HIGH-EFFICIENCY PHOTOVOLTAIC BACK-CONTACT SOLAR CELL STRUCTURES AND MANUFACTURING METHODS USING THREE-DIMENSIONAL SEMICONDUCTOR ABSORBERS
Back contact back junction three dimensional solar cell and methods for manufacturing are provided. The back contact back contact back junction three dimensional solar cell comprises a three-dimensional substrate. The substrate comprises a light capturing frontside surface with a passivation layer, a doped base region, and a doped backside emitter region with a polarity opposite the doped base region. A backside passivation layer is positioned on the doped backside emitter region. Backside emitter contacts and backside base contacts connected to metal interconnects and selectively formed on three-dimensional features of the backside of three-dimensional solar cell.
1 . A back contact back junction three-dimensional thin solar cell, comprising:
a three-dimensional deposited semiconductor layer having a frontside and a backside, comprising:
a light capturing frontside surface with a passivation layer,
a doped base region, and
a doped backside emitter region with a polarity opposite said doped base region;
a backside passivation layer on said doped backside emitter region;
backside emitter contacts and backside base contacts connected to metal interconnects and selectively formed on three-dimensional features of the backside of said three-dimensional deposited semiconductor layer; and
a transparent frontside permanent support reinforcement on the frontside of said back contact back junction three-dimensional thin solar cell.
2 . The back contact back junction three-dimensional thin solar cell of claim 1 , wherein said deposited semiconductor layer is an epitaxial silicon layer with a thickness in the range of 1 to 30 microns.
3 . The back contact back junction three-dimensional thin solar cell of claim 1 , wherein said doped backside emitter region is an epitaxial in-situ doped emitter region.
4 . The back contact back junction three-dimensional thin solar cell of claim 1 , wherein said backside emitter contacts and backside base contacts are discretely positioned on three-dimensional features of the backside of said three-dimensional deposited semiconductor layer.
5 . The back contact back junction three-dimensional thin solar cell of claim 1 , wherein said backside emitter contacts and backside base contacts are formed in a continuous interdigitated pattern on three-dimensional features of the backside of said three-dimensional deposited semiconductor layer.
7 . The back contact back junction three-dimensional thin solar cell of claim 1 , wherein said light capturing frontside surface with a passivation layer serves as an anti-reflection coating.
8 . The back contact back junction three-dimensional thin solar cell of claim 1 , wherein said light capturing frontside surface with a passivation layer provides field assisted passivation.
9 . The back contact back junction three-dimensional thin solar cell of claim 1 , further comprising a backside reinforcement layer filling cavities of the three-dimensional features on the backside of said three-dimensional thin deposited semiconductor layer.
10 . A back contact back junction three-dimensional thin solar cell, comprising:
a three-dimensional deposited semiconductor layer having a frontside and a backside, said deposited semiconductor layer having an inverted pyramidal structure wherein backside surface ridges define the openings of inverted pyramidal cavities, comprising:
a light capturing frontside surface with a passivation layer,
a doped base region, and
a doped backside emitter region with a polarity opposite said doped base region;
a backside passivation layer on said doped backside emitter region; and
backside emitter contacts and backside base contacts selectively formed on the backside surface ridges of said three-dimensional deposited semiconductor layer and connected to metal interconnects.
11 . The back contact back junction three-dimensional thin solar cell of claim 10 , a transparent permanent frontside support reinforcement on the frontside of said back contact back junction three-dimensional thin solar cell.
12 . The back contact back junction three-dimensional thin solar cell of claim 10 , wherein said deposited semiconductor layer is an epitaxial silicon layer with a thickness in the range of 1 to 30 microns.
13 . The back contact back junction three-dimensional thin solar cell of claim 10 , wherein said doped backside emitter region is an epitaxial in-situ doped emitter region.
14 . The back contact back junction three-dimensional thin solar cell of claim 10 , wherein said inverted pyramidal cavities comprise a plurality of differently sized inverted pyramidal cavities.
15 . The back contact back junction three-dimensional thin solar cell of claim 10 , wherein said inverted pyramidal cavities comprise a set of larger inverted pyramidal cavities and a set of smaller inverted pyramidal cavities.
16 . The back contact back junction three-dimensional thin solar cell of claim 10 , wherein said backside emitter contacts and backside base contacts are discretely positioned on the backside surface ridges of the inverted pyramidal cavities on the backside of said three-dimensional thin deposited semiconductor layer.
17 . The back contact back junction three-dimensional thin solar cell of claim 10 , wherein said backside emitter contacts and backside base contacts are formed on the ridges of the inverted pyramidal cavities on the backside of said three-dimensional thin deposited semiconductor layer in a continuous line pattern.
18 . The back contact back junction three-dimensional thin solar cell of claim 10 , further comprising a backside reinforcement layer at least partially filling cavities of the inverted pyramidal cavities on the backside of said three-dimensional thin deposited semiconductor layer.
19 . A method for the manufacture of a three-dimensional back contact back junction thin solar cell from a crystalline semiconductor layer, the method providing continuous structural support to said crystalline semiconductor layer, the method comprising:
forming a conformal porous semiconductor layer on a three-dimensional template, said three-dimensional template having an inverted pyramidal structure with backside surface ridges defining openings of inverted pyramidal cavities, wherein said template provides structural support and acts as a high temperature temporary carrier for back contact back junction solar cell backside processing steps, said backside processing steps comprising:
depositing a conformal doped base crystalline semiconductor layer on said porous semiconductor layer;
forming a conformal doped emitter layer on said doped base crystalline semiconductor layer;
separating said doped base crystalline semiconductor layer from said template along said porous semiconductor layer, wherein a cell backside reinforcement layer is attached to said solar cell backside prior to release to provide support for cell frontside processing steps, said frontside processing step comprising forming a light capturing frontside surface with a passivation and anti-reflection layer on the frontside of said crystalline semiconductor layer;
attaching a transparent permanent frontside reinforcement support to the cell frontside;
depositing a backside passivation dielectric layer on said doped emitter layer;
forming selective backside base and emitter contact openings through said dielectric layer on the ridges of said inverted pyramidal cavities;
doping exposed regions to form emitter regions and base regions; and
metalizing the cell backside to form backside base and emitter contacts on the ridges of said inverted pyramidal cavities.
20 . The method of claim 19 , wherein said cell backside reinforcement layer serves as a backside diffuse mirror for said three-dimensional back contact back junction thin solar cell.
21 . The method of claim 19 , wherein the step of depositing a doped base crystalline semiconductor layer comprises depositing a doped base epitaxial silicon layer with a thickness in the range of 1 to 30 microns.
22 . The method of claim 19 , wherein the step of forming a doped emitter layer on said doped base crystalline semiconductor layer comprises forming an in-situ doped emitter epitaxial layer.
23 . The method of claim 19 , wherein pulsed duration laser ablation is used to form selective backside base and emitter contact openings through said dielectric layer on the ridges of said inverted pyramidal cavities.
24 . The method of claim 19 , wherein sub-nanosecond pulsed duration laser ablation is used to form selective backside base and emitter contact openings through said dielectric layer on the ridges of said inverted pyramidal cavities.