
11. The system of claim 7 , wherein the distance between objective lens heights in a second of the at least three separate series is between 0.5 and 2.9 microns.
12. The system of claim 7 , wherein the distance between objective lens heights in a third of the at least three separate series is between 0.1 and 0.4 microns.