Nitride semiconductor
View Patent ↗To provide a high-quality nitride semiconductor ensuring high emission efficiency of a light-emitting element fabricated. In the present invention, when obtaining a nitride semiconductor by sequentially stacking a one conductivity type nitride semiconductor part, a quantum well active layer structure part, and a another conductivity type nitride semiconductor part opposite the one conductivity type, the crystal is grown on a base having a nonpolar principal nitride surface, the one conductivity type nitride semiconductor part is formed by sequentially stacking a first nitride semiconductor layer and a second nitride semiconductor layer, and the second nitride semiconductor layer has a thickness of 400 nm to 20 μm and has a nonpolar outermost surface. By virtue of selecting the above-described base for crystal growth, an electron and a hole, which are contributing to light emission, can be prevented from spatial separation based on the QCSE effect and efficient radiation is realized. Also, by setting the thickness of the second nitride semiconductor layer to an appropriate range, the nitride semiconductor surface can avoid having extremely severe unevenness.
1. A nitride semiconductor comprising: a one conductivity type nitride semiconductor part; a quantum well active layer structure part; and a another conductivity type nitride semiconductor part opposite to said one conductivity type, which are stacked in this order on a nitride principal surface of a base having nonpolar nitride at least on one of principal surface,
wherein said one conductivity type nitride semiconductor part comprises a first nitride semiconductor layer and a second nitride semiconductor layer, which are stacked in this order,
said second nitride semiconductor layer has a thickness of 400 nm to 20 μm and has a substantially nonpolar outermost surface,
wherein an emissive recombination lifetime (τ(R)) of said quantum well active layer structure part as determined by time-resolved PL measurement at room temperature under low excitation density condition is shorter than a non-emissive recombination lifetime (τ(NR)).
2. The nitride semiconductor as claimed in claim 1 , wherein said first nitride semiconductor layer and said second nitride semiconductor layer differ from each other in composition.
3. The nitride semiconductor as claimed in claim 1 , wherein said base is a self-supporting substrate comprising GaN, AlN, InN, BN or a mixed crystal thereof.
4. The nitride semiconductor as claimed in claim 1 , wherein the nitride on said principal surface of the base is selected from the group consisting of a GaN film, an AlN film, an InN film, a BN film or a mixed crystal film thereof, which is formed by crystal growth on a substrate selected from the group consisting of a sapphire substrate, an SiC substrate, a ZnO substrate, an Si substrate, a GaN substrate, an AlN substrate, an InN substrate, a BN substrate and a self-supporting substrate comprising a mixed crystal thereof.
5. The nitride semiconductor as claimed in claim 1 , wherein said nitride principal surface of said base is a crystal plane within ±10° or less from the (1-100) plane (m-plane).
6. The nitride semiconductor as claimed in claim 1 , wherein at least one of said first nitride semiconductor layer and said second nitride semiconductor layer is a Group III-V nitride semiconductor comprising GaN, AlN, InN, BN or a mixed crystal thereof.
7. The nitride semiconductor as claimed in claim 1 , wherein a thickness L 1 of said first nitride semiconductor layer is from 0.1 to 300 nm.
8. The nitride semiconductor as claimed in claim 1 , wherein a silicon (Si) concentration in said first nitride semiconductor layer is 1×10 21 cm −3 or less.
9. The nitride semiconductor as claimed in claim 1 , wherein a silicon concentration in said second nitride semiconductor layer is from 1×10 17 to 6×10 19 cm −3 .
10. The nitride semiconductor as claimed in claim 1 , wherein a dislocation density in said quantum well active layer structure part is 1×10 9 cm −2 or less.
11. The nitride semiconductor as claimed in claim 1 , wherein an internal quantum efficiency of said quantum well active layer structure part as determined by CW-PL measurement under low excitation density condition is 20% or more.
12. The nitride semiconductor as claimed in claim 1 , wherein an internal quantum efficiency of said quantum well active layer structure part as determined by pulsed PL measurement under low excitation density condition is 20% or more.
13. The nitride semiconductor as claimed in claim 1 , wherein a photoluminescence lifetime (τ(PL)) of said quantum well active layer structure part as determined by time-resolved PL measurement at room temperature under low excitation density condition is 1.0 ns or more.
14. The nitride semiconductor as claimed in claim 1 , wherein the thickness of the quantum well layer contained in said quantum well active layer structure part is from 15 to 100 nm.
15. The nitride semiconductor as claimed in claim 1 , wherein said one conductivity type is n-type and said another conductivity type is p-type.
16. The nitride semiconductor as claimed in claim 1 , wherein a concentration of a dopant element in said another conductivity type nitride semiconductor part is 1×10 19 to 8×10 19 cm −3 .
17. The nitride semiconductor as claimed in claim 1 , wherein a thickness of said another conductivity type nitride semiconductor part is from 0.05 to 0.25 μm.
18. The nitride semiconductor as claimed in claim 1 , wherein said another conductivity type nitride semiconductor part comprises Al x Ga 1-x N (0#X#1).
19. The nitride semiconductor as claimed in claim 18 , wherein Al composition x in Al x Ga 1-x N is from 0.02 to 0.20.
20. The nitride semiconductor as claimed in claim 1 , wherein an area of said outermost surface of said nitride semiconductor is from 30 mm 2 to 500 cm 2 .
21. The nitride semiconductor as claimed in claim 1 , wherein an average surface roughness Ra on said outermost surface of said nitride semiconductor is from 100 to 300 nm.
22. The nitride semiconductor as claimed in claim 1 , wherein an in-plane standard deviation of a thickness of the quantum well layer constituting said quantum well active layer structure part is 0.45 nm or less.
23. The nitride semiconductor as claimed in claim 1 , wherein a variation coefficient of thickness within a plane of the quantum well layer constituting said quantum well active layer structure part is 0.1 or less.
24. The nitride semiconductor as claimed in claim 1 , wherein said outermost surface of said one conductivity type nitride semiconductor part is a crystal plane within ±5° or less from the (1-100) plane (m plane).