Semiconductor structure having an ELOG on a thermally and electrically conductive mask

1. A semiconductor structure comprising:

a substrate;

a thermally and electrically conductive mask positioned upon said substrate; and

an epitaxial lateral over growth (ELOG) material positioned upon said thermally and electrically conductive mask, wherein said thermally and electrically conductive mask comprises a material selected from the group consisting of carbon nanostructures and graphene.

2. The structure of claim 1 , wherein said thermally and electrically conductive mask comprises a plurality of dimples.

3. The structure of claim 1 , wherein said thermally and electrically conductive mask contains at least one trench, wherein the ELOG material contains a vertically extending section that extends from the at least one trench.

4. The structure of claim 3 , wherein said thermally and electrically conductive mask comprises a high density thermally and electrically conductive mask and a low density thermally and electrically conductive mask, wherein the at least one trench is formed in the high density thermally and electrically conductive mask and said low density thermally and electrically conductive mask if positioned in the at least one trench and containing a plurality of spaces, said vertically extending section of the ELOG material extending from the plurality of spaces.

5. An apparatus comprising:

a substrate;

a thermally and electrically conductive mask positioned upon said substrate;

an epitaxial lateral over growth (ELOG) material positioned upon said thermally and electrically conductive mask; and

a device positioned upon the ELOG material,

wherein said thermally and electrically conductive mask comprises a material selected from the group consisting of densely packed carbon nanostructures and graphene.

6. The apparatus of claim 5 , wherein said thermally and electrically conductive mask comprises a plurality of dimples.

7. The apparatus of claim 6 , wherein the ELOG material has a surface and wherein the dimples are sufficiently spaced in at least one area to position at least a portion of the device upon said surface of the ELOG material.

8. The apparatus of claim 5 , wherein said thermally and electrically conductive mask contains at least one trench, wherein the ELOG material contains a vertically extending section that extends from the at least one trench.

9. The apparatus of claim 8 , wherein said thermally and electrically conductive mask comprises a high density thermally and electrically conductive mask and a low density thermally and electrically conductive mask, wherein the at least one trench is formed in the high density thermally and electrically conductive mask and said low density thermally and electrically conductive mask if positioned in the at least one trench and containing a plurality of spaces, said vertically extending section of the ELOG material extending from the plurality of spaces.

10. The apparatus of claim 5 , wherein said device comprises a component of at least one of a semiconductor laser, transistor, photodetector, optical amplifier, optical waveguide, and optical modulator.

11. A semiconductor structure comprising:

a substrate;

a thermally and electrically conductive mask positioned on the substrate, wherein said thermally and electrically conductive mask comprises a material selected from the group consisting of densely packed carbon nanostructures and graphene, wherein said thermally and electrically conductive mask contains at least one trench; and

an epitaxial lateral over growth (ELOG) material positioned upon said thermally and electrically conductive mask, and wherein the ELOG material contains a vertically extending section that extends from the at least one trench.

12. The structure of claim 11 , further comprising:

low density thermally and electrically conductive material positioned in the at least one trench, said low density thermally and electrically conductive material comprising spaces, and wherein the ELOG material extends from the spaces.

13. The structure of claim 11 , further comprising a device positioned on a portion of the ELOG material, wherein the device is a component of an electronic device.