Isolation of ions in overloaded RF ion traps
View Patent ↗In an RF quadrupole ion trap having electrodes to which RF voltages are applied, ions having m/z ratios outside of a predefined narrow range of charge-related masses m/z are removed from the trap by applying a DC voltage pulse to at least one of the trap electrodes to remove from the trap the ions with high values of charge-related masses. The DC voltage pulse is preferably applied in combination with a variation of the RF voltage amplitudes to simultaneously remove from the trap ions of low charge-related masses. The DC and RF voltage amplitudes are changed in such a manner that any excitation of ions having charge-related masses within the predefined range by frequency mixtures is avoided.
1. A method for removing ions having m/z ratios outside of an isolation window in an isolation process conducted in an RF ion trap having a plurality of electrodes, comprising:
(a) filling the trap with ions;
(b) applying an RF voltage having an amplitude to some of the plurality of trap electrodes; and
(c) applying a DC voltage pulse of one to five milliseconds duration to one of the plurality of trap electrodes, without applying any additional excitation frequency voltages in order to generate an asymmetric electric DC force field inside the RF ion trap.
2. The method of claim 1 , wherein during step (c), the RF voltage amplitude applied in step (b) is increased in order to shift a lower storage cut-off mass (m/z) cut-off up to the lower m/z edge of the isolation window.
3. The method of claim 2 , whereby voltage changes in the DC voltage pulse applied in step (c) and the RF voltage amplitude increase occur smoothly over time without rapid changes to avoid undesired excitation of the ions having m/z ratios within the isolation window.
4. The method of claim 2 , wherein the RF and DC voltage amplitudes are changed in the order:
(1) the RF amplitude is increased, then
(2) the DC voltage is increased, then
(3) the RF amplitude is decreased so that the DC mass limit (m/z) DC-limit is shifted near to the isolation window, and finally
(4) the DC voltage is decreased.
5. The method of claim 4 wherein steps (a)-(c) are repeated a plurality of times in order to collect a large number of desired ions.
6. The method of claim 1 , further comprising, after step (c), using a conventional isolation process with resonant removal of residual ions having m/z ratios outside of the isolation window to finish the isolation process.
7. The method of claim 6 , wherein steps (a)-(c) are repeated a plurality of times without ejection of ions having m/z ratios within the isolation window, to collect a large number of ions having m/z ratios within the isolation window.