IP Library Granted Patent US 8,748,790
Granted Patent B2
US 8,748,790 · App. 13/069,831 · Granted Jun 10, 2014

Proximity sensor using photosensor

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Quick Facts
Patent No.
US 8,748,790
App. No.
13/069,831
Granted
Jun 10, 2014
Kind
B2
Abstract

Provided is a proximity sensor using a photosensor, which is easy to use and reduced in power consumption. In the proximity sensor, a first photosensor is used to detect a change in amount of ambient light entering the first photosensor, which is caused when a finger is coming close thereto, and a detection signal is output based on a result of the detection. The photosensor includes, for example, one or a plurality of PN junction elements connected in parallel.

Claims (75)

1. A proximity sensor using a photosensor, the proximity sensor comprising:

a first photosensor including a first PN junction element; and

a second photosensor including a second PN junction element

wherein the first PN junction element and the second PN junction element flow different amounts of current depending on an amount of incident light, and wherein an anode of the second PN junction element is connected to a cathode of the first PN junction element and one of the first or second photosensors is located at a position for detecting an object and the other thereof is located at a different position where the object is not detected, and

a connection point between the first and second photosensors comprises an output terminal of the proximity sensor.

2. A proximity sensor according to claim 1 ,

wherein the first photosensor includes a plurality of PN junction elements and each include a cathode connected to the output terminal and an anode connected to a ground terminal, and

wherein the second PN junction element of the second photosensor includes a cathode connected to a power supply terminal and the anode is connected to the output terminal.

3. A proximity sensor comprising:

a first photosensor for detecting a target;

a second photosensor in an area in which the target is not detected, for detecting ambient light,

wherein the first photosensor comprises a plurality of PN junction elements connected in parallel and each of the plurality of PN junction elements are connected to an output terminal, and the second photosensor comprises at least one PN junction element connected to the output terminal; and

a level shift circuit,

wherein the plurality of PN junction elements of the first photosensor each include a cathode connected to an input terminal of the level shift circuit and an anode connected to a ground terminal, and

wherein the at least one PN junction element of the second photosensor includes a cathode connected to the ground terminal and an anode connected to the input terminal of the level shift circuit.

4. A proximity sensor according to claim 3 , wherein the level shift circuit comprises:

a second constant current circuit for discharging a second node;

a depletion type N-channel MOS transistor including a gate to which a voltage of the ground terminal is input and a source to which a voltage of the second node is input, for discharging a first node with an ON-state current of the depletion type N-channel MOS transistor;

a first P-channel MOS transistor including a gate to which a voltage of the first node is input, for charging an output terminal via a third constant current circuit with an ON-state current of the first P-channel MOS transistor;

an N-channel MOS transistor including a gate to which the voltage of the second node is input, for discharging the output terminal with an ON-state current of the N-channel MOS transistor; and

a second P-channel MOS transistor including a gate to which a voltage of the output terminal is input, for charging the first node with an ON-state current of the second P-channel MOS transistor.

5. A proximity sensor according to claim 3 , wherein the level shift circuit comprises:

a constant current circuit has an inflow terminal connected to the input terminal and an outflow terminal connected to a reference power supply;

an N-channel MOS transistor including a gate connected to the input terminal and a drain connected to an output terminal;

a P-channel MOS transistor including a gate connected to the input terminal, a drain connected to the output terminal, and a source connected to a node; and

a depletion type N-channel MOS transistor including a gate connected to the output terminal, a drain connected to a power supply, and a source connected to the node.

6. A proximity sensor comprising:

a first photosensor for detecting a target; and

a second photosensor in an area in which the target is not detected, for detecting ambient light,

wherein the first photosensor comprises a plurality of PN junction elements connected in parallel and each of the plurality of PN junction elements are connected to an output terminal, and the second photosensor comprises at least one PN junction element connected to the output terminal;

a first N-channel MOS transistor including a source connected to a ground terminal; and

a second N-channel MOS transistor including a source connected to the ground terminal and a gate connected to a gate of the first N-channel MOS transistor,

wherein the plurality of PN junction elements of the first photosensor each include an anode connected to the gate and a drain of the first N-channel MOS transistor, and a cathode connected to a power supply terminal, and

wherein the at least one PN junction element of the second photosensor includes an anode connected to the output terminal and a drain of the second N-channel MOS transistor, and a cathode connected to the power supply terminal.

7. A proximity sensor comprising:

a first photosensor for detecting a target;

a second photosensor in an area in which the target is not detected, for detecting ambient light,

wherein the first photosensor comprises a plurality of PN junction elements connected in parallel and each of the plurality of PN junction elements are connected to an output terminal, and the second photosensor comprises at least one PN junction element connected to the output terminal; and

a level shift circuit;

a first N-channel MOS transistor including a source connected to a ground terminal; and

a second N-channel MOS transistor including a source connected to the ground terminal and a gate connected to a gate of the first N-channel MOS transistor,

wherein the plurality of PN junction elements of the first photosensor each include a cathode connected to the ground terminal and an anode connected to the gate and a drain of the first N-channel MOS transistor, and

wherein the at least one PN junction element of the second photosensor includes a cathode connected to the ground terminal and an anode connected to an input terminal of the level shift circuit and a drain of the second N-channel MOS transistor.

8. A proximity sensor according to claim 7 , wherein the level shift circuit comprises:

a second constant current circuit for discharging a second node;

a depletion type N-channel MOS transistor including a gate to which a voltage of the ground terminal is input and a source to which a voltage of the second node is input, for discharging a first node with an ON-state current of the depletion type N-channel MOS transistor;

a first P-channel MOS transistor including a gate to which a voltage of the first node is input, for charging an output terminal via a third constant current circuit with an ON-state current of the first P-channel MOS transistor;

an N-channel MOS transistor including a gate to which the voltage of the second node is input, for discharging the output terminal with an ON-state current of the N-channel MOS transistor; and

a second P-channel MOS transistor including a gate to which a voltage of the output terminal is input, for charging the first node via a first constant circuit with an ON-state current of the second P-channel MOS transistor.

9. A proximity sensor according to claim 7 , wherein the level shift circuit comprises:

a constant current circuit having an inflow terminal connected to the input terminal and an outflow terminal connected to a reference power supply;

an N-channel MOS transistor including a gate connected to the input terminal and a drain connected to an output terminal;

a P-channel MOS transistor including a gate connected to the input terminal, a drain connected to the output terminal, and a source connected to a node; and

a depletion type N-channel MOS transistor including a gate connected to the output terminal, a drain connected to a power supply, and a source connected to the node.

10. A proximity sensor using a photosensor, comprising:

a photosensor for detecting a target;

a level shift circuit including an input terminal connected to the photosensor; and

a current mirror circuit connected to the input terminal of the level shift circuit,

wherein the current mirror circuit comprises:

a first N-channel MOS transistor including a gate and a drain that are connected to the input terminal of the level shift circuit, and a source connected to a ground terminal;

a second N-channel MOS transistor including a drain connected to the input terminal of the level shift circuit and a source connected to the ground terminal; and

a delay circuit connected to a gate of the first N-channel MOS transistor and a gate of the second N-channel MOS transistor.

11. A proximity sensor according to claim 10 , wherein the photosensor comprises one or a plurality of PN junction elements connected in parallel, each of which includes an anode connected to the input terminal of the level shift circuit and a cathode connected to a power supply terminal.

12. A proximity sensor according to claim 10 , wherein the photosensor comprises one or a plurality of PN junction elements connected in parallel, each of which includes an anode connected to the input terminal of the level shift circuit and a cathode connected to a ground terminal.

13. A proximity sensor according to claim 10 , wherein the level shift circuit comprises:

a second constant current circuit for discharging a second node;

a depletion type N-channel MOS transistor including a gate to which a voltage of the ground terminal is input and a source to which a voltage of the second node is input, for discharging a first node with an ON-state current of the depletion type N-channel MOS transistor;

a first P-channel MOS transistor including a gate to which a voltage of the first node is input, for charging an output terminal via a third constant current circuit with an ON-state current of the first P-channel MOS transistor;

an N-channel MOS transistor including a gate to which the voltage of the second node is input, for discharging the output terminal with an ON-state current of the N-channel MOS transistor; and

a second P-channel MOS transistor including a gate to which a voltage of the output terminal is input, for charging the first node with an ON-state current of the second P-channel MOS transistor.

14. A proximity sensor according to claim 10 , wherein the level shift circuit comprises:

a constant current circuit having an inflow terminal connected to the input terminal and an outflow terminal connected to a reference power supply;

an N-channel MOS transistor including a gate connected to the input terminal and a drain connected to an output terminal;

a P-channel MOS transistor including a gate connected to the input terminal, a drain connected to the output terminal, and a source connected to a node; and

a depletion type N-channel MOS transistor including a gate connected to the output terminal, a drain connected to a power supply, and a source connected to the node.

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2011
From: UTSUNOMIYA, FUMIYASU; YAMASAKI, TARO; FUJII, ISAMU
To: SEIKO INSTRUMENTS INC.
Reel/Frame 026007/0071 →