Bipolar punch-through semiconductor device and method for manufacturing such a semiconductor device

1. A method for manufacturing a bipolar punch-through semiconductor device with a semiconductor substrate, having at least a two-layer structure with layers of a first and a second conductivity type, a first main side, and a second main side, wherein one of the layers in the two-layer structure is a base layer of the first conductivity type,

wherein the first main side is arranged opposite of the second main side,

wherein a first electrical contact is arranged on the first main side,

wherein a second electrical contact is arranged on the second main side,

wherein a buffer layer of the first conductivity type is arranged on the base layer on the second main side, which buffer layer has a higher doping concentration than the base layer,

wherein a first layer is arranged in the substrate between the buffer layer and the second electrical contact, the first layer having alternating regions including at least one first region of the first conductivity type and at least one second region of the second conductivity type,

the manufacturing method comprising:

applying particles of the first conductivity type on the second main side to create the at least one first region;

applying particles of the second conductivity type on the second main side to create the at least one second region; and

activating the particles of the second conductivity type at such conditions that the particles diffuse into the substrate by not more than 2 μm and that the doping profile of the second region drops from 90% to 10% of the maximum doping concentration, to a distance within at most 1 μm,

wherein at least one of the steps of the application of particles for the creation of the first region or the second region is performed through a mask.

2. The method device according to claim 1 , wherein the particles of the first conductivity type are activated at such conditions that the particles diffuse into the substrate by not more than 2 μm.

3. The method according to claim 1 , wherein at least one of the following geometrical rules is fulfilled:

the first region is created such that the doping profile of the first region drops from 90% to 10% of the maximum doping concentration within at maximum 1 μm, and the depth of the first region is equal to or higher than the depth of the second region.

4. The method according to claim 1 , wherein

the particles for the creation of at least one of the regions, which regions are the first region and the second region, are applied with a doping concentration of 1*10 17 up to 1*10 20 cm −3 for the particles for the creation of the first region and/or 1*10 16 up to 1*10 18 cm −3 for the particles for the creation of the second region.

5. The method according to claim 1 , wherein the particles for the creation of at least one of the first region and the second region are activated by laser annealing or by a heat treatment at a temperature between 400° C. and 1000° C., and at most 60 min,

wherein the particles for the creation of the first region and the second region are activated simultaneously or sequentially.

6. A bipolar punch-through semiconductor device comprising:

a semiconductor substrate, having at least a two-layer structure with layers of a first and a second conductivity type, a first main side, and a second main side, wherein one of the layers is a base layer of the first conductivity type,

wherein the first main side is arranged opposite of the second main side,

wherein a first electrical contact is arranged on the first main side,

wherein a second electrical contact is arranged on the second main side,

wherein a buffer layer of the first conductivity type is arranged on the base layer on the second main side, which buffer layer has a higher doping concentration than the base layer,

wherein a first layer is arranged in the substrate between the buffer layer and the second electrical contact, the first layer having alternating regions including at least one first region of the first conductivity type and at least one second region of the second conductivity type, and

wherein the second region is an activated region, which has a depth of at maximum 2 μm and a doping profile, which drops from a distance between 90% to 10% of the maximum doping concentration, to a distance within at most 1 μm.

7. The bipolar punch-through semiconductor device according to claim 6 , wherein the first region is a region, which has a depth of at maximum 2 μm.

8. The bipolar punch-through semiconductor device according to claim 6 , wherein the first and/or second regions have a geometrical shape of one of cells or stripes.

9. The bipolar punch-through semiconductor device according to claim 6 , wherein the buffer layer has a doping concentration of at most 5*10 16 cm −3 .

10. The bipolar punch-through semiconductor device according to claim 6 , wherein the bipolar device is a bipolar switch that includes one of: an insulated gate bipolar transistor or a insulated gate commutated thyristor.

11. The bipolar punch-through semiconductor device according to claim 10 , wherein at least one of the following geometrical rules is fulfilled:

the width of the second region is at least 50 μm;

the width of the first region is at least 5 μm;

the total area of second regions is between 75 to 99% of the total substrate area in the case of the semiconductor device being an insulated gate commutated thyristor; and

the total area of second regions is between 90 to 99% of the total wafer area in the case of the semiconductor device being an insulated gate bipolar transistor.

12. The bipolar punch-through semiconductor device according to claim 6 , wherein the bipolar device is a bipolar diode.

13. The bipolar punch-through semiconductor device according to claim 12 , wherein at least one of the following geometrical rules is fulfilled:

the total area of second regions is 1 to 25% of the total wafer area;

the width of the first region is at least 50 μm; and

the width of the second region is at least 5 μm.

14. The bipolar punch-through semiconductor device according to claim 6 , wherein the semiconductor device is a reverse-conducting semiconductor device comprising a insulated gate bipolar transistor and a diode on a common substrate, wherein the total area of second regions is 70 to 90% of the total substrate area.

15. A bipolar diode, comprising:

a semiconductor substrate, having at least a two-layer structure with layers of a first and a second conductivity type, a first main side, and a second main side, wherein one of the layers is a base layer of the first conductivity type,

wherein the first main side is arranged opposite of the second main side,

wherein a first electrical contact is arranged on the first main side,

wherein a second electrical contact is arranged on the second main side,

wherein a buffer layer of the first conductivity type is arranged on the base layer on the second main side, which buffer layer has a higher doping concentration than the base layer,

wherein a first layer is arranged in the substrate between the buffer layer and the second electrical contact, the first layer having alternating regions including at least one first region of the first conductivity type and at least one second region of the second conductivity type,

wherein the second region is an activated region, which has a depth of at maximum 2 μm and a doping profile, which drops from a distance between 90% to 10% of the maximum doping concentration, to a distance within at most 1 μm,

wherein at least one of the following geometrical rules is fulfilled:

the total area of second regions is 1 to 25% of the total wafer area;

the width of the first region is at least 50 μm; and

the width of the second region is at least 5 μm.

16. An insulated gate bipolar transistor comprising:

a semiconductor substrate, having at least a two-layer structure with layers of a first and a second conductivity type, a first main side, and a second main side, wherein one of the layers is a base layer of the first conductivity type,

wherein the first main side is arranged opposite of the second main side,

wherein a first electrical contact is arranged on the first main side,

wherein a second electrical contact is arranged on the second main side,

wherein a buffer layer of the first conductivity type is arranged on the base layer on the second main side, which buffer layer has a higher doping concentration than the base layer,

wherein a first layer is arranged in the substrate between the buffer layer and the second electrical contact, the first layer having alternating regions including at least one first region of the first conductivity type and at least one second region of the second conductivity type, and

wherein the second region is an activated region, which has a depth of at maximum 2 μm and a doping profile, which drops from a distance between 90% to 10% of the maximum doping concentration, to a distance within at most 1 μm, and

wherein at least one of the following geometrical rules is fulfilled:

the width of the second region is at least 50 μm;

the width of the first region is at least 5 μm; and

the total area of second regions is between 90 to 99% of the total wafer area in the case of the semiconductor device being an insulated gate bipolar transistor.

17. An insulated gate commutated thyristor, comprising:

a semiconductor substrate, having at least a two-layer structure with layers of a first and a second conductivity type, a first main side, and a second main side, wherein one of the layers is a base layer of the first conductivity type,

wherein the first main side is arranged opposite of the second main side,

wherein a first electrical contact is arranged on the first main side,

wherein a second electrical contact is arranged on the second main side,

wherein a buffer layer of the first conductivity type is arranged on the base layer on the second main side, which buffer layer has a higher doping concentration than the base layer,

wherein a first layer is arranged in the substrate between the buffer layer and the second electrical contact, the first layer having alternating regions including at least one first region of the first conductivity type and at least one second region of the second conductivity type, and

wherein the second region is an activated region, which has a depth of at maximum 2 μm and a doping profile, which drops from a distance between 90% to 10% of the maximum doping concentration, to a distance within at most 1 μm, and

wherein at least one of the following geometrical rules is fulfilled:

the width of the second region is at least 50 μm;

the width of the first region is at least 5 μm; and

the total area of second regions is between 75 to 99% of the total substrate area in the case of the semiconductor device being an insulated gate commutated thyristor.