Fringe projection system with intensity modulating by columns of a plurality of grating elements

1. A probe comprising:

an insertion tube;

a plurality of light emitters disposed in parallel on the distal end of the insertion tube, wherein the plurality of light emitters are spaced apart along an axis perpendicular to the light emitters;

at least one intensity modulating element comprising a plurality of columns of a plurality of grating elements having a grating period, wherein the plurality of columns of the plurality of grating elements are parallel to the plurality of light emitters, and wherein the light from the plurality of light emitters is passed through the at least one intensity modulating element to project a plurality of fringe sets onto a surface, each of the plurality of fringe sets comprising a structured-light pattern projected when one emitter group of at least one of the plurality of light emitters is emitting;

an imager for obtaining at least one image of the surface; a processing unit that is configured to perform phase-shift analysis on the at least one image;

an inspection light delivery system which delivers light from an inspection light source to the surface;

wherein the inspection light delivery system outputs light from the distal end of the insertion tube during inspection mode;

wherein the intensity of light output from the inspection light delivery system is automatically decreased during measurement mode; and

wherein the probe operates in measurement mode when at least one of the plurality of fringe sets is projected onto the surface.

2. The probe of claim 1 , wherein the plurality of grating elements comprise:

a first continuous sinusoidal pattern extending perpendicular to the plurality of light emitters forming the top side of each of the plurality of grating elements;

a second continuous sinusoidal pattern extending perpendicular to the plurality of light emitters forming the bottom side of each of the plurality of grating elements, wherein the second continuous sinusoidal pattern opposes and is the minor image of the first continuous sinusoidal pattern; and

wherein the plurality of grating elements form a plurality of rows of grating elements extending for several grating periods of the first continuous sinusoidal pattern perpendicular to the plurality of light emitters.

3. The probe of claim 1 , wherein each of the plurality of grating elements comprise:

a first intermittent sinusoidal pattern extending perpendicular to the plurality of light emitters forming the top side of each of the plurality of grating elements;

a second intermittent sinusoidal pattern extending perpendicular to the plurality of light emitters forming the bottom side of each of the plurality of grating elements, wherein the second intermittent sinusoidal pattern opposes and is the mirror image of the first intermittent sinusoidal pattern;

a left side and a right side truncating the first intermittent sinusoidal pattern and the second intermittent sinusoidal pattern for each of the plurality of grating elements;

wherein the plurality of grating elements in the plurality of columns are connected by a web extending from the top side of one grating element to the bottom side of an adjacent grating element; and

wherein the plurality of grating elements form a plurality of rows of grating elements extending for several grating periods of the first intermittent sinusoidal pattern perpendicular to the plurality of light emitters forming a gap between the left side of one grating element and the right side of an adjacent grating element in the row.

4. The probe of claim 1 , wherein the plurality of grating elements comprise:

a first continuous triangle pattern extending perpendicular to the plurality of light emitters forming the top side of each of the plurality of grating elements;

a second continuous triangle pattern extending perpendicular to the plurality of light emitters forming the bottom side of each of the plurality of grating elements, wherein the second continuous triangle pattern opposes and is the mirror image of the first continuous triangle pattern; and

wherein the plurality of grating elements form a plurality of rows of grating elements extending for several grating periods of the first continuous triangle pattern perpendicular to the plurality of light emitters.

5. The probe of claim 1 , wherein each of the plurality of grating elements comprise:

a first intermittent triangle pattern extending perpendicular to the plurality of light emitters forming the top side of each of the plurality of grating elements;

a second intermittent triangle pattern extending perpendicular to the plurality of light emitters forming the bottom side of each of the plurality of grating elements, wherein the second intermittent triangle pattern opposes and is the minor image of the first intermittent triangle pattern;

a left side and a right side truncating the first intermittent triangle pattern and the second intermittent triangle pattern for each of the plurality of grating elements;

wherein the plurality of grating elements in the plurality of columns are connected by a web extending from the top side of one grating element to the bottom side of an adjacent grating element; and

wherein the plurality of grating elements form a plurality of rows of grating elements extending for several grating periods of the first intermittent triangle pattern perpendicular to the plurality of light emitters forming a gap between the left side of one grating element and the right side of an adjacent grating element in the row.

6. The probe of claim 1 , wherein the structured-light pattern comprises parallel light and dark lines and wherein the parallel light and dark lines comprise sinusoidal intensity profiles.

7. The probe of claim 1 , wherein the probe operates in measurement mode when at least one of the plurality of fringe sets is projected onto the surface.

8. The probe of claim 1 , wherein the plurality of light emitters are positioned such that the structured-light pattern of one fringe set exhibits a phase-shift relative to the structured-light patterns of other fringe sets.

9. The probe of claim 1 , wherein each of the plurality of light emitters comprises a string of at least two light emitting diodes.

10. The probe of claim 1 , further comprising: a detachable distal tip comprising the at least one intensity-modulating element, wherein the plurality of light emitters are fixedly attached to the insertion tube.

11. An intensity modulating element for a probe having a plurality of light emitters disposed in parallel on the distal end of an insertion tube and spaced apart along an axis perpendicular to the light emitters, the intensity modulating element comprising:

a plurality of columns of a plurality of grating elements having a grating period, wherein the plurality of columns of the plurality of grating elements are parallel to the plurality of light emitters;

a first continuous sinusoidal pattern extending perpendicular to the plurality of light emitters forming the top side of each of the plurality of grating elements;

a second continuous sinusoidal pattern extending perpendicular to the plurality of light emitters forming the bottom side of each of the plurality of grating elements, wherein the second continuous sinusoidal pattern opposes and is the mirror image of the first continuous sinusoidal pattern; and

wherein the plurality of grating elements form a plurality of rows of grating elements extending for several grating periods of the first continuous sinusoidal pattern perpendicular to the plurality of light emitters.

12. The intensity modulating element of claim 11 , wherein the length of the grating period is at least two times greater than the width of the plurality of light emitters.

13. The intensity modulating element of claim 11 , wherein the amplitude of the first continuous sinusoidal pattern is at least five times less than the length of the plurality of light emitters.

14. The intensity modulating element of claim 11 , wherein a substrate of the intensity modulating element is made of sapphire.

15. The intensity modulating element of claim 11 , wherein the plurality of grating elements are formed using a coating that is highly absorptive of the wavelengths emitted by the light emitters.

16. An intensity modulating element for a probe having a plurality of light emitters disposed in parallel on the distal end of an insertion tube and spaced apart along an axis perpendicular to the light emitters, the intensity modulating element comprising:

a plurality of columns of a plurality of grating elements having a grating period, wherein the plurality of columns of the plurality of grating elements are parallel to the plurality of light emitters;

a first intermittent sinusoidal pattern extending perpendicular to the plurality of light emitters forming the top side of each of the plurality of grating elements;

a second intermittent sinusoidal pattern extending perpendicular to the plurality of light emitters forming the bottom side of each of the plurality of grating elements, wherein the second intermittent sinusoidal pattern opposes and is the mirror image of the first intermittent sinusoidal pattern;

a left side and a right side truncating the first intermittent sinusoidal pattern and the second sinusoidal pattern for each of the plurality of grating elements;

wherein the plurality of grating elements in the plurality of columns are connected by a web extending from the top side of one grating element to the bottom side of an adjacent grating element; and

wherein the plurality of grating elements form a plurality of rows of grating elements extending for several grating periods of the first intermittent sinusoidal pattern perpendicular to the plurality of light emitters forming a gap between the left side of one grating element and the right side of an adjacent grating element in the row.

17. The intensity modulating element of claim 16 , wherein the length of the grating period is at least two times greater than the width of the plurality of light emitters.

18. The intensity modulating element of claim 16 , wherein the amplitude of the first intermittent sinusoidal pattern is at least five times less than the length of the plurality of light emitters.

19. The intensity modulating element of claim 16 , wherein the substrate of the intensity modulating element is made of sapphire.

20. The intensity modulating element of claim 16 , wherein the plurality of grating elements are formed using a coating that is highly absorptive of the wavelengths emitted by the light emitters.