Test mode soft reset circuitry and methods

1. A soft-function trigger state machine, comprising:

state machine circuitry defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern, the state machine circuitry defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern, and the state machine circuitry defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.

2. A soft-function trigger state machine as recited in claim 1 , wherein the soft-function trigger state machine is defined within an integrated circuit chip that does not include a reset pin.

3. A soft-function trigger state machine as recited in claim 1 , wherein the scan-in waveform is received through a scan-in pin to which the state machine circuitry is connected, and wherein the scan-clock waveform is received through a scan-clock pin to which the state machine circuitry is connected.

4. A soft-function trigger state machine as recited in claim 1 , wherein the state machine circuitry is defined to sample the scan-clock waveform in accordance with rising edges of the scan-in waveform.

5. A soft-function trigger state machine as recited in claim 1 , wherein the soft-function trigger state machine is defined outside of a scan chain path.

6. A soft-function trigger state machine as recited in claim 1 , wherein the action associated with the soft action pattern is an exiting of a scan mode.

7. A soft-function trigger state machine as recited in claim 1 , wherein the action associated with the soft action pattern is a resetting of a scan mode.

8. A soft-function trigger state machine as recited in claim 1 , wherein the action associated with the soft action pattern is a stopping of a clock.

9. A soft-function trigger state machine as recited in claim 1 , wherein the action associated with the soft action pattern is a changing of an oscillation trim value.

10. A soft-function trigger state machine as recited in claim 1 , wherein the action associated with the soft action pattern is a changing of a regulator trim value.

11. A method for operating a reset state machine, comprising:

simultaneously receiving a scan-in waveform and a scan-clock waveform;

sampling the scan-clock waveform in accordance with a rising edge of the scan-in waveform;

detecting a bit match when a certain bit pattern is observed from the sampled scan-clock waveform; and

asserting a test mode soft reset signal in response to detecting the bit match.

12. A method for operating a reset state machine as recited in claim 11 , wherein the reset state machine is defined within an integrated circuit chip that does not include a reset pin.

13. A method for operating a reset state machine as recited in claim 11 , wherein the scan-in waveform is received through a scan-in pin to which the reset state machine is connected, and wherein the scan-clock waveform is received through a scan-clock pin to which the reset state machine is connected.

14. A method for operating a reset state machine as recited in claim 11 , wherein the reset state machine is defined outside of a scan chain path.

15. A method for operating a reset state machine as recited in claim 11 , further comprising:

sampling a positive edge of the scan-clock waveform as a match signal;

sampling a negative edge of the scan-clock waveform as a match sync signal, and

wherein detecting the bit match causes the match signal to transition to a high state, and

wherein transition of the match signal to the high state causes the match sync signal to transition to a high state in accordance with a next edge of the scan-clock signal, and

wherein transition of the match sync signal to the high state causes assertion of the test mode soft reset signal in accordance with a next edge of the scan-clock signal.

16. A method for operating a reset state machine as recited in claim 11 , further comprising:

providing the test mode soft reset signal to an AND gate;

providing a reset enable signal to the AND gate,

wherein an output of the AND gate controls a test mode reset operation.

17. A method for operating a reset state machine as recited in claim 11 , wherein the scan-in waveform has a rise time that is about 50% of a period of the scan-clock waveform.

18. A method for operating a reset state machine as recited in claim 17 , wherein the scan-in waveform has a fall time that is about 80% of the period of the scan-clock waveform.

19. A method for operating a reset state machine as recited in claim 11 , further comprising:

transmitting the test mode soft reset signal to a test controller.

20. A method for operating a reset state machine as recited in claim 19 , wherein the test controller is Joint Test Access Group (JTAG) test access port (TAP) controller.