IP Library Granted Patent US 8,372,669
Granted Patent B2
US 8,372,669 · App. 13/176,712 · Granted Feb 12, 2013

Semiconductor light emitting device having patterned substrate and manufacturing method of the same

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Quick Facts
Patent No.
US 8,372,669
App. No.
13/176,712
Granted
Feb 12, 2013
Kind
B2
Abstract

There is provided a semiconductor light emitting device having a patterned substrate and a manufacturing method of the same. The semiconductor light emitting device includes a substrate; a first conductivity type nitride semiconductor layer, an active layer and a second conductivity type nitride semiconductor layer sequentially formed on the substrate, wherein the substrate is provided on a surface thereof with a pattern having a plurality of convex portions, wherein out of the plurality of convex portions of the pattern, a distance between a first convex portion and an adjacent one of the convex portions is different from a distance between a second convex portion and an adjacent one of the convex portions.

Claims (17)

1. A method of manufacturing a light emitting device including a substrate, a first conductivity type nitride semiconductor layer, an active layer and a second conductivity type nitride semiconductor layer, the method comprising:

forming a pattern having a plurality of convex portions on a surface of the substrate; and

growing the first conductivity type nitride semiconductor layer on the substrate where the pattern is formed,

wherein the forming a pattern on a surface of the substrate comprises forming the convex portions of the pattern such that a distance between a first convex portion and an adjacent one of the convex portions is different from a distance between a second convex portion and an adjacent one of the convex portions,

wherein the first conductivity type nitride semiconductor layer has a locally protruded and depressed structure and the active layer has a three-dimensional geometric curved indentation corresponding to the locally protruded and depressed structure of the first conductive nitride semiconductor layer.

2. The method of claim 1 , further comprising forming at least one buffer layer on the substrate, before the growing the first conductivity type nitride semiconductor layer.

3. The method of claim 1 , wherein the forming a pattern on a surface of the substrate comprises forming the first and second convex portions arranged non-periodically.

4. The method of claim 1 , wherein the forming a pattern on a surface of the substrate comprises forming the first and second convex portions each having a vertical cross-section formed of a hemisphere.

5. The method of claim 4 , wherein the forming a pattern on a surface of the substrate comprises forming the first and second convex portions having bottom surfaces sized differently from each other.

6. The method of claim 1 , wherein the forming a pattern on a surface of the substrate comprises the first and second convex portions each having a vertical cross-section formed of a polygon.

7. The method of claim 6 , wherein the forming a pattern on a surface of the substrate comprises forming the first and second convex portions having bottom surfaces sized differently from each other.

8. The method of claim 6 , wherein the forming a pattern on a surface of the substrate comprises forming the first and second convex portions differing in a growth plane of a nitride semiconductor from each other.

9. The method of claim 1 , wherein the forming a pattern on a surface of the substrate comprises forming the first and second convex portions having vertical cross-sections formed of a combination of a hemisphere and a polygon.

10. The method of claim 6 , wherein the polygon comprises one of a trapezium, a square and a triangle.

11. The method of claim 9 , wherein the polygon comprises one of trapezium, a square and a triangle.

12. The method of claim 1 , wherein the forming a pattern on a surface of the substrate comprises forming the convex portions each having a size of 0.1 μm to 10 μm.

13. The method of claim 1 , wherein the substrate is a sapphire substrate.

Assignments (1)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →