Capacitance-based system health monitoring system, apparatus and method for layered structure
View Patent ↗The present disclosure endeavors to provide an SHM system and method using a conductive material (e.g., CNT) to measure changes in a layered structure. Change in capacitance of a layered structure may be measured over time thereby indicating a change in the structural integrity of the material. The SHM system may be embedded with, or within, the layered structure such that the system is effectively part of the material. Alternatively, it may be external to the layered structure such that the system is a separate device used to measure the capacitance. The SHM system may also localize any changes in a layered structure by using, for example, strips or panels of conductive material on opposite sides of the layered structure being measured. Damage within overlapping portions of the conductive material provides localization capability where varying the size of the strips or panels may be use to vary the sensitivity and resolution of both the locations and size of the defect.
1. A method for detecting an amount of residual strength remaining in a layered structural component comprising the steps of:
using a layered structural component having embedded conductive layers on at least two opposite surfaces of the layered structural component, wherein said conductive layers are electrically isolated from the layered structural component;
detecting changes in the dielectric of the material between said conductive layers by measuring an electrical capacitance between the conductive layers, by applying a signal waveform to a conductive layer and measuring capacitance rise time;
comparing the measured electrical capacitance to a reference value, wherein deviation from the reference value quantifies an amount of damage in the layered structural component; and
correlating the amount of damage in structural integrity to the amount of residual strength remaining in the layered structural component.
2. The method of claim 1 , wherein the conductive layers contain material chosen from a group consisting of: (i) carbon nanotubes; (ii) metallic material; (iii) metal mesh; (iv) metalized bondable polymer films; (v) non-metallic electrically conductive material; and (vi) combinations thereof
3. The method of claim 1 , wherein the conductive layers are insulated from the layered structural component using a bondable polymer film insulation.
4. The method of claim 1 , wherein the conductive layers cover the total surface of the layered structural component.
5. The method of claim 1 , wherein each conductive layer comprises multiple strips of conductive material.
6. The method of claim 5 , wherein the strips of conductive material on the at least two surfaces of the layered structural component are not parallel, resulting in a grid of strips to allow localization of damage to regions where strips overlap.
7. The method of claim 5 , wherein the width of the conductive strips is varied to adjust the resolution of a detectable change in the residual strength remaining.
8. The method of claim 1 , wherein each conductive layer comprises multiple layers of conductive material.
9. The method of claim 1 , wherein one or more conductive panels cover an area of a first side of the layered structural component and one or more smaller or equal sized conductive panels are used to cover the other side of the same area thereby allowing localization of damage within the area of the smaller damaged conductive panels.
10. The method of claim 9 , wherein the area of the smaller conductive panel is varied to adjust the resolution of a detectable change in the residual strength remaining.
11. The method of claim 1 , wherein the reference value for a layered structural component is determined after the layered structural component's fabrication but prior to substantial use of the layered structural component, where the reference value is used as a reference point to detect the amount of residual strength remaining.
12. The method of claim 1 , wherein the reference value is equal to the capacitance measurement of a reference layered structural component, where the reference value is used as a reference point to detect manufacturing defects.
13. A system for detecting an amount of residual strength remaining in a layered structural component comprising:
conductive layers embedded on at least two opposite surfaces of a layered structural component, wherein said conductive layers are electrically isolated from the layered structural component;
a device for detecting changes in the dielectric of the material between said conductive layers to measure an electrical capacitance by applying a signal waveform to a conductive layer and measuring capacitance rise time;
a monitoring device for comparing the measured electrical capacitance to a reference value, wherein deviation from the reference value quantifies an amount of damage in layered structural component; and
a correlating device for correlating the amount of damage in structural integrity to the amount of residual strength remaining in the layered structural component.
14. The system of claim 13 , wherein the conductive layers contain material chosen from a group consisting of: (i) carbon nanotubes; (ii) metallic material; (iii) metal mesh; (iv) metalized bondable polymer films; (v) non-metallic electrically conductive material; and (vi) combinations thereof.
15. The system of claim 13 , wherein the conductive layers are insulated from the layered structural component using a bondable polymer film insulation.
16. The system of claim 13 , wherein the conductive layers cover the total surface of the layered structural component.
17. The system of claim 13 , wherein each conductive layer comprises multiple strips of conductive material.
18. The system of claim 13 , wherein each conductive layer comprises multiple layers of conductive material.
19. The system of claim 18 , wherein the strips of conductive material on the at least two surfaces of the layered structural component are not parallel, resulting in a grid of strips to allow localization of damage to regions where strips overlap.
20. The system of claim 18 , wherein the width of the conductive strips is varied to adjust the resolution of a detectable change in the residual strength remaining.
21. The system of claim 13 , wherein one or more conductive panels cover an area of a first side of the layered structural component and one or more smaller or equal sized conductive panels are used to cover the other side of the same area thereby allowing localization of damage within the area of the smaller damaged conductive panels.
22. The system of claim 21 , wherein the area of the smaller conductive panel is varied to adjust the resolution of a detectable change in the residual strength remaining.
23. The system of claim 13 , wherein the reference value for a layered structural component is determined after the layered structural component's fabrication but prior to substantial use of the layered structural component, where the reference value is used as a reference point to detect the amount of residual strength remaining.
24. The system of claim 13 , wherein the reference value is equal to the capacitance measurement of a reference layered structural component, where the reference value is used as a reference point to detect manufacturing defects.
25. A system for detecting an amount of residual strength remaining in a structural component comprising:
a conductive layer sheet located on at least one surface of a structural component, wherein said conductive layer sheet is electrically isolated from the structural component and comprises at least one conductive layer;
a device for detecting changes in the dielectric of the material between said at least one conductive layer and a second conductive layer to measure an electrical capacitance by applying a signal waveform to a conductive layer and measuring capacitance rise time;
a monitoring device for comparing the measured electrical capacitance to a reference value, wherein deviation from the reference value quantifies an amount of damage in the layered structural component; and
a correlating device for correlating the amount of damage in structural integrity to the amount of residual strength remaining in the layered structural component.
26. The system of claim 25 , wherein the conductive layer contains material chosen from a group consisting of: (i) carbon nanotubes; (ii) metallic material; (iii) metal mesh; (iv) metalized bondable polymer films; (v) non-metallic electrically conductive material; and (vi) combinations thereof.
27. A method for an amount of residual strength remaining in a structural component comprising the steps of:
placing conductive layers on two opposite surfaces a structural component, wherein said conductive layers are electrically isolated from the structural component;
detecting changes in the dielectric of the component between said conductive layers by measuring an electrical capacitance between the conductive layers by applying a signal waveform to a conductive layer and measuring capacitance rise time;
comparing the measured electrical capacitance to a reference value, wherein deviation from the reference value quantifies an amount of damage in the layered structural component; and
correlating the amount of damage in structural integrity to the amount of residual strength remaining in the layered structural component.
28. The method of claim 27 , wherein the conductive layers contain material chosen from a group consisting of: (i) carbon nanotubes; (ii) metallic material; (iii) metal mesh; (iv) metalized bondable polymer films; (v) non-metallic electrically conductive material; and (vi) combinations thereof.