Sealing inspection device and sealing inspection method of flat panel display apparatus by using the sealing inspection device

1. A sealing inspection device for detecting a bonding error at a cured sealing region between an upper and a lower plate in a flat panel display apparatus in which the upper and lower plates are bonded to each other by a sealing member, the sealing inspection device comprising:

a light source emitting light;

a polarizer polarizing the light emitted from the light source, the polarized light being incident on and reflected from the cured sealing region of the flat panel display;

an optical spectrum analyzer configured to analyze the light reflected from the sealing region with respect to wavelength ranges to determine whether a bonding error exists at the sealing region based on measurement by the optical spectrum analyzer of the reflectance of the reflected light with respect to the wavelength ranges, and comparing the measured reflectance to a reference value to determine whether the bonding error exists at the cured sealing region; and

a beam splitter configured to change a path of the reflected light toward the optical spectrum analyzer.

2. The sealing inspection device of claim 1 , wherein the light source emits white light.

3. The sealing inspection device of claim 1 , wherein the polarizer changes a polarization state of the emitted light.

4. The sealing inspection device of claim 3 , wherein the polarizer changes a circular polarization state of the emitted light.

5. The sealing inspection device of claim 1 , wherein the polarizer is arranged to pass the polarized light toward a region of the flat panel display having the sealing member in direct contact with the upper and lower plates.

6. The sealing inspection device of claim 1 , wherein the beam splitter and the cured sealing region are arranged along a first direction, the beam splitter and the optical spectrum analyzer are arranged along a second direction perpendicular to the first direction, and the beam splitter is positioned to direct at least some of the light reflected from the cured sealing region toward the optical spectrum analyzer.

7. The sealing inspection device of claim 1 , further comprising:

a microscope barrel to magnify some of the reflected light; and

an image capturing device to capture an image of the cured sealing region by using the magnified reflected light.

8. The sealing inspection device of claim 7 , wherein the beam splitter to split the reflected light into a first light oriented toward the optical spectrum analyzer, and into a second light oriented toward the microscope barrel.

9. The sealing inspection device of claim 1 , wherein the flat panel display apparatus is an organic light-emitting display apparatus.

10. The sealing inspection device of claim 9 , wherein the sealing member is frit.

11. The sealing inspection device of claim 1 , wherein the beam splitter and the cured sealing region are arranged to have the polarized light incident on a contact surface between the upper plate and the sealing member and on a contact surface between the lower plate and the sealing member, the polarized light being reflected from the cured sealing region to be reflected from the beam splitter toward the optical spectrum analyzer.

12. The sealing inspection device of claim 1 , wherein the beam splitter is arranged to transmit the polarized light from the polarizer to be incident on two different regions of the cured sealing region, the polarized light being reflected from the two different regions of the cured sealing region to be reflected from the beam splitter toward the optical spectrum analyzer.

13. A method for manufacturing an organic light-emitting display apparatus including a cured sealing region between an upper and a lower bonded to each other by a sealing member, method comprising:

emitting light by using a light source;

polarizing the emitted light by using a polarizer;

reflecting the polarized light from the cured sealing region; and

analyzing a reflectance of the reflected light with respect to wavelength ranges and determining whether a bonding error exists at the cured sealing region, wherein the analyzing includes:

measuring the reflectance of the reflected light in wavelength ranges, and

comparing the measured reflectance to a reflectance of the reflected light in wavelength ranges in a case when bonding at the cured sealing region has no errors.

14. The method of claim 13 , wherein emitting the light includes emitting white light.

15. The method of claim 13 , wherein polarizing the emitted light includes changing a polarization state of the emitted light.

16. The method of claim 15 , wherein polarizing the emitted light includes changing a circular polarization state of the emitted light.

17. The method of claim 13 , further comprising capturing an image of the cured sealing region by using the reflected light.

18. The method of claim 13 , further comprising re-sealing the cured sealing region if a bonding error is determined at the cured sealing region.

19. The method of claim 18 , wherein re-sealing includes irradiating a laser onto the cured sealing region.

20. The method of claim 13 , further comprising transmitting the polarized light through a beam splitter to be incident on the cured sealing region, such that the polarized light is incident on a contact surface between the upper plate and the sealing member and on a contact surface between the lower plate and the sealing member, and the polarized light is reflected from the cured sealing region to be reflected from the beam splitter toward an optical spectrum analyzer.