IP Library Granted Patent US 9,336,917
Granted Patent B2
US 9,336,917 · App. 13/142,787 · Granted May 10, 2016

X-ray apparatus, method of using the same and X-ray irradiation method

Inventors: Tetsuya Ozawa (Hino, JP); Ryuji Matsuo (Kunitachi, JP); Licai Jiang (Rochester Hills, MI); Boris Verman (Bloomfield, MI); Kazuhiko Omote (Akiruno, JP)
Assignee: RIGAKU CORPORATION
G21K1/06G01J3/12G21K1/062B82Y10/00G21K2201/064
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Quick Facts
Patent No.
US 9,336,917
App. No.
13/142,787
Granted
May 10, 2016
Kind
B2
Abstract

An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. An X-ray apparatus 100 includes a monochromator 105 that focuses a divergent X-ray beam while dispersing it and a selection part 107 that is installed in a condensing position of the condensed X-ray beam for selecting an X-ray beam having a wavelength in a specific range, allowing it to pass through, and creating a virtual source. With this arrangement, it is possible to create a virtual source having a narrow energy bandwidth at a focal point 110 and by means of the virtual source a high-resolution X-ray diffraction measurement is available. By using the X-ray apparatus 100 , it is possible to sufficiently separate an X-ray beam having such an extremely narrow energy bandwidth as, for example, Kα1 ray from Kα2 ray. In addition, it is also possible to cut out part of continuous X-ray beams to create a virtual source.

Claims (27)

1. An X-ray apparatus comprising:

a monochromator that takes a divergent X-ray beam and focuses the X-ray beam while monochromating;

a selection part installed at a focused position of said monochromated X-ray beam, for selecting a specific wavelength in a narrow range, and creating a virtual source; and

one or more reflectors coordinating the selected specific wavelength having passed through said selection part.

2. The X-ray apparatus according to claim 1 , wherein

said one or more reflectors coordinate the selected specific wavelength having passed through said selection part and forms parallel beams.

3. The X-ray apparatus according to claim 1 , wherein

said one or more reflectors coordinate the selected specific wavelength having passed through said selection part and forms a focused beam.

4. The X-ray apparatus according to claim 1 , wherein:

said monochromator is fixed; and

said reflectors can be exchanged between one that coordinates an incident specific wavelength into a focused beam and one that coordinates an incident specific wavelength into parallel beams.

5. The X-ray apparatus according to claim 1 , further comprising a switching mechanism enabling switching of paths between a path that coordinates an X-ray beam emitted from said virtual source into a focused beam and a path that coordinates an X-ray beam emitted from said virtual source into parallel beams.

6. The X-ray apparatus according to claim 5 , comprising a reflector that coordinates an X-ray beam having passed through said selection part and forms parallel beams and a reflector that coordinates an X-ray beam having passed through said selection part and forms a focused beam, as said one or more reflectors, wherein

said switching mechanism enables switching of paths among a path that forms parallel beams via said reflector, a path that forms a focused beam via said reflector, and a path that forms a focused beam without the intervention of said reflector.

7. The X-ray apparatus according to claim 1 , wherein

said reflector is a multilayer mirror.

8. The X-ray apparatus according to claim 1 , further comprising an X-ray source generating a characteristic X-ray beam as said divergent X-ray beam.

9. The X-ray apparatus according to claim 1 , wherein

said monochromator is a Johann type monochromator or Johansson type monochromator.

10. The X-ray apparatus according to claim 1 , further comprising a detector detecting an X-ray beam that has been focused by said reflector and has passed through a specimen or has been reflected from the specimen, wherein

said detector has elongated unit detection regions arranged in parallel and is capable of discriminating an X-ray beam having energy between an upper limit value and a lower limit value from other beams by converting the X-ray beams received in said unit detection region into electric signals and detecting said electric signals.

11. A method of using an X-ray apparatus, wherein

said selection part passes a specific wavelength and prevents other wavelengths from passing in the X-ray apparatus according to claim 7 .

12. An X-ray irradiation method, wherein:

a monochromator takes a divergent X-ray beam and focuses the X-ray beam while monochromating; and

a specific wavelength in a narrow range is selected at a focused position of said monochromated X-ray beam, and used to create a virtual source; and

coordinating the selected specific wavelength by one or more reflectors.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: OZAWA, TETSUYA; MATSUO, RYUJI; JIANG, LICAI; VERMAN, BORIS; OMOTE, KAZUHIKO
To: RIGAKU CORPORATION
Reel/Frame 026593/0624 →
Priority Claims (1)
JP 2009-157326 · Jul 1, 2009 · national
Continuity (1)
Related Publication 20110268252A1 · Nov 3, 2011