Mechanism for constructing an oversampled waveform for a set of signals received by a receiver
A mechanism is provided for constructing an oversampled waveform for a set of incoming signals received by a receiver. In one implementation, the oversampled waveform is constructed by way of cooperation between the receiver and a waveform construction mechanism (WCM). The receiver receives the incoming signals, samples a subset of the incoming signals at a time, stores the subsets of sample values into a set of registers, and subsequently provides the subsets of sample values to the WCM. The WCM in turn sorts through the subsets of sample values, organizes them into proper orders, and “stitches” them together to construct the oversampled waveform for the set of incoming signals. With proper cooperation between the receiver and the WCM, and with proper processing logic on the WCM, it is possible to construct the oversampled waveform for the incoming signals without requiring large amounts of resources on the receiver.
1. A method for constructing an oversampled waveform in a waveform construction mechanism, the method comprising:
obtaining a first plurality of sample values measured during a first plurality of time intervals at a first jog;
obtaining a second plurality of sample values measured during a second plurality of time intervals at a first jog;
obtaining a third plurality of sample values measured during a repeat of the first plurality of time intervals at a second jog;
obtaining a fourth plurality of sample values measured during a repeat of the second plurality of time intervals at a second jog;
mapping the third plurality of sample values to the first plurality of sample values;
generating a first super group comprising the first plurality of sample values and the third plurality of sample values;
mapping the fourth plurality of sample values to the second plurality of sample values;
generating a second super group comprising the second plurality of sample values and the fourth plurality of sample values;
ordering the first super group and the second super group; and
generating the oversampled waveform from the first super group and the second super group.
2. The method of claim 1 , wherein mapping the third plurality of sample values to the first plurality of sample values comprises:
calculating a first average of the first plurality of sample values and a second average of the third plurality of sample values; and
comparing the second average with the first average.
3. The method of claim 1 , the method further comprising:
obtaining a fifth plurality of sample values measured during a second repeat of the first plurality of time intervals at a third jog;
obtaining a sixth plurality of sample values measured during a second repeat of the second plurality of time intervals at the third jog;
mapping the fifth plurality of sample values to the third plurality of sample values, wherein the first super group further comprises the fifth plurality of sample values; and
mapping the sixth plurality of sample values to the fourth plurality of sample values, wherein the second super group further comprises the sixth plurality of sample values.
4. The method of claim 3 , wherein ordering the first super group and the second super group comprises:
comparing the sixth plurality of sample values with the first plurality of sample values; and
determining that the sixth plurality of sample values differs least from the second plurality of sample values.
5. A system for constructing an oversampled waveform, the system comprising:
a hardware processor; and
a memory operatively connected to the hardware processor and storing instructions comprising functionality to:
obtain a first plurality of sample values measured during a first plurality of time intervals at a first jog;
obtain a second plurality of sample values measured during a second plurality of time intervals at a first jog;
obtain a third plurality of sample values measured during a repeat of the first plurality of time intervals at a second jog;
obtain a fourth plurality of sample values measured during a repeat of the second plurality of time intervals at a second jog;
map the third plurality of sample values to the first plurality of sample values;
generate a first super group comprising the first plurality of sample values and the third plurality of sample values;
map the fourth plurality of sample values to the second plurality of sample values;
generate a second super group comprising the second plurality of sample values and the fourth plurality of sample values;
order the first super group and the second super group; and
generate the oversampled waveform from the first super group and the second super group.
6. The system of claim 5 , wherein the instructions to map the third plurality of sample values to the first plurality of sample values comprise functionality to:
calculate a first average of the sample values of the first plurality and a second average of the sample values of the third plurality; and
compare the second average with the first average.
7. The system of claim 5 , the instructions further comprising functionality to:
obtain a fifth plurality of sample values measured during a second repeat of the first plurality of time intervals at a third jog;
obtain a sixth plurality of sample values measured during a second repeat of the second plurality of time intervals at a third jog;
map the fifth plurality of sample values to the third plurality of sample values, wherein the first super group further comprises the fifth plurality of sample values; and
map the sixth plurality of sample values to the fourth plurality of sample values, wherein the second super group further comprises the sixth plurality of sample values.
8. The system of claim 7 , wherein the instructions to order the first super group and the second super group comprise functionality to:
compare the sample values of the fifth plurality with the sample values the first plurality; and
determine that the sample values of the fifth plurality differs least from the sample values of the second plurality.
9. A non-transitory machine readable storage medium comprising instructions for constructing an oversampled waveform, the instructions comprise functionality to:
obtain a first plurality of sample values measured during a first plurality of time intervals at a first jog;
obtain a second plurality of sample values measured during a second plurality of time intervals at a first jog;
obtain a third plurality of sample values measured during a repeat of the first plurality of time intervals at a second jog;
obtain a fourth plurality of sample values measured during a repeat of the second plurality of time intervals at a second jog;
map the third plurality of sample values to the first plurality of sample values;
generate a first super group comprising the first plurality of sample values and the third plurality of sample values;
map the fourth plurality of sample values to the second plurality of sample values;
generate a second super group comprising the second plurality of sample values and the fourth plurality of sample values;
order the first super group and the second super group; and
generate the oversampled waveform from the first super group and the second super group.
10. The non-transitory machine readable medium of claim 9 , wherein the instructions to map the third plurality of sample values to the first plurality of sample values further comprise functionality to:
calculating a first average of the sample values of the first plurality and a second average of the sample values of the third plurality; and
comparing the second average with the first average.
11. The non-transitory machine readable medium of claim 9 , the instructions further comprising functionality to:
obtain a fifth plurality of sample values measured during a second repeat of the first plurality of time intervals at a third jog;
obtain a sixth plurality of sample values measured during a second repeat of the second plurality of time intervals at a third jog;
map the fifth plurality of sample values to the third plurality of sample values, wherein the first super group further comprises the fifth plurality of sample values; and
map the sixth plurality of sample values to the fourth plurality of sample values, wherein the second super group further comprises the sixth plurality of sample values.
12. The machine readable medium of claim 11 , wherein the instructions to order the first super group and the second super group further comprises functionality to:
comparing the sample values of the fifth plurality with the sample values the first plurality; and
determining that the sample values of the fifth plurality differs least from the sample values of the second plurality.